Whole of Saturday really:wq
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@ -1223,7 +1223,12 @@ self checking features on safety, and provides detailed recommendations for comp
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%
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%
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These SIL levels are broadly linked to the concept of an
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acceptance of probability of dangerous failures against time, as shown in table~\ref{tbl:sil_levels}.
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acceptance of given probabilities of dangerous
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failures against time, as shown in table~\ref{tbl:sil_levels}.
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%
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The philosophy behind this is that is recognised that no system can have a perfect
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safety integrity, but risk and criticality can be matched to acceptable,
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or realistic levels of risk.
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%
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FMEDA is the fundamental methodology of the statistical (safety integrity level)
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type standards (EN61508/IOC5108).
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@ -1250,7 +1255,7 @@ in the plant.
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This entire loop must be designed to detect and deal with any hazards
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and have measures in place to reduce their affects.
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%
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In EN61508 terminology, a safety~loop is known as a safety instrumented function (SIF).
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In EN61508 terminology, a safety~loop is known as a Safety Instrumented Function (SIF).
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%
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%
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@ -785,8 +785,9 @@ The second stage of this amplifier, following the signal path, is the amplifier
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consisting of $R3,R4$ and $IC2$.
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%
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This is in exactly the same configuration as the first amplifier, but it is being fed by the first amplifier.
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The first amplifier was grounded and received as input `+V1' (presumably
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a positive voltage).
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The first amplifier was connected to ground on its minus input
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and received as input `+V1' (explicitly
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a positive voltage from the schematic).
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This means the junction of R2 R3 is always +ve.
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This means the input voltage `+V2' could be lower than this.
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This means R3 R4 is not a fixed potential divider, with R4 being on the positive side.
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@ -952,7 +953,7 @@ The output of this is passed into another Sallen~Key filter. % -- which although
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%for its resistors/capacitors and thus have a different frequency response -- is identical from a failure mode perspective.
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Thus we can analyse the first Sallen~Key low pass filter and re-use it
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for the second stage
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(avoiding repeat work that would have had to be performed using traditional FMEA).
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(avoiding repeat work that would have been performed using traditional FMEA).
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\begin{figure}[h]
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@ -1070,7 +1071,8 @@ on the schematic as in figure~\ref{fig:circuit2002_LP1}.
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\paragraph{Second order Sallen Key Low Pass Filter.}
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The next two filters in the signal path are R1,R2,C2,C1,IC2 and R3,R4,C4,C3,IC3.
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From a failure mode perspective these are identical.
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We can analyse the first one and then re-use these results for the second (see figure~\ref{fig:circuit2002_FIVEPOLE}).
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We can analyse the first one (see table~\ref{tbl:sallenkeylp}) and then re-use these
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results for the next stage of analysis (see figure~\ref{fig:circuit2002_FIVEPOLE}).
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\begin{table}[ht]
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\caption{Sallen Key Low Pass Filter SKLP: Failure Mode Effects Analysis: Single Faults} % title of Table
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@ -1289,7 +1291,8 @@ We can now analyse each of these {\fgs} and create failure mode models for them,
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determine {\dcs}.
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\subsection{Inverting Amplifier: INVAMP}
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This has been analysed in section~\ref{sec:invamp}.
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The inverting amplifier was analysed in section~\ref{sec:invamp} and we can therefore simply re-use those results
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i.e. the {\dc} $INVAMP$.
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The inverting amplifier, as a {\dc}, has the following failure modes:
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$$ fm(INVAMP) = \{ AMP\_High, AMP\_Low, LowPass \}. $$ % \{ HIGH, LOW, LOW PASS \}. $$
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@ -1299,27 +1302,32 @@ $$ fm(INVAMP) = \{ AMP\_High, AMP\_Low, LowPass \}. $$ % \{ HIGH, LOW, LOW PASS
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\subsection{Phase shifter: PHS45}
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This consists of a resistor and a capacitor. We already have failure mode models for these components -- $ fm(R) = \{OPEN, SHORT\}$, $fm(C) = \{OPEN, SHORT\}$ --
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we now need to see how these failure modes would affect the phase shifter. Note that the circuit here
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This consists of a resistor and a capacitor.
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%
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We already have failure mode models for these components -- $ fm(R) = \{OPEN, SHORT\}$, $fm(C) = \{OPEN, SHORT\}$ --
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we now need to see how these failure modes would affect the phase shifter.
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%
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Note that the circuit here
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is identical to the low pass filter in circuit topology (see section~\ref{sec:lp}), but its intended use is different.
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%
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We have to analyse this circuit from the perspective of it being a {\em phase~shifter} not a {\em low~pass~filter}.
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%
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Our {\fg} for the phase shifter consists of a resistor and a capacitor, $G_0 = \{ R, C \}$
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(FMMD analysis details at section~\ref{detail:PHS45})
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$$ fm (G_0) = \{ nosignal, 0\_phaseshift \} $$
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(FMMD analysis details in appendix section~\ref{detail:PHS45}),
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%
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%
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$$ fm (G_0) = \{ nosignal, 0\_phaseshift \} . $$
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%$$ CC(G_0) = 4 \times 1 = 4 $$
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%23SEP2012
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\subsection{Non Inverting Buffer: NIBUFF.}
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%
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The non-inverting buffer {\fg} is comprised of one component, an op-amp.
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We use the failure modes for an op-amp~\cite{fmd91}[p.3-116] to represent this group.
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% GARK
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We can express the failure modes for the non-inverting buffer ($NIBUFF$) thus:
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$$ fm(NIBUFF) = fm(OPAMP) = \{L\_{up}, L\_{dn}, Noop, L\_slew \} . $$
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%
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%Because we obtain the failure modes for $NIBUFF$ from the literature,
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%its comparison complexity is zero. In re-using {\dcs} we expend no extra analysis effort.
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%$$ CC(NIBUFF) = 0 $$
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@ -1331,7 +1339,9 @@ $$ fm(NIBUFF) = fm(OPAMP) = \{L\_{up}, L\_{dn}, Noop, L\_slew \} . $$
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We could at this point bring all the {\dcs} together into one large functional
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group (see figure~\ref{fig:bubbaeuler1}) %{fig:poss1finalbubba})
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or we could try to merge smaller stages.
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or we could try to merge in smaller stages, which will have the side-effect of
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creating intermediate {\dcs}.
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%
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Initially we use the first identified {\fgs} to create our model without further stages of refinement/hierarchy.
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@ -1513,7 +1523,7 @@ $$
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%It has %also
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This more decomposed approach has
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given us five {\dcs}, building blocks, which could %
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be re-used in other projects.
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potentially be re-used in other projects.
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%potentially be re-used for similar circuitry
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%to analyse in the future.
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%
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@ -1530,7 +1540,7 @@ there will %would
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be more {\dcs} and this %therefore
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increases the potential for re-use of pre-analysed {\dcs}.
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%
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A finer grained model---with potentially more hierarchy stages---conveys that
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A finer grained model---with potentially more hierarchy stages---also means that
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%more work, or
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more reasoning stages have been used in the analysis.
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% HTR The more we can modularise, the more we decimate the $O(N^2)$ effect
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@ -1922,11 +1932,11 @@ industrial applications below 600\oc, due to high accuracy\cite{aoe}.
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%
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%This section looks at the most common configuration, the
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%four wire circuit, and analyses it from an FMEA perspective twice.
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FMMD is performed twice on this circuit
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firstly considering single faults only
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%FMMD is performed twice on this circuit
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%firstly considering single faults only
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%(cardinality constrained powerset of 1)
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and secondly, considering the
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possibility of double faults. % (cardinality constrained powerset of 2).
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%and secondly, considering the
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%possibility of double faults. % (cardinality constrained powerset of 2).
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%
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% \ifthenelse {\boolean{pld}}
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% {
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@ -1975,9 +1985,13 @@ look-up tables or a suitable polynomial expression.
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The voltage ranges we expect from this three stage potential divider\footnote{Two stages are required
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for validation, a third stage is used to measure the current flowing
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through the circuit to obtain accurate temperature readings.}
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are shown in figure \ref{fig:Pt100vrange}. Note that there is
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an expected range for each reading, for a given temperature span.
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Note that the low reading goes down as temperature increases, and the higher reading goes up.
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are shown in figure \ref{fig:Pt100vrange}.
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%
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Note that there is
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an expected range for each low and high reading, for a given temperature span.
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%
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The low reading goes down as temperature increases, and the higher reading goes up.
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%
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For this reason the low reading will be referred to as {\em sense-}
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and the higher as {\em sense+}.
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@ -2114,7 +2128,7 @@ we can calculate the current by reading
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the voltage over the known resistor $R2$.\footnote{To calculate the resistance of the Pt100 we need the current flowing though it.
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We can determine this via Ohms law applied to $R_2$, $V=IR$, $I=\frac{V}{R_2}$,
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and then using $I$, we can calculate $R_{3} = \frac{V_{R3}}{I}$.}
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As these calculations are performed by ohms law, which is linear, the accuracy of the reading
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As these calculations are performed by Ohms law, which is linear, the accuracy of the reading
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will be determined by the accuracy of $R_2$ and $R_{3}$.
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%It is reasonable to
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%take the mean square error of these accuracy figures.
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@ -2173,38 +2187,38 @@ for any single error (short or opening of any resistor) this bounds check
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will detect it.
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\paragraph{Consideration of Resistor Tolerance.}
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%
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\label{sec:ptbounds}
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The separate sense lines ensure the voltage read over the $Pt100$ thermistor is not
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altered by having to pass any significant current. The current is supplied
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by separate wires and the resistance in those are effectively cancelled
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out by considering the voltage reading over $R_3$ to be relative.
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%
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The Pt100 element is a precision part and will be chosen for a specified accuracy/tolerance range.
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One or other of the load resistors (the one over which we measure current) should also
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be of a specified accuracy\footnote{It is common for standard surface mount resistors to have an
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accuracy of $\pm 1\%$. Higher accuracy parts may be specified.}.
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%
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The \ohms{2k2} loading resistors should have a good temperature co-effecient
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(i.e. $\leq \; 50(ppm)\Delta R \propto \Delta \oc $).
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%
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To calculate the resistance of the Pt100 element % (and thus derive its temperature),
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knowing $V_{R3}$ we now need the current flowing in the temperature sensor loop.
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%
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Lets use, for the sake of example, $R_2$ to measure the current.
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%
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We can calculate the current $I$, by reading
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the voltage over the known resistor $R_2$ and using Ohms law\footnote{To calculate the resistance of the Pt100 we need the current flowing though it.
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We can determine this via Ohms law applied to $R_2$, $V=IR$, $I=\frac{V}{R_2}$,
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and then using $I$, we can calculate $R_{3} = \frac{V_{3}}{I}$.} and then use Ohms law again to calculate
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the resistance of $R_3$.
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%
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As Ohms law is linear, the accuracy of the reading
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will be determined by the accuracy of $R_2$ and $R_{3}$. It is reasonable to
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take the mean square error of these accuracy figures~\cite{probstat}.
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% WAS a repeated paragraph
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% \paragraph{Consideration of Resistor Tolerance.}
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% %
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% \label{sec:ptbounds}
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% The separate sense lines ensure the voltage read over the $Pt100$ thermistor is not
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% altered by having to pass any significant current. The current is supplied
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% by separate wires and the resistance in those are effectively cancelled
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% out by considering the voltage reading over $R_3$ to be relative.
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% %
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% The Pt100 element is a precision part and will be chosen for a specified accuracy/tolerance range.
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% One or other of the load resistors (the one over which we measure current) should also
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% be of a specified accuracy\footnote{It is common for standard surface mount resistors to have an
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% accuracy of $\pm 1\%$. Higher accuracy parts may be specified.}.
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% %
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% The \ohms{2k2} loading resistors should have a good temperature co-effecient
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% (i.e. $\leq \; 50(ppm)\Delta R \propto \Delta \oc $).
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% %
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% To calculate the resistance of the Pt100 element % (and thus derive its temperature),
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% knowing $V_{R3}$ we now need the current flowing in the temperature sensor loop.
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% %
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% Lets use, for the sake of example, $R_2$ to measure the current.
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% %
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% We can calculate the current $I$, by reading
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% the voltage over the known resistor $R_2$ and using Ohms law\footnote{To calculate the resistance of the Pt100 we need the current flowing though it.
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% We can determine this via Ohms law applied to $R_2$, $V=IR$, $I=\frac{V}{R_2}$,
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% and then using $I$, we can calculate $R_{3} = \frac{V_{3}}{I}$.} and then use Ohms law again to calculate
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% the resistance of $R_3$.
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% %
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% As Ohms law is linear, the accuracy of the reading
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% will be determined by the accuracy of $R_2$ and $R_{3}$. It is reasonable to
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% take the mean square error of these accuracy figures~\cite{probstat}.
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%
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\paragraph{Single Fault FMEA Analysis of $Pt100$ Four wire circuit}
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@ -2305,8 +2319,8 @@ read 5V. Both readings are outside the proscribed range.
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\subsection{Summary of Analysis}
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All six test cases have been analysed and the results agree with the hypothesis
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put in table~\ref{ptfmea}.
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All six test cases have been analysed and the results agree with the FMEA
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presented in table~\ref{ptfmea}.
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%The PLD diagram, can now be used to collect the symptoms.
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In this case there is a common and easily detected symptom for all these single
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resistor faults---that of---`voltage~out~of~range'.
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@ -2332,7 +2346,7 @@ resistors in this circuit has failed.
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\subsection{Derived Component with one failure mode.}
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The Pt100 circuit can now be treated as a component in its own right, and has one failure mode,
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{\textbf OUT\_OF\_RANGE}. This is a single, detectable failure mode. The observability of a
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{\textbf OUT\_OF\_RANGE}. This is a single, detectable failure mode. The detectability of a
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fault condition is very good with this circuit. This should not be a surprise, as the four wire $Pt100$
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has been developed for safety critical temperature measurement.
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%
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@ -2425,13 +2439,17 @@ TC 18: & $R_2$ SHORT $R_3$ SHORT & low & low & Both out of Rang
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\label{Pt100:bothfloating}
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This double fault mode produces an interesting symptom.
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Both sense lines are floating.
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%
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We cannot know what the {\adctw} readings on them will be.
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%
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In practise these would probably float to low values
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In practise these would probably float to low or high values
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but for the purpose of a safety critical analysis,
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all we can say is that the values are `floating' and `unknown'.
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This is an interesting case, because it is, at this stage an undetectable---or unobservable---
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fault. Unobservable faults are generally unacceptable in a safety critical environment~\cite{ACS:ACS1297,721666}.
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%
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This is an interesting case, because it is, at this stage an undetectable %---or unobservable---
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fault.
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%
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Undetectable faults are generally to be avoided in a safety critical environment~\cite{ACS:ACS1297,721666}.
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%that must be handled.
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@ -183,11 +183,19 @@ and to outputs (where violations can be considered {\fms} in FMMD terminology).
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For the purpose of example, we chose a simple common safety critical industrial circuit
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that is nearly always used in conjunction with a programmatic element.
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%
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A common method for delivering a quantitative value in analogue electronics is
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to supply a current signal to represent the value to be sent~\cite{aoe}[p.934].
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%
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Usually, $4mA$ represents a zero or starting value and $20mA$ represents the full scale,
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and this is referred to as {\ft} signalling which has intrinsic electrical safety advantages.
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and this is referred to as {\ft} signalling.
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%
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Using current instead of voltage to transmit an analogue value
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has intrinsic electrical safety advantages mainly due to
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current being constant in a circuit (Kirchovs current law).
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%
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What is sent as current is what will
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arrive at the receiving end.
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%
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% Because the current in a loop is constant~\cite{aoe}[p.20],
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% resistance in the wires between the source and receiving end is not an issue
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@ -716,7 +724,7 @@ top or system level failure.
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For this reason applying traditional FMEA to software stretches
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the reasoning distance even further. This is exacerbated by the fact that traditional SFMEA is
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performed separately from HFMEA~\cite{sfmea,sfmeaa}, additionally even the software/hardware
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interfacing is treated as a separate FMEA task~\cite{sfmeainterface,embedsfmea,procsfmea}
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interfacing is usually treated as a separate FMEA task~\cite{sfmeainterface,embedsfmea,procsfmea}
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We now have a {\dc} for a {\ft} input in software.
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@ -101,7 +101,7 @@ side effects of failure may manifest due to interaction with other components no
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The temptation with FMEA can be to follow direct lines of failure effect reasoning without considering
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side effects.
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%%
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To perform FMEA exhaustively % rigorously
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To perform FMEA exhaustively, % rigorously
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we could stipulate that every failure mode must be checked for effects
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against all the components in the system.
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%
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@ -132,7 +132,7 @@ of components $G$. %system or {\fg}.
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\label{sec:formal7}
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%
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%\paragraph{Considering a system as a group of Components.}
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Using the language developed in the previous chapters
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Using the language developed in the previous chapters,
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we consider a system for analysis as a collection %{\fg}
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of components.
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We can represent this set of components as $G$, and the number of components in it by
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@ -216,7 +216,7 @@ $i$ for identification and a superscript for the $\alpha$~level (see section~\r
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%---
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%o identify the hierarchy.
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For example the first {\fg} in a hierarchy containing base components only
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i.e. at the zero'th level of an FMMD hierarchy where $\alpha=0$, would have the superscript 0 and a subscript of 1: $FG^{0}_{1}$.
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i.e. at the zeroth level of an FMMD hierarchy where $\alpha=0$, would have the superscript 0 and a subscript of 1: $FG^{0}_{1}$.
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%
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The {\fg} representing the potential divider in section~\ref{subsec:potdiv}
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has an $\alpha$ level of 0 (as it contains base components). The {\fg}
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@ -267,8 +267,9 @@ We overload the comparison complexity function $CC$, to obtain the comparison co
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\end{equation}
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\subsection{Complexity Comparison Examples}
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\label{sec:theoreticalperfmodel}
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%\pagebreak[4]
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We initially work though the amplifier example from chapter~\ref{sec:chap4}, which has two
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We initially work through the amplifier example from chapter~\ref{sec:chap4}, which has two
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stages, the potential divider and then the amplifier. We add the complexities from
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both these stages to determine how many reasoning paths there were to perform FMMD analysis on the
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non-inverting amplifier.
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@ -292,6 +293,7 @@ we obtain $ 2 \times (3-1) + 2 \times (3-1) + 4 \times (3-1)$ = 16.
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Even with this very trivial example, we begin to see benefits of taking a modular approach to FMEA.
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\paragraph{Complexity Comparison for a hypothetical 81 component system.}
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%Even considering a $example$
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A system, $example$, with just 81 components, with these components
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having 3 failure modes each would, using equation~\ref{eqn:rd2} have a $CC$ of
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@ -474,7 +476,7 @@ produce figure~\ref{fig:xfmeafmmdcomp} may be found in section~\ref{sec:gnuplotx
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Looking at the graph in figure~\ref{fig:xfmeafmmdcomp} we see that the reasoning distance
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for large numbers of components becomes extremely difficult to achieve
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for FMEA.
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for traditional FMEA.
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%
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It can be seen that the reasoning distance has gone from a polynomial to a logarithmic order.
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%
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||||
@ -503,7 +505,7 @@ compared to the DFT algorithm.
|
||||
|
||||
|
||||
%\clearpage
|
||||
\subsection{Complexity Comparison applied to FMMD electronic circuits analysed in chapter~\ref{sec:chap5}.}
|
||||
\section{Complexity Comparison applied to FMMD electronic circuits analysed in chapter~\ref{sec:chap5}.}
|
||||
|
||||
All the FMMD examples in chapters \ref{sec:chap5}
|
||||
and \ref{sec:chap6} showed a marked reduction in comparison
|
||||
@ -1268,7 +1270,7 @@ We could consider the component a composite
|
||||
of two simpler components, and model their interaction to
|
||||
create a derived component (i.e. use FMMD).
|
||||
%
|
||||
The second way to do this would be to consider the combnations of non-mutually
|
||||
The second way to do this would be to consider the combinations of non-mutually
|
||||
exclusive {\fms} as new {\fms}: this approach is discussed below.
|
||||
|
||||
\ifthenelse {\boolean{paper}}
|
||||
@ -1353,7 +1355,7 @@ The choice of components for {\fgs} is one to be made by the analyst.
|
||||
The guiding principle it to choose components that are functionally adjacent
|
||||
and try to create the smallest groups possible.
|
||||
There are some mistakes that an analyst could make when choosing the members
|
||||
of functional groups. These are
|
||||
of functional groups. These are:
|
||||
\begin{itemize}
|
||||
\item Choosing components that are not functionally adjacent --- i.e. components that do not work together to perform a specific function,
|
||||
\item Not including components that may have side effects on the {\fg}, but are not obviously connected.
|
||||
|
@ -10,8 +10,8 @@ The FMECA and FMEDA variants also suffer from embedding subjective and objective
|
||||
%
|
||||
A modularised FMEA---Failure Mode Modular De-composition (FMMD)---had been proposed.
|
||||
%
|
||||
This modularised version had been supported by the work already established in the
|
||||
{\fms} of {\bc} in the literature~\cite{fmd91,mil1991,en298,en230}.
|
||||
This modularised version had been supported by the work already established by the definition of
|
||||
{\fms} for {\bc} in the literature~\cite{fmd91,mil1991,en298,en230}.
|
||||
%
|
||||
A selection of electronic examples was analysed using FMMD
|
||||
which deliberately introduced varying circuit
|
||||
@ -33,21 +33,21 @@ Traditional FMEA methods have been applied to software, but analysis has always
|
||||
the electronic FMEA~\cite{sfmeaa,sfmea}. %, and while modular kept strictly to a bottom-up approach.
|
||||
%
|
||||
Using established concepts from contract programming~\cite{dbcbe} FMMD was extended to analyse software,
|
||||
which allows us to neatly solve the software hardware interfacing problem~\cite{sfmeainterface}.
|
||||
which facilitated a solution to the software/hardware interfacing problem~\cite{sfmeainterface}.
|
||||
%
|
||||
Two examples of mixed software and hardware systems were analysed as integrated FMMD models
|
||||
as a proof of concept. The first example in chapter~\ref{sec:chap6}, was
|
||||
as proof of concept. The first example in chapter~\ref{sec:chap6}, was
|
||||
presented to the System Safety IET conference in 2012~\cite{syssafe2012}.
|
||||
%
|
||||
Chapter~\ref{sec:chap7} viewed FMMD from a formal perspective and looked at problems and constraints
|
||||
necessary to perform FMEA and FMMD.
|
||||
%
|
||||
Theoretical performance models were developed which showed that with increasing modularisation
|
||||
the number of manual checks to perform for analysis fell, which was validated by examining the
|
||||
electronic examples in this regard.
|
||||
Theoretical performance models were developed (see section~\ref{sec:theoreticalperfmodel}) which showed that with increasing modularisation
|
||||
the number of manual checks to perform for analysis fell, which was validated by examining the reasoning distance performance of
|
||||
the examples from chapter~\ref{sec:chap5}. % in this regard.
|
||||
%
|
||||
A unitary state failure mode constraint was developed for the failure modes of a component, and it was shown that
|
||||
the FMMD process strictly enforced this throughout the hierarchy of a model.
|
||||
A unitary state failure mode concept was developed (see section~\ref{sec:unitarystate}), and it was shown that
|
||||
the FMMD process naturally enforced this throughout the hierarchy of a model.
|
||||
%
|
||||
Finally the FMMD process was described algorithmically using set theory in appendix~\ref{sec:algorithmfmmd}.%{app:alg}.
|
||||
|
||||
@ -65,13 +65,13 @@ In conclusion then, a new method of failure analysis has been devised which imp
|
||||
|
||||
\begin{itemize}
|
||||
\item FMMD provides the means to create failure models that integrate software and hardware,
|
||||
\item State explosion related to exhaustive FMEA solved,
|
||||
\item Modular approach means analysis work is re-usable,
|
||||
\item FMMD encourages
|
||||
\item Distributed systems, and smart instruments, can now be analysed and assessed,
|
||||
\item Multiple failures can be analysed (without an undue state explosion cost).
|
||||
\item the state explosion related to exhaustive FMEA solved,
|
||||
\item a modular approach to FMEA means that analysis work is re-usable,
|
||||
%\item FMMD encourages
|
||||
\item distributed systems, and smart instruments, can now be analysed and assessed,
|
||||
\item multiple failures can be analysed (without an undue state explosion cost).
|
||||
\end{itemize}
|
||||
Under the following assumptions and constraints:
|
||||
These benefits fall under the following assumptions and constraints:
|
||||
\begin{itemize}
|
||||
\item Failure modes are available for all {\bcs},
|
||||
\item Analysts are capable of finding suitable {\fgs} from electronic schematics,
|
||||
@ -82,7 +82,7 @@ Under the following assumptions and constraints:
|
||||
|
||||
|
||||
Whilst investigating FMMD a number of further areas for research revealed themselves.
|
||||
These are explained below.
|
||||
These are presented below.
|
||||
|
||||
%\section{Conclusion}
|
||||
|
||||
@ -94,27 +94,32 @@ These are explained below.
|
||||
|
||||
\section{Further Work}
|
||||
%This section describes areas that the study has revealed where the FMMD methodology may be extended or improved.
|
||||
\section{How traditional FMEA reports can be derived from an FMMD model.}
|
||||
\subsection{How traditional FMEA reports can be derived from an FMMD model.}
|
||||
%
|
||||
An FMMD model has a data structure (described by UML diagrams, see figure~\ref{fig:cfg}), and by traversing this
|
||||
An FMMD model has a data structure (described by UML diagrams, see figure~\ref{fig:cfg}), and by traversing an FMMD hierarchy
|
||||
we can map system level failures back to {\bc} {\fms} (or combinations thereof).
|
||||
%
|
||||
Because we can determine these mappings we can produce reports in the traditional FMEA format ({\bc}~{\fm}~$\mapsto$~{system failure}).
|
||||
%
|
||||
With the addition of {\bc} {\fm} statistics~\cite{mil1991} we can provide reliability predictions for system level failures.
|
||||
%
|
||||
The Pt100 example is revisited for this purpose and analysed for single and double failures, with statistics for {\bcs}
|
||||
taken from MIL1991 %~\cite{mil1991},
|
||||
in section~\ref{sec:bcstats}.
|
||||
%
|
||||
With an FMMD failure mode model a top down perspective is possible.
|
||||
%
|
||||
We could for instance take each system level failure and produce a causation tree for it, tracing back
|
||||
to all {\bc} {\fms}.
|
||||
%
|
||||
This is very closely related to the structure of FTA (top down) failure causation graphs.
|
||||
%
|
||||
The possibility of automatically producing FTA diagrams from FMMD models
|
||||
is examined in section~\ref{sec:fta}.
|
||||
%
|
||||
|
||||
|
||||
\section{Statistics: From base component failure modes to System level events/failures.}
|
||||
\subsection{Statistics: From base component failure modes to System level events/failures.}
|
||||
\label{sec:bcstats}
|
||||
Knowing the statistical likelihood of a component failing can give a good indication
|
||||
of the reliability of a system, or in the case of dangerous failures, the Safety Integrity Level
|
||||
@ -132,7 +137,7 @@ we can %therefore
|
||||
use FMMD to produce an FMEDA report.
|
||||
|
||||
|
||||
\subsection{Pt100 Example: Single Failures and statistical data}. %Mean Time to Failure}
|
||||
\paragraph{Pt100 Example: Single Failures and statistical data} %Mean Time to Failure}
|
||||
|
||||
From an earlier example, the model for the failure mode behaviour of the Pt100 circuit,
|
||||
we can add {\bc} {\fm} statistics and determine the probability of symptoms of failure.
|
||||
@ -205,22 +210,22 @@ compromises and uses a 9:1 OPEN:SHORT ratio, for resistor failure.
|
||||
%
|
||||
Thus for this example resistors are expected to fail OPEN in 90\% of cases and SHORTED
|
||||
in the other 10\%.
|
||||
A standard fixed film resistor, for use in a benign environment, non military spec at
|
||||
A standard fixed film resistor, for use in a benign environment, non military specification at
|
||||
temperatures up to {60\oc} is given a probability of 13.8 failures per billion ($10^9$)
|
||||
hours of operation (see equation \ref{eqn:resistor}).
|
||||
This figure is referred to as a FIT\footnote{FIT values are measured as the number of
|
||||
In EN61508 terminology, this figure is referred to as a Failure in Time FIT\footnote{FIT values are measured as the number of
|
||||
failures per Billion (${10}^9$) hours of operation, (roughly 114,000 years). The smaller the
|
||||
FIT number the more reliable the fault~mode} Failure in time.
|
||||
|
||||
FIT number the more reliable the component.}.
|
||||
%
|
||||
The formula given for a thermistor in MIL-HDBK-217F\cite{mil1991}[9.8] is reproduced in
|
||||
equation \ref{thermistorfit}. The variable meanings and values are described in table \ref{tab:thermistor}.
|
||||
|
||||
%
|
||||
\begin{equation}
|
||||
% fixed comp resistor{\lambda}_p = {\lambda}_{b}{\pi}_{R}{\pi}_Q{\pi}_E
|
||||
resistor{\lambda}_p = {\lambda}_{b}{\pi}_Q{\pi}_E
|
||||
\label{thermistorfit}
|
||||
\end{equation}
|
||||
|
||||
%
|
||||
\begin{table}[ht]
|
||||
\caption{Bead type Thermistor Failure in time assessment} % title of Table
|
||||
\centering % used for centering table
|
||||
@ -238,23 +243,18 @@ resistor{\lambda}_p = {\lambda}_{b}{\pi}_Q{\pi}_E
|
||||
\end{tabular}
|
||||
\label{tab:thermistor}
|
||||
\end{table}
|
||||
|
||||
|
||||
%
|
||||
\begin{equation}
|
||||
0.021 \times 1.0 \times 15.0 \times 1.0 = 0.315 \; {failures}/{{10}^{6} Hours}
|
||||
\label{eqn:thermistor}
|
||||
\end{equation}
|
||||
|
||||
|
||||
%
|
||||
Thus thermistor, bead type, `non~military~spec' is given a FIT of 315.0
|
||||
|
||||
%
|
||||
Using the RIAC finding we can draw up the following table (table \ref{tab:stat_single}),
|
||||
showing the FIT values for all faults considered.
|
||||
\glossary{name={FIT}, description={Failure in Time (FIT). The number of times a particular failure is expected to occur in a $10^{9}$ hour time period.}}
|
||||
|
||||
|
||||
|
||||
|
||||
\begin{table}[h+]
|
||||
\caption{Pt100 FMEA Single // Fault Statistics} % title of Table
|
||||
\centering % used for centering table
|
||||
@ -331,16 +331,19 @@ This is an astronomically small MTTF, and so small that it would
|
||||
probably fall below a threshold to sensibly consider.
|
||||
%
|
||||
However, it is very interesting from a failure analysis perspective,
|
||||
because here we have found a fault that we cannot detect at this
|
||||
level. This means that should we wish to cope with
|
||||
this fault, we need to devise a way of detecting this
|
||||
condition in higher levels of the system.
|
||||
because here we have found a fault that we cannot detect (at least at this
|
||||
level in the FMMD hierarchy).
|
||||
%
|
||||
This means that should we wish to cope with
|
||||
this fault, we need to devise a new way of detecting this
|
||||
condition, perhaps in higher levels of the system/FMMD hierarchy.
|
||||
%
|
||||
\glossary{name={FIT}, description={Failure in Time (FIT). The number of times a particular failure is expected to occur in a $10^{9}$ hour time period. Associated with continuous demand systems under EN61508~\cite{en61508}}}
|
||||
|
||||
|
||||
%
|
||||
%
|
||||
\subsection{Deriving FTA diagrams from FMMD models}
|
||||
\label{sec:fta}
|
||||
|
||||
%
|
||||
Fault Tree Analysis (FTA)~\cite{ftahistory} is a top down methodology that
|
||||
draws a fault tree---or top down fault causation diagram---for each given top-level
|
||||
failure. With an FMMD model, we can trace all the causes of system failures
|
||||
@ -357,7 +360,10 @@ The FTA perspective is that some safety can be built in
|
||||
by preventing certain things happening (inhibit gates), and by considering
|
||||
different behaviour due to environmental or operational states~\cite{nucfta,nasafta}.
|
||||
%
|
||||
If we require FMMD to produce full FTA diagrams, we need to add these attributes to the FMMD UML model.
|
||||
If we require FMMD to produce full FTA diagrams, we need to add these
|
||||
attributes to the FMMD UML model\footnote{Top down failure mode models, such as FTA, are additionally
|
||||
useful in guiding diagnostic analysis.}.
|
||||
|
||||
|
||||
\paragraph{Environment, operational states and inhibit gates: additions to the UML model.}
|
||||
|
||||
@ -484,9 +490,8 @@ all failure modes of the resultant {\dcs} as we progress up a hierarchy.
|
||||
FMMD requires that all failure modes of components in a {\fg} are resolved to
|
||||
a symptom in the resulting {\dc}.
|
||||
%
|
||||
FMMD thus finds failure modes that are not
|
||||
dealt with as a symptom, i.e. were ignored
|
||||
or forgotten, meaning that the FMMD process will expose un-handled
|
||||
Because we can enforce a `complete' analysis, FMMD can find failure modes were missed by
|
||||
other FMEA processes; meaning that the FMMD process can expose un-handled
|
||||
failure modes.
|
||||
%come to light.
|
||||
|
||||
@ -521,7 +526,7 @@ By performing FMMD on a software electronic hybrid system,
|
||||
we thus reveal design deficiencies in both the software, the electronics and the software/electronics interface.
|
||||
%in the hardware/software interface.
|
||||
%
|
||||
FMEDA does not handle software ---or---the software hardware interface.
|
||||
FMEDA does not handle software ---or---the software/hardware interface.
|
||||
It thus potentially misses many undetected failures (in EN61508 terms undetected-dangerous and undetected safe failures).
|
||||
In Safety Integrity Level (SIL)~\cite{en61508} terms, by identifying undetectable faults and fixing them, we raise
|
||||
the safe failure fraction (SFF).
|
||||
@ -532,7 +537,8 @@ the safe failure fraction (SFF).
|
||||
\section{Objective and Subjective Reasoning stages}
|
||||
%Opportunity for formal definitions and perhaps an interface or process for achieving it....
|
||||
The act of applying failure mode effects analysis, in terms of cause and effect is viewed from
|
||||
an engineering perspective. This is the realm of the objective.
|
||||
an `engineering' mentality cause and effect perspective. This is the realm of the objective.
|
||||
%
|
||||
The executive decisions about deploying systems are in the domain of management and politics.
|
||||
%
|
||||
The dangers, or potential negative effects of a safety critical system depend not only on the system itself,
|
||||
@ -545,8 +551,8 @@ An example of objective and subjective factors is demonstrated in the accident r
|
||||
nuclear accident~\cite{safeware}[App.D]. Here, a vent valve for the primary reactor coolant (pressurised water) became stuck open.
|
||||
This condition causes an objectively derived failure mode --- `leakage~of~coolant' --- due to a stuck valve.
|
||||
%
|
||||
This, if recognised correctly by the operators, would have lead to
|
||||
a short reactor shut-down and then
|
||||
This, if recognised correctly by the operators, would have lead quickly to
|
||||
to a reactor shut-down and
|
||||
a maintenance procedure to replace the valve.
|
||||
%
|
||||
The failure was not recognised in time however, and coolant was lost
|
||||
@ -557,8 +563,8 @@ For the objective failure mode determined by
|
||||
FMEA, that of leakage of coolant,
|
||||
we would not reasonably expect this to go unchecked and unresolved for an extended period and cause such a critical failure.
|
||||
%
|
||||
The criticality level is therefore subjective. We cannot know how the operators
|
||||
would have reacted, and deficiencies in the HMI were not a factor in the failure analysis.
|
||||
The criticality level of that accident was therefore subjective. It was not known how the operators
|
||||
would have reacted, and deficiencies in the Human Machine Interface (HMI) were not a factor in the failure analysis.
|
||||
|
||||
|
||||
\paragraph{Further Work: Objective and Subjective Reasoning in FMEA.}
|
||||
|
Loading…
Reference in New Issue
Block a user