start the survey page
This commit is contained in:
Robin
parent
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commit
e09e789d43
17
survey/Makefile
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17
survey/Makefile
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#
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# Make the propositional logic diagram a paper
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#
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paper: paper.tex survey_paper.tex
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#latex paper.tex
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#dvipdf paper pdflatex cannot use eps ffs
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pdflatex paper.tex
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okular paper.pdf
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# Remove the need for referncing graphics in subdirectories
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#
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survey_paper.tex: survey.tex
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cat survey.tex | sed 's/survey\///' > survey_paper.tex
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404
survey/mybib.bib
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404
survey/mybib.bib
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@ -0,0 +1,404 @@
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%
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%
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% $Id: mybib.bib,v 1.5 2008/12/18 17:05:23 robin Exp $
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%
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%
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@TechReport{db,
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author = {R Clark, D Legge},
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title = {ETC6000 Daughterboard Design notes},
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institution = {ETC HR221850},
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year = {2004},
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key = {},
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||||
OPTtype = {},
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OPTnumber = {},
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||||
OPTaddress = {},
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||||
OPTmonth = {},
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||||
OPTnote = {},
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||||
OPTannote = {},
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OPTurl = {},
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OPTdoi = {},
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issn = {HR221850},
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OPTlocalfile = {},
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OPTabstract = {},
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||||
}
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@TechReport{mil1991,
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author = {U.S. Department of Defence},
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title = {Reliability Prediction of Electronic Equipment},
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institution = {DOD},
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year = {1991},
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key = {MIL-HDBK-217F},
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OPTtype = {},
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||||
OPTnumber = {},
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||||
OPTaddress = {},
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||||
OPTmonth = {},
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||||
OPTnote = {},
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||||
OPTannote = {},
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||||
OPTurl = {},
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OPTdoi = {},
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OPTissn = {},
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OPTlocalfile = {},
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OPTabstract = {},
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}
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@Manual{tlp181,
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title = {TLP 181 Datasheet},
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key = {TOSHIBA Photocoupler GaAs Ired & Photo−Transistor},
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author = {Toshiba inc.},
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OPTorganization = {},
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%address = {http://www.toshiba.com/taec/components2/Datasheet\_Sync//206/4191.pdf},
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OPTedition = {},
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OPTmonth = {},
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year = {2009},
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OPTnote = {},
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OPTannote = {},
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OPTurl = {},
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OPTdoi = {},
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OPTissn = {},
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OPTlocalfile = {},
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OPTabstract = {},
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||||
}
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@Manual{pic18f2523,
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title = {PIC18F2523 Datasheet},
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OPTkey = {},
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author = {Microchip inc},
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OPTorganization = {},
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||||
address = {http://ww1.microchip.com/downloads/en/DeviceDoc/39755c.pdf},
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OPTedition = {},
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OPTmonth = {},
|
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year = {2009},
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||||
OPTnote = {},
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||||
OPTannote = {},
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OPTurl = {},
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OPTdoi = {},
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OPTissn = {},
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OPTlocalfile = {},
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OPTabstract = {},
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||||
}
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@Book{wt,
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title = {Water Treatment Essentials for Boiler Plant Operation},
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publisher = {Mc Graw Hill ISBN 0-07-048291-5},
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year = {1997},
|
||||
author = {Robert G Nunn},
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ALTALTeditor = {},
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||||
OPTkey = {},
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||||
OPTvolume = {},
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||||
OPTnumber = {},
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||||
OPTseries = {},
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OPTaddress = {},
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||||
OPTedition = {},
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OPTmonth = {},
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OPTnote = {},
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||||
OPTannote = {},
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OPTurl = {},
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OPTdoi = {},
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OPTissn = {ISBN 0-07-048291-5},
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OPTlocalfile = {},
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OPTabstracts = {},
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}
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@TechReport{pcbAI222562,
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author = {C Talmay},
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title = {Circuit Schematic TDS Daughterboard AI222562},
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institution = {ETC},
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year = {2010},
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OPTkey = {},
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||||
OPTtype = {},
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OPTnumber = {AI222562},
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OPTaddress = {},
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OPTmonth = {},
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OPTnote = {},
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OPTannote = {},
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||||
OPTurl = {},
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||||
OPTdoi = {},
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||||
OPTissn = {},
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OPTlocalfile = {},
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OPTabstract = {},
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||||
}
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@TechReport{spiraxsarco,
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author = {Spirax Sarco},
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title = {http://www.spiraxsarco.com/resources/steam-engineering-tutorials.asp},
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institution = {Spirax Sarco},
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||||
year = {2010},
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OPTkey = {},
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||||
OPTtype = {},
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||||
OPTnumber = {},
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||||
OPTaddress = {},
|
||||
OPTmonth = {},
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OPTnote = {},
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||||
OPTannote = {},
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||||
OPTurl = {},
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||||
OPTdoi = {},
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OPTissn = {},
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OPTlocalfile = {},
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OPTabstract = {},
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}
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@Book{aoe,
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title = {The Art of Electronics},
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publisher = {Cambridge},
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year = {1989},
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author = {Paul Horowitz, Winfield Hill},
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%author = {},
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OPTkey = {},
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OPTvolume = {},
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OPTnumber = {},
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OPTseries = {},
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OPTaddress = {},
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OPTedition = {2nd},
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OPTmonth = {},
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OPTnote = {},
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OPTannote = {},
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OPTurl = {},
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OPTdoi = {},
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OPTissn = {ISBN 0-521-37095-7},
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OPTlocalfile = {},
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OPTabstracts = {},
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}
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@TechReport{eurothermtables,
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author = {},
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title = {Thermocouple Emf TABLES and PLATINUM 100 RESISTANCE THERMOMETER TABLES},
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institution = {Eurotherm},
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year = {1973},
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OPTkey = {},
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OPTtype = {},
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OPTnumber = {},
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OPTaddress = {},
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OPTmonth = {June},
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OPTnote = {Bulletin TT-1},
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OPTannote = {},
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OPTurl = {},
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OPTdoi = {},
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OPTissn = {},
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OPTlocalfile = {},
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OPTabstract = {},
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}
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@MISC{iso639-1,
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title = "ISO 639-1: Code for the Representation of Names of Languages",
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author = "International Standardization Organization",
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howpublished = "http://www.loc.gov/standards/iso639-2/criteria1.html"
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year = "1998"
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}
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@MISC{nano-x,
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title = "The nano-X windowing system",
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author = "Greg Haerr",
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howpublished = "http://www.microwindows.org/"
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year = "2003"
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}
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@MISC{X11,
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title = "The XFree86 Project, Inc",
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author = "Open Source",
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howpublished = "http://www.xfree86.org/"
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year = "1992"
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}
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http://www.xfree86.org/
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@MISC{iso639-2,
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title = "ISO 639-2: Code for the Representation of Names of Languages",
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author = "International Standardization Organization",
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howpublished = "http://www.loc.gov/standards/iso639-2/criteria1.html"
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year = "1998"
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}
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@misc{ touchscreenprod,
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author = "M. Thirsk",
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title = "Touchscreen Production Procedure : HR~222165",
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howpublished = "Internal ETC Document",
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year = "2008" };
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@misc{ touchscreensoftware,
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author = "ETC Software Dept.",
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title = "Touchscreen Software released to Production : HR~222162",
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howpublished = "Internal ETC Software (medium: 2 MMC cards)",
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year = "2008" };
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@misc{ touchscreengui,
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author = "D.J. Legge, R.P.Clark",
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title = "Touchscreen GUI Design Document : HR~222163",
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howpublished = "Internal ETC Document",
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year = "2008" };
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@misc{ gumstix,
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author = "Gumstix Inc",
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title = "Gumstix Home Page",
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howpublished = "WEB http://www.gumstix.com/",
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year = "2008" };
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@misc{ fltk,
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author = "FLTK open Source Developers",
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title = "Fast Light Toolkit",
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howpublished = "WEB http://www.fltk.org/",
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year = "2008" };
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@Book{ldd,
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author = {Jonathon Corbet},
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ALTeditor = {Alessandro Rubini},
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ALTeditor = {Greg Kroah-Hartman},
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title = {Linux Device Drivers},
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publisher = {O'Reilly ISBN 0-596-00590-3},
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year = {1998},
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OPTkey = {ISBN 0-596-00590-3},
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OPTvolume = {},
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OPTnumber = {},
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OPTseries = {linux},
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OPTaddress = {},
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OPTedition = {3rd},
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OPTmonth = {},
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OPTnote = {},
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OPTannote = {},
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||||
OPTurl = {www.oreilly.com},
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OPTdoi = {},
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||||
OPTissn = {},
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OPTlocalfile = {},
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OPTabstract = {}
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};
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@Book{bash,
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author = {Carl Albing},
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title = {Bash Cookbook},
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publisher = {O'Reilly ISBN 0-596-52678-4},
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year = {2007},
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||||
OPTkey = {ISBN 0-596-52678-4},
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OPTvolume = {},
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||||
OPTnumber = {},
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OPTseries = {unix/linux},
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||||
OPTaddress = {},
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||||
OPTedition = {},
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||||
OPTmonth = {},
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OPTnote = {},
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||||
OPTannote = {},
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||||
OPTurl = {www.oreilly.com},
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||||
OPTdoi = {},
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||||
OPTissn = {},
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OPTlocalfile = {},
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||||
OPTabstract = {}
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||||
};
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@Book{sedawk,
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author = {Dale Dougherty, Arnold Robbins},
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title = {Sed and Awk},
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publisher = {O'Reilly ISBN 1-56592-225-5},
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year = {1997},
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||||
OPTkey = {ISBN 1-56592-225-5},
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||||
OPTvolume = {},
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||||
OPTnumber = {},
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||||
OPTseries = {unix/linux},
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||||
OPTaddress = {},
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||||
OPTedition = {},
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||||
OPTmonth = {},
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OPTnote = {},
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||||
OPTannote = {},
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||||
OPTurl = {www.oreilly.com},
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OPTdoi = {},
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||||
OPTissn = {},
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||||
OPTlocalfile = {},
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||||
OPTabstract = {}
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||||
};
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||||
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@Book{bels,
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author = {Karim Yaghmour},
|
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title = {Building Embedded LINUX systems},
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publisher = {O'Reilly ISBN ISBN 0-596-00222-X},
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year = {2003},
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OPTkey = {ISBN 0-596-00222-X},
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OPTvolume = {},
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||||
OPTnumber = {},
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||||
OPTseries = {linux},
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||||
OPTaddress = {},
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OPTedition = {3rd},
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OPTmonth = {},
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OPTnote = {},
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OPTannote = {},
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OPTurl = {www.oreilly.com},
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OPTdoi = {},
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OPTissn = {},
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OPTlocalfile = {},
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OPTabstract = {}
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};
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@Book{can,
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author = {Olaf Pfeiffer},
|
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ALTeditor = {Andrew Ayre},
|
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ALTeditor = {Christian Keydel},
|
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title = {Embedded networking with CAN and CANopen},
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publisher = {RTC ISBN 0-929392-78-7},
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year = {2003},
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OPTkey = { },
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OPTvolume = {},
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||||
OPTnumber = {},
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OPTseries = {Embedded Systems},
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||||
OPTaddress = {},
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OPTedition = {1st},
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OPTmonth = {},
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OPTnote = {},
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OPTannote = {},
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OPTurl = {www.rtcbooks.com},
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OPTdoi = {},
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OPTissn = {},
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OPTlocalfile = {},
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OPTabstract = {}
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};
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@Article{article,
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author = {dd},
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title = {dd},
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journal = {dd},
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year = {2008},
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OPTkey = {},
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OPTvolume = {},
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OPTnumber = {},
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OPTpages = {1,2},
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OPTmonth = {JAN},
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OPTnote = {},
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OPTannote = {},
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OPTurl = {},
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OPTdoi = {},
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OPTissn = {},
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OPTlocalfile = {},
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OPTabstract = {}
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||||
};
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@Book{sqlite,
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author = {Micheal Owens},
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||||
title = {The definitive guide to SQLite},
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publisher = {Apres ISBN 1-59059-673-0},
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year = {2006},
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||||
OPTkey = {},
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||||
OPTvolume = {},
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||||
OPTnumber = {},
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||||
OPTseries = {Databases/SQLite},
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||||
OPTaddress = {},
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||||
OPTedition = {},
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||||
OPTmonth = {},
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||||
OPTnote = {},
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||||
OPTannote = {},
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||||
OPTurl = {},
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||||
OPTdoi = {},
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||||
OPTissn = {},
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||||
OPTlocalfile = {},
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||||
OPTabstract = {}
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||||
};
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2
survey/papaer.tex
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2
survey/papaer.tex
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@ -0,0 +1,2 @@
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:e paper.tex
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53
survey/paper.aux
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53
survey/paper.aux
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@ -0,0 +1,53 @@
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\relax
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\citation{aoe}
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\@writefile{lof}{\contentsline {figure}{\numberline {1}{\ignorespaces PT100 four wire circuit}}{1}}
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\newlabel{fig:pt100}{{1}{1}}
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\@writefile{toc}{\contentsline {section}{\numberline {1}Overview of PT100 four wire circuit}{1}}
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\@writefile{toc}{\contentsline {subsection}{\numberline {1.1}Accuracy despite variable \\ resistance in cables}{1}}
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\citation{eurothermtables}
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\citation{mil1991}
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\citation{mil1991}
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\@writefile{lof}{\contentsline {figure}{\numberline {2}{\ignorespaces PT100 expected voltage ranges}}{2}}
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\newlabel{fig:pt100vrange}{{2}{2}}
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\@writefile{toc}{\contentsline {subsection}{\numberline {1.2}Calculating Temperature from \\ the sense line voltages}{2}}
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\@writefile{toc}{\contentsline {section}{\numberline {2}Safety case for 4 wire circuit}{2}}
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||||
\citation{aoe}
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||||
\citation{eurothermtables}
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\citation{eurothermtables}
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||||
\@writefile{toc}{\contentsline {subsection}{\numberline {2.1}Single Fault FMEA Analysis \\ of PT100 Four wire circuit}{3}}
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\newlabel{fmea}{{2.1}{3}}
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\@writefile{lot}{\contentsline {table}{\numberline {1}{\ignorespaces PT100 FMEA Single Faults}}{3}}
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\newlabel{ptfmea}{{1}{3}}
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\@writefile{toc}{\contentsline {subsection}{\numberline {2.2}Range and PT100 Calculations}{3}}
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||||
\newlabel{pt100temp}{{2.2}{3}}
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||||
\@writefile{lot}{\contentsline {table}{\numberline {2}{\ignorespaces PT100 Maximum and Minimum Values}}{4}}
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||||
\newlabel{ptbounds}{{2}{4}}
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||||
\@writefile{toc}{\contentsline {section}{\numberline {3}Single Fault FMEA Analysis \\ of PT100 Four wire circuit}{4}}
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||||
\@writefile{toc}{\contentsline {subsection}{\numberline {3.1}Single Fault Modes as PLD}{4}}
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||||
\@writefile{lof}{\contentsline {figure}{\numberline {3}{\ignorespaces PT100 Component Failure Modes}}{4}}
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||||
\newlabel{fig:pt100_tc}{{3}{4}}
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\@writefile{lof}{\contentsline {figure}{\numberline {4}{\ignorespaces Voltage Divider}}{5}}
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\newlabel{fig:vd}{{4}{5}}
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\newlabel{eqn:vd}{{1}{5}}
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\@writefile{toc}{\contentsline {subsection}{\numberline {3.2}Proof of Out of Range \\ Values for Failures}{5}}
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||||
\newlabel{pt110range}{{3.2}{5}}
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||||
\@writefile{toc}{\contentsline {subsubsection}{\numberline {3.2.1} TC1 : Voltages $R_1$ SHORT }{5}}
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\@writefile{toc}{\contentsline {subsubsection}{\numberline {3.2.2} TC2 : Voltages $R_1$ OPEN }{5}}
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\@writefile{toc}{\contentsline {subsubsection}{\numberline {3.2.3} TC 3 : Voltages $R_2$ SHORT }{5}}
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\@writefile{toc}{\contentsline {subsubsection}{\numberline {3.2.4} TC : 4 Voltages $R_2$ OPEN }{6}}
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\@writefile{toc}{\contentsline {subsubsection}{\numberline {3.2.5} TC 5 : Voltages $R_3$ SHORT }{6}}
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\@writefile{toc}{\contentsline {subsubsection}{\numberline {3.2.6} TC 6 : Voltages $R_3$ OPEN }{6}}
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\@writefile{toc}{\contentsline {subsection}{\numberline {3.3}Summary of Analysis}{6}}
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\@writefile{lof}{\contentsline {figure}{\numberline {5}{\ignorespaces PT100 Component Failure Modes}}{7}}
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||||
\newlabel{fig:pt100_tc_sp}{{5}{7}}
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\@writefile{lof}{\contentsline {figure}{\numberline {6}{\ignorespaces PT100 Circuit Failure Modes : From Single Faults Analysis}}{7}}
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||||
\newlabel{fig:pt100_singlef}{{6}{7}}
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||||
\citation{mil1991}
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||||
\@writefile{toc}{\contentsline {subsection}{\numberline {3.4}Mean Time to Failure}{8}}
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||||
\@writefile{lot}{\contentsline {table}{\numberline {3}{\ignorespaces PT100 FMEA Single // Fault Statistics}}{8}}
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\newlabel{tab:stat_single}{{3}{8}}
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\@writefile{lof}{\contentsline {figure}{\numberline {7}{\ignorespaces Probablistic Fault Tree : PT100 Single Faults}}{8}}
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\newlabel{fig:stat_single}{{7}{8}}
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\bibstyle{plain}
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||||
\bibdata{vmgbibliography,mybib}
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||||
\@writefile{toc}{\contentsline {section}{\numberline {4} PT100 Double Simultaneous \\ Fault Analysis}{10}}
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||||
BIN
survey/paper.pdf
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BIN
survey/paper.pdf
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survey/paper.tex
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\documentclass[a4paper,10pt]{article}
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\usepackage{graphicx}
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\usepackage{fancyhdr}
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\usepackage{tikz}
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\usepackage{amsfonts,amsmath,amsthm}
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\input{../style}
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|
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%\newtheorem{definition}{Definition:}
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\begin{document}
|
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\pagestyle{fancy}
|
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|
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\outerhead{{\small\bf Survey of Safety Critical Static Analysis Methods}}
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%\innerfoot{{\small\bf R.P. Clark } }
|
||||
% numbers at outer edges
|
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\pagenumbering{arabic} % Arabic page numbers hereafter
|
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\author{R.P.Clark}
|
||||
\title{Survey of Safety Critical Static Analysis Methods}
|
||||
\maketitle
|
||||
\input{survey_paper}
|
||||
|
||||
\bibliographystyle{plain}
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\bibliography{vmgbibliography,mybib}
|
||||
|
||||
\today
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||||
\end{document}
|
||||
58
survey/survey.tex
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|
||||
%
|
||||
% Make the revision and doc number macro's then they are defined in one place
|
||||
|
||||
\begin{abstract}
|
||||
|
||||
\end{abstract}
|
||||
|
||||
\section{FMEA}
|
||||
|
||||
Two meanings, a general one Fault Mode Effects Analysis, meaning general statics diagnosis of a design, looking
|
||||
at faults that can occur and their effect.
|
||||
|
||||
|
||||
\subsection{Manufacturing Cost Reduction FMEA}
|
||||
|
||||
Second a methodology for reducing cost in manufacturing by taking fauls, their frequency
|
||||
and their cost, multiplying these together, and then coming up with a priority list
|
||||
for fixing knmown faults.
|
||||
"The basics of FMEA by Robin E. McDermott et all"
|
||||
ISBN 0-527-76320-9.
|
||||
|
||||
|
||||
\subsection{Deterministic FMEA}
|
||||
|
||||
EN298 no two individual component failures may give rise to a dangerous condition.
|
||||
|
||||
\section{FMEAD Failure effect Mode Dangerous}
|
||||
|
||||
This is a probablistic based methodology.
|
||||
|
||||
\subsection{Safe Failure Fraction}
|
||||
|
||||
Introduce the idea of coverage.
|
||||
A good example is RAM in a microprocessor/microcontroller, we cann ot give 100i\% coverage to it.
|
||||
We can perform some tests that give us 60\% coverage etc
|
||||
|
||||
\subsection{Diagnostic interval}
|
||||
|
||||
Reducing FIT with detecting a fraction of the faults within an interval. Give formulas etc
|
||||
|
||||
|
||||
\subsection{Redundancy - Models}
|
||||
|
||||
1oo1 2oo3 etc
|
||||
|
||||
\subsection{Field Data}
|
||||
|
||||
OK for EN61508, not OK for nuclear industry find refs.
|
||||
|
||||
|
||||
\section {FTA}
|
||||
|
||||
Fault tree Analysis
|
||||
Show how it works, top down,
|
||||
% read exita doc and ref it
|
||||
|
||||
% typeset in {\Huge \LaTeX} \today
|
||||
|
||||
Loading…
Reference in New Issue
Block a user