Fault Scenario now, not test~case
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@ -10,6 +10,8 @@
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\usepackage{lastpage}
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\usetikzlibrary{shapes,snakes}
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\newcommand{\tickYES}{\checkmark}
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\newcommand{\fc}{\em fault scenario}
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\newcommand{\fcs}{\em fault scenarios}
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\date{}
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%\newboolean{paper}
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@ -346,7 +348,8 @@ In the proposed methodology components are collected into functional groups
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and each component failure (and optionally combinations) are considered in the
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context of the {\fg}.
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%
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The component failures (and optional combinations) are termed `test~cases'. For each test~case
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The component failures (and optional combinations) are termed {\fcs}. %`test~cases'.
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For each {\fc}
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there will be a corresponding resultant failure, or `symptom', from the perspective of the {\fg}.
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%
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% MAYBE NEED TO DESCRIBE WHAT A SYMPTOM IS HERE
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@ -360,7 +363,7 @@ from the perspective of a {\fg}.
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%
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A common symptom collection stage is now applied. Here common symptoms are collected
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from the results of the test~cases. Because optional combinations of failures are possible,
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from the results of the {\fcs}. Because optional combinations of failures are possible,
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multiple failures can be modelled, satisfying criterion 6.
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%
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With a collection of the {\fg} failure symptoms, we can create a {\dc}.
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@ -370,7 +373,7 @@ modules available for re-use.
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By using {\dcs} in higher level functional groups, a hierarchy can be built representing
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the failure mode behaviour of a system. Because the hierarchy maintains information
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linking the symptoms to test~cases to component failure modes, we have traceable
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linking the symptoms to {\fcs} to component failure modes, we have traceable
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reasoning connections from base component failures to top level failures.
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The traceability should satisfy criterion 5.
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@ -558,14 +561,14 @@ and determine how they affect the operation of the potential divider.
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\ifthenelse {\boolean{pld}}
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{
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Each labelled asterisk in the diagram represents a failure mode scenario.
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The failure mode scenarios are given test case numbers, and an example to clarify this follows
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The failure mode scenarios are given {\fc} numbers, and an example to clarify this follows
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in table~\ref{pdfmea}.
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\begin{figure}[h+]
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\centering
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\includegraphics[width=200pt,keepaspectratio=true]{./noninvopamp/fg1a.png}
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% fg1a.jpg: 430x271 pixel, 72dpi, 15.17x9.56 cm, bb=0 0 430 271
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\caption{potential divider with test cases}
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\caption{potential divider with {\fcs}}
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\label{fig:fg1a}
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\end{figure}
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}
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@ -577,8 +580,8 @@ in table~\ref{pdfmea}.
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{
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For this example we can look at single failure modes only.
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For each failure mode in our {\fg} `potential~divider'
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we can assign a test case number (see table \ref{pdfmea}).
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Each test case is analysed to determine the `symptom'
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we can assign a {\fc} number (see table \ref{pdfmea}).
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Each {\fc} is analysed to determine the `symptom'
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on the potential dividers' operation. For instance
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were the resistor $R_1$ to go open, the circuit would not be grounded and the
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voltage output from it would float high (+ve).
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@ -644,15 +647,15 @@ This is represented in the DAG in figure \ref{fig:fg2adag}.
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\centering % used for centering table
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\begin{tabular}{||l|c|c|l||}
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\hline \hline
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\textbf{Test} & \textbf{Pot.Div} & \textbf{Symptom} \\
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\textbf{Case} & \textbf{Effect} & \textbf{Description} \\
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\textbf{Fault} & \textbf{Pot.Div} & \textbf{Symptom} \\
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\textbf{Scenario} & \textbf{Effect} & \textbf{Description} \\
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% R & wire & res + & res - & description
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\hline
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\hline
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TC1: $R_1$ SHORT & LOW & LowPD \\
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TC2: $R_1$ OPEN & HIGH & HighPD \\ \hline
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TC3: $R_2$ SHORT & HIGH & HighPD \\
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TC4: $R_2$ OPEN & LOW & LowPD \\ \hline
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FS1: $R_1$ SHORT & LOW & LowPD \\
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FS2: $R_1$ OPEN & HIGH & HighPD \\ \hline
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FS3: $R_2$ SHORT & HIGH & HighPD \\
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FS4: $R_2$ OPEN & LOW & LowPD \\ \hline
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\hline
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\end{tabular}
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\label{pdfmea}
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@ -665,7 +668,7 @@ We can now collect the symptoms of failure. From the four base component failure
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have two symptoms, where the potential divider will give an incorrect low voltage (which we can term $LowPD$)
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or an incorrect high voltage (which we can term $HighPD$).
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We can represent the collection of these symptoms by drawing connecting lines between
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the test cases and naming them (see figure \ref{fig:fg1b}).
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the {\fcs} and naming them (see figure \ref{fig:fg1b}).
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\begin{figure}[h+]
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\centering
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\includegraphics[width=200pt,keepaspectratio=true]{./noninvopamp/fg1b.png}
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@ -805,15 +808,15 @@ from the potential divider {\dc}, represented by figure~\ref{fig:fgamp}.
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\label{fig:fgamp}
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\end{figure}
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We can now place test cases on this (note this analysis considers single failure modes only
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where we want to model multiple failures, we can over lap contours, and place the test cases in overlapping
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We can now place {\fcs} on this (note this analysis considers single failure modes only
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where we want to model multiple failures, we can over lap contours, and place the {\fcs} in overlapping
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regions) see figure~\ref{fig:fgampa}.
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\begin{figure}[h+]
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\centering
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\includegraphics[width=200pt,keepaspectratio=true]{./noninvopamp/fgampa.png}
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% fgampa.jpg: 430x330 pixel, 72dpi, 15.17x11.64 cm, bb=0 0 430 330 hno
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\caption{Amplifier Functional Group with Test Cases}
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\caption{Amplifier Functional Group with {\fcs}}
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\label{fig:fgampa}
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\end{figure}
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}
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@ -824,7 +827,7 @@ regions) see figure~\ref{fig:fgampa}.
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{
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We can now create a {\fg} for the non-inverting amplifier
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by bringing together the failure modes from \textbf{opamp} and \textbf{PD}.
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Each of these failure modes will be given a test case for analysis,
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Each of these failure modes will be given a {\fc} for analysis,
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and this is represented in table \ref{ampfmea}.
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}
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@ -838,27 +841,27 @@ and this is represented in table \ref{ampfmea}.
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\centering % used for centering table
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\begin{tabular}{||l|c|c|l||}
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\hline \hline
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\textbf{Test} & \textbf{Amplifier} & \textbf{Symptom} \\
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\textbf{Case} & \textbf{Effect} & \textbf{Description} \\
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\textbf{Fault} & \textbf{Amplifier} & \textbf{Symptom} \\
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\textbf{Scenario} & \textbf{Effect} & \textbf{Description} \\
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% R & wire & res + & res - & description
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\hline
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\hline
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TC1: $OPAMP$ & Output & AMPHigh \\
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FS1: $OPAMP$ & Output & AMPHigh \\
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LatchUP & High & \\ \hline
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TC2: $OPAMP$ & Output Low& AMPLow \\
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FS2: $OPAMP$ & Output Low& AMPLow \\
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LatchDown & Low gain & \\ \hline
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TC3: $OPAMP$ & Output Low & AMPLow \\
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FS3: $OPAMP$ & Output Low & AMPLow \\
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No Operation & & \\ \hline
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TC4: $OPAMP$ & Low pass & LowPass \\
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FS4: $OPAMP$ & Low pass & LowPass \\
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Low Slew & filtering & \\ \hline
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TC5: $PD$ & Output High & AMPHigh \\
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FS5: $PD$ & Output High & AMPHigh \\
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LowPD & & \\ \hline
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TC6: $PD$ & Output Low & AMPLow \\
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FS6: $PD$ & Output Low & AMPLow \\
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HighPD & Low Gain & \\ \hline
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%TC7: $R_2$ OPEN & LOW & & LowPD \\ \hline
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\hline
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@ -868,8 +871,7 @@ and this is represented in table \ref{ampfmea}.
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}
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Let us consider, for the sake of example, that the voltage follower (very low gain of 1.0)
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amplification chracteristics from
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TC2 and TC6 can be considered as low output from the OPAMP for the application
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amplification chracteristics from FS2 and FS6 can be considered as low output from the OPAMP for the application
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in hand (say milli-volt signal amplification).
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For this amplifier configuration we have three failure modes, $AMPHigh, AMPLow, LowPass$.%see figure~\ref{fig:fgampb}.
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@ -1180,7 +1182,8 @@ This is because the multiple failure modes are considered
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within {\fgs} which have fewer failure modes to consider
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at each FMMD stage.
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Where appropriate, multiple simultaneous failures can be modelled by
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introducing test~cases where the conjunction of failure modes is considered.
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introducing {\fc} %test~cases
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where the conjunction of failure modes is considered.
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\end{itemize}
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}
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@ -1232,7 +1235,7 @@ It can therefore be used to analyse systems comprised of electrical,
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mechanical and software elements in one integrated model.
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Furthermore the reasoning path is traceable. By being able to trace a
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top level event down through derived components, to base component
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failure modes, with each step annotated as test cases, the model is easier to maintain.
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failure modes, with each step annotated as {\fcs}, the model is easier to maintain.
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%\today
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%
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