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@ -80,27 +80,30 @@ It has a common notation for mechanical, electronic and software domains and is
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These properties provide advantages in rigour and efficiency when compared to current methodologies.
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}
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\section{Introduction}
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This paper describes and criticises the four current failure mode methodologies,
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discusses their advantages and deficiencies and defines a desirable criteria list
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for an ideal static failure mode methodology.
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\paragraph{Introduction}
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{
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This paper describes and appraises four current failure mode methodologies.
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Their advantages and deficiencies are discussed and a desirable criteria list
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for an `ideal' static failure mode methodology is developed.
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A new proposed
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methodology is then described and discussed. A worked example is then provided, which models the failure mode
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behaviour of a non inverting op-amp.
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Using the worked example the new methodology is evaluated.
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methodology is then described.% and discussed.
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A worked example is then presented, using the new methodology, which models the failure mode
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behaviour of a non inverting op-amp circuit.
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Using the worked example the new methodology is evaluated.
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Finally the desirable criteria list is presented as a check box table alongside
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the four current methodologies.
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}
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\paragraph{Current methodologies}
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We briefly analyse the four current methodologies.
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We briefly analyse four current methodologies.
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Comprehensive overviews of these methodologies maybe found
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in ~\cite{safeware,sccs}.
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\paragraph{Fault Tree Analysis (FTA)}
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FTA~\cite{nucfta,nasafta} is a top down methodology in which a hierarchical diagram is drawn for
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each undesirable top level failure, presenting the conditions that must arise to cause
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each undesirable top level failure/event, presenting the conditions that must arise to cause
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the event.
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%
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It is suitable for large complicated systems with few undesirable top
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@ -117,18 +120,19 @@ and there is no facility to cross check between diagrams. It has limited
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support for environmental and operational states.
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\paragraph{Fault Mode Effects Analysis FMEA)} is used principally in manufacturing.
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\paragraph{Fault Mode Effects Analysis (FMEA)} is used principally to determine system reliability.
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It is bottom up and starts with component failure modes, which
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lead to top level failure/events.
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Each top level failure is assessed by its cost to repair and its estimated frequency.%, using a
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Each top level failure is assessed by its cost to repair (or perceived criticality) and its estimated frequency. %, using a
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%failure mode ratio.
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A list of failures according to their cost to repair~\cite{bfmea}, or effect on system reliability is then calculated.
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It is easy to identify single component failure to system failure scenarios
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and an estimate of product reliability can be calculated.
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%This can be viewed as a prioritised `to~fix' list.
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%
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It cannot focus on
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It cannot focus on complex
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component interactions that cause system failure modes or determine potential
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problems from simultaneous failure modes. It does not consider environmental
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problems from simultaneous failure modes. It does not consider changing environmental
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or operational states in sub-systems or components. It cannot model
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self-checking safety elements or other in-built safety features or
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analyse how particular components may fail.
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@ -309,9 +313,11 @@ for its results, such as error causation trees.%, reliability and safety statis
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\section{The proposed Methodology}
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\label{fmmdproc}
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Any new static failure mode methodology must ensure that it
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represents all component failure modes and it therefore should be bottom-up,
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starting with individual component failure modes.
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% Any new static failure mode methodology must ensure that it
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% represents all component failure modes and it therefore should be bottom-up,
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% starting with individual component failure modes.
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To ensure all component failure modes are represented the new methodology must be bottom-up.
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%
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This seems essential to satisfy criteria 2.
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The proposed methodology is therefore a bottom-up process
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starting with base~components.
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@ -321,7 +327,7 @@ mechanical, electronic or software components,
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criteria 3 is satisfied.
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%
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In order to address the state explosion problem, the process must be modular
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and deal with small groups of components at a time, should address criteria 1.
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and deal with small groups of components at a time, this should address criteria 1.
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In the proposed methodology components are collected into functional groups
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and each component failure mode (and optionally combinations) are considered in the
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context of the {\fg}.
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@ -332,11 +338,11 @@ there will be a corresponding resultant failure, from the perspective of the {\f
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% MAYBE NEED TO DESCRIBE WHAT A SYMPTOM IS HERE
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%
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From the perspective of the {\fg} failures of components will be symptoms.
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It is proposed that many symptoms will be common. That is to say
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It is conjectured that many symptoms will be common. That is to say
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that component failure modes, will often cause the same symptoms of failure
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from the perspective of a {\fg}.
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%
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A common symptom collection stage is then applied. Here common symptoms are collected
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A common symptom collection stage is now applied. Here common symptoms are collected
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from the results of the test~cases. Because optional combinations of failures are possible,
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multiple failures can be modelled, satisfying criteria 6.
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%
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@ -477,9 +483,9 @@ in the potential divider, shown in figure \ref{fig:fg1}.
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\ifthenelse {\boolean{dag}}
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{
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Modelling this as a functional group, we can draw this as a directed graph
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failure modes, taken from the components R1 and R2,
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in the potential divider, shown in figure \ref{fig:fg1dag}.
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Modelling this as a functional group, we can draw a directed graph
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of failure modes, starting from the components R1 and R2,
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in the potential divider, as shown in figure \ref{fig:fg1dag}.
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\begin{figure}
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\centering
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\begin{tikzpicture}[shorten >=1pt,->,draw=black!50, node distance=\layersep]
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@ -525,7 +531,7 @@ in the potential divider, shown in figure \ref{fig:fg1dag}.
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{
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}
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We can now look at each of these base component failure modes,
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We shall now look at each of these base component failure modes,
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and determine how they will affect the operation of the potential divider.
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%Each failure mode scenario we look at will be given a test case number,
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%which is represented on the diagram, with an asterisk marking
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@ -559,7 +565,7 @@ on the potential dividers' operation. For instance
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were the resistor $R_1$ to go open, the circuit would not be grounded and the
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voltage output from it would be high (+ve).
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This would mean the symptom of the failed potential divider, would be that it
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gives an output high voltage reading.%We can now consider the {\fg}
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gives a high voltage output.%We can now consider the {\fg}
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%as a component in its own right, and its symptoms as its failure modes.
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From table \ref{pdfmea} we can see that resistor
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@ -672,8 +678,8 @@ We can use the symbol $\bowtie$ to represent taking the analysed
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\ifthenelse {\boolean{dag}}
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{
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We can now represent the potential divider as a {\dc}.
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Because we have its symptoms or failure mode behaviour,
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we can treat these as the failure modes of a a new {\dc}.
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Because we have its symptoms (or failure mode behaviour),
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we can treat these as the failure modes of a new {\dc}.
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We can represent this as a DAG (see figure \ref{fig:dc1dag}).
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\begin{figure}[h+]
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@ -700,8 +706,10 @@ We can represent this as a DAG (see figure \ref{fig:dc1dag}).
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}
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Because the derived component is defined by its failure modes and
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the functional group used to derive it, we can use it
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The derived component is defined by its failure modes and
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the functional group used to derive it.
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%We can consider this an an orthogonal WHAT???? Group ???? Collection ????
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We now have a {\dc} model for a generic potential divider, and can use it
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as a building block for other {\fgs} in the same way as we used the base components $R1$ and $R2$.
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%\clearpage
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@ -765,9 +773,9 @@ We can represent these failure modes on a DAG (see figure~\ref{fig:op1dag}).
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%\clearpage
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\paragraph{Modelling the OP amp with the potential divider.}
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We can now consider bringing the OP amp and the potential divider components to
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form a {\fg} to represent the non inverting amplifier. We have the failure modes of the {\fg} for the potential divider,
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so we do not need to go back and consider the individual resistor failure modes that define its behaviour.
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We can now consider merging the OP amp and the potential divider, to
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form a {\fg} to represent the non inverting amplifier. We have the failure modes of the {\dc} for the potential divider,
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so we do not need to go back and consider the individual resistor failure modes that defined its behaviour.
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\ifthenelse {\boolean{pld}}
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{
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We can make a new functional group to represent the amplifier, by bringing the component \textbf{opamp}
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@ -1078,9 +1086,9 @@ base component failures from eight to three failure symptoms.
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%
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In general,
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because symptoms are collected, we can state
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the the number of failure symptoms for a {\fg} will be less then or equal to the number
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the the number of failure symptoms for a {\fg} will be less than or equal to the number
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of component failures. In practise the number of symptoms is usually around half the
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number of component failure modes, at each stage of FMMD analysis.
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number of component failure modes, for each stage of FMMD analysis.
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@ -1127,9 +1135,9 @@ This allows causation trees \cite{sccs} or, minimal cut sets~\cite{nasafta}[Ch.1
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to be determined by traversing the DAG from top level events down to their causes.
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\item{ It should be capable of producing reliability and danger evaluation statistics.}
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The minimal cuts sets for the SYSTEM level failures can have computed MTTF
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and danger evaluation statistics sourced from the component failure mode statistics~\cite{fmd91,mil1991}.
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% \item{ It should be capable of producing reliability and danger evaluation statistics.}
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% The minimal cuts sets for the SYSTEM level failures can have computed MTTF
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% and danger evaluation statistics sourced from the component failure mode statistics~\cite{fmd91,mil1991}.
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% \item{ It should be easy to use, ideally
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% using a graphical syntax (as opposed to a formal mathematical one).}
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@ -1174,7 +1182,9 @@ FMMD is based on generic failure modes, so it is not constrained to a
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particular field. It can be applied to mechanical, electrical or software domains.
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It can therefore be used to analyse systems comprised of electrical,
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mechanical and software elements in one integrated model.
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Furthermore the reasoning path is traceable. By being able to trace a
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top level event down through derived components, to base component
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failure modes, with each step annotated as test cases, the model is easier to maintain.
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{ %\tiny
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\begin{table}[ht]
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