Found changes when merging

This commit is contained in:
Robin Clark 2011-01-08 10:01:53 +00:00
parent ec6f388a31
commit b27de8cb34
2 changed files with 5 additions and 4 deletions

View File

@ -1245,3 +1245,5 @@ using a common notation.
The author believes it addresses many short comings in current static failure mode analysis methodologies.
\vspace{60pt}
\today
%% $$\frac{-b\pm\sqrt{ {b^2-4ac}}}{2a}$$

View File

@ -517,7 +517,7 @@ The meanings of and values assigned to its co-efficients are described in table
\end{equation}
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
% Low SIL assessment MAX3053
% SIL assessment 8 PIN GENERAL OP-AMP
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
\begin{table}[ht]
@ -527,7 +527,7 @@ The meanings of and values assigned to its co-efficients are described in table
\hline \hline
\em{Parameter} & \em{Value} & \em{Comments} \\
& & \\ \hline \hline
$C_1$ & 0.040 & $300 \ge 1000$ 1001 BiCMOS transistors (1214) \\ \hline
$C_1$ & 0.040 & $300 \ge 1000$ BiCMOS transistors \\ \hline
${\pi}_T$ & 1.4 & max temp of $60^o$ C\\ \hline
$C_2$ & 0.0026 & number of functional pins(8) \\ \hline
${\pi}_E$ & 2.0 & ground fixed environment (not benign)\\ \hline
@ -540,7 +540,6 @@ The meanings of and values assigned to its co-efficients are described in table
\end{table}
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
% END OF Low SIL assessment MAX3053
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
Taking these parameters and applying equation \ref{microcircuitfit},
@ -552,7 +551,7 @@ failures per Billion (${10}^9$) hours of operation} of 1.
\subsection{Switching Transistor}
The switching transistor will be operating at a low frequency
and well within 50\% of it maximum voltage.
and well within 50\% of its maximum voltage.
MIL-HDBK-217F\cite{mil1992}[6-25] gives an exmaple
transistor in these environmental conditions, and assigns an FIT value of 11.