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@ -1245,3 +1245,5 @@ using a common notation.
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The author believes it addresses many short comings in current static failure mode analysis methodologies.
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\vspace{60pt}
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\today
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%% $$\frac{-b\pm\sqrt{ {b^2-4ac}}}{2a}$$
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@ -517,7 +517,7 @@ The meanings of and values assigned to its co-efficients are described in table
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\end{equation}
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%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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% Low SIL assessment MAX3053
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% SIL assessment 8 PIN GENERAL OP-AMP
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%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\begin{table}[ht]
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@ -527,7 +527,7 @@ The meanings of and values assigned to its co-efficients are described in table
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\hline \hline
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\em{Parameter} & \em{Value} & \em{Comments} \\
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& & \\ \hline \hline
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$C_1$ & 0.040 & $300 \ge 1000$ 1001 BiCMOS transistors (1214) \\ \hline
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$C_1$ & 0.040 & $300 \ge 1000$ BiCMOS transistors \\ \hline
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${\pi}_T$ & 1.4 & max temp of $60^o$ C\\ \hline
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$C_2$ & 0.0026 & number of functional pins(8) \\ \hline
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${\pi}_E$ & 2.0 & ground fixed environment (not benign)\\ \hline
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@ -540,7 +540,6 @@ The meanings of and values assigned to its co-efficients are described in table
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\end{table}
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%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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% END OF Low SIL assessment MAX3053
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%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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Taking these parameters and applying equation \ref{microcircuitfit},
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@ -552,7 +551,7 @@ failures per Billion (${10}^9$) hours of operation} of 1.
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\subsection{Switching Transistor}
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The switching transistor will be operating at a low frequency
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and well within 50\% of it maximum voltage.
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and well within 50\% of its maximum voltage.
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MIL-HDBK-217F\cite{mil1992}[6-25] gives an exmaple
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transistor in these environmental conditions, and assigns an FIT value of 11.
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