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Robin Clark 2011-01-08 10:01:53 +00:00
parent ec6f388a31
commit b27de8cb34
2 changed files with 5 additions and 4 deletions
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fmmd_concept/fmmd_concept.tex
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@ -1245,3 +1245,5 @@ using a common notation.
The author believes it addresses many short comings in current static failure mode analysis methodologies. The author believes it addresses many short comings in current static failure mode analysis methodologies.
\vspace{60pt} \vspace{60pt}
\today \today
%% $$\frac{-b\pm\sqrt{ {b^2-4ac}}}{2a}$$

7
fmmd_design_aide/fmmd_design_aide.tex
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@ -517,7 +517,7 @@ The meanings of and values assigned to its co-efficients are described in table
\end{equation} \end{equation}
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%% %%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
% Low SIL assessment MAX3053 % SIL assessment 8 PIN GENERAL OP-AMP
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%% %%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
\begin{table}[ht] \begin{table}[ht]
@ -527,7 +527,7 @@ The meanings of and values assigned to its co-efficients are described in table
\hline \hline \hline \hline
\em{Parameter} & \em{Value} & \em{Comments} \\ \em{Parameter} & \em{Value} & \em{Comments} \\
& & \\ \hline \hline & & \\ \hline \hline
$C_1$ & 0.040 & $300 \ge 1000$ 1001 BiCMOS transistors (1214) \\ \hline $C_1$ & 0.040 & $300 \ge 1000$ BiCMOS transistors \\ \hline
${\pi}_T$ & 1.4 & max temp of $60^o$ C\\ \hline ${\pi}_T$ & 1.4 & max temp of $60^o$ C\\ \hline
$C_2$ & 0.0026 & number of functional pins(8) \\ \hline $C_2$ & 0.0026 & number of functional pins(8) \\ \hline
${\pi}_E$ & 2.0 & ground fixed environment (not benign)\\ \hline ${\pi}_E$ & 2.0 & ground fixed environment (not benign)\\ \hline
@ -540,7 +540,6 @@ The meanings of and values assigned to its co-efficients are described in table
\end{table} \end{table}
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%% %%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
% END OF Low SIL assessment MAX3053
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%% %%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
Taking these parameters and applying equation \ref{microcircuitfit}, Taking these parameters and applying equation \ref{microcircuitfit},
@ -552,7 +551,7 @@ failures per Billion (${10}^9$) hours of operation} of 1.
\subsection{Switching Transistor} \subsection{Switching Transistor}
The switching transistor will be operating at a low frequency The switching transistor will be operating at a low frequency
and well within 50\% of it maximum voltage. and well within 50\% of its maximum voltage.
MIL-HDBK-217F\cite{mil1992}[6-25] gives an exmaple MIL-HDBK-217F\cite{mil1992}[6-25] gives an exmaple
transistor in these environmental conditions, and assigns an FIT value of 11. transistor in these environmental conditions, and assigns an FIT value of 11.