CH8 PR, fran mor tack
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@ -12,16 +12,19 @@ Environment in the context of this study
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means external influences under which the System could be expected to work. % under.
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%
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A typical data sheet for an electrical component will give
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a working temperature range, for instance.
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Mechanical components could be specified for stress and loading limits.
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a working temperature range: %, for instance.
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mechanical components could be specified for stress and loading limits.
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It is unusual to have failure modes described in product literature, although
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for complicated components with firmware errata documents are sometimes produced.
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Systems may have distinct operational states. For instance, a safety critical controller
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may have a LOCKOUT state where it has detected a serious problem and will not continue to operate until
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authorised human intervention takes place.
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A safety critical circuit may have a self test mode which could be operated externally.
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A safety critical circuit may have a self test mode which could be operated externally:
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a micro-processor may have a SLEEP mode etc.
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%
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Operational states and environmental conditions must be factored into the UML model.
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Operational states and environmental conditions can %must
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be factored into the UML model.
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\paragraph{Environmental Modelling.} The external influences/environment could typically be temperature ranges,
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levels of electrical interference, high voltage contamination on supply
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@ -31,7 +34,7 @@ affected by environmental conditions, in this case temperature, is the opto-isol
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which is typically affected at around {60 \oc}. Most electrical components are more robust to temperature variations.}.
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Environmental analysis is thus applicable to components.
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Environmental influences, such as over stress due to voltage
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can be eliminated by down-rating of components as discussed in section~\ref{sec:determine_fms}.
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can be eliminated by down-rating components as discussed in section~\ref{sec:determine_fms}.
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With given environmental constraints, we can therefore eliminate some failure modes from the model.
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@ -52,13 +55,16 @@ When the TEST line is activated, it supplies a test signal
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which will validate the circuit. This circuit will have two operational states,
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NORMAL and TEST mode.
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%
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It seems better to apply the operational states to {\fgs}.
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%
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Functional groupings by definition implement functionality, or purpose, and therefore are the best objects to model
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operational states.% with.
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It seems more appropriate to apply the operational states to {\fgs}
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which %
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%Functional groupings
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by definition implement functionality, or purpose.
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On this basis we associate operational states with {\fgs}.
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%therefore are the best objects to model
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%operational states.% with.
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\paragraph{Inhibit Conditions.}
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A third data class may be required if modelling of inhibit conditions~\cite{nasafta}[p.40] is desired.
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A third data class may be required if modelling inhibit conditions~\cite{nasafta}[p.40] is required. %desired.
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Some failure modes may only be active given specific environmental conditions
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or when other failures are already active.
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To model this, an `inhibit' class has been added.
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@ -99,7 +105,8 @@ EN61508~\cite{en61508} requires that statistical data is available and used for
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analysed in a system assigned a SIL level.
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FMMD, as a bottom up methodology can use component failure mode statistical data, and incorporate it
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into its hierarchical model.
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By way of example the Pt100 example from section~\{sec:pt100} has been used to demonstrate this.
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By way of example, the Pt100 analysis %example
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from section~\{sec:pt100} has been used to demonstrate this.
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\subsection{Pt100 Example: Single Failures and statistical data}. %Mean Time to Failure}
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@ -281,7 +288,7 @@ we can also apply failure rate statistics to double failures.
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%%
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%
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If we consider the failure modes to be statistically independent we can calculate
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the FIT values for all the combinations failures in table~\label{tab:ptfmea2}.
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the FIT values for all the combinations failures in table~\ref{tab:ptfmea2}.
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The failure mode of concern, the undetectable {\textbf{FLOATING}} condition
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requires that resistors $R_1$ and $R_2$ fail. We can multiply the MTTF
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together and find an MTTF for both failing. The FIT value of 12.42 corresponds to
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@ -299,7 +306,7 @@ condition in higher levels of the system.
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The reasons for applying retrospective failure mode analysis could be approving previously un-assessed
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systems to a safety standard, or to determine the failure mode behaviour of an instrument used in
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safety critical verification verification.
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safety critical verification. % verification.
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%
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FMMD can be applied retrospectively to a project, and because of its modular nature, coupled with
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its work flow it
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@ -319,17 +326,23 @@ We can apply retrospective FMMD to electronic and software hybrid systems as wel
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Each function in the software will have to be assigned a `design~contract'~\cite{dbcbe} (where violations of
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contract clauses will be treated as failure modes in FMMD).
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%
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By doing applying contracts and seeing how calling functions deal with
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By %doing
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applying contracts and seeing how calling functions deal with
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the failures in the functions they call, we reveal un-handled the error conditions in
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the software.
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By treating hardware interfaces to software as {\dcs}, we automatically have a list of the failure modes
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of the electronics.
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%
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FMMD models both software and hardware;
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we can thus verify that all
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failure modes from the electronics module, have been dealt
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by the controlling software. If not they are an un-handled error condition.
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That is the hardware interfaces to software in FMMD is a {\dc},
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the failure modes of this {\dc} are the list of all known failure modes
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of the electronics.
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%
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By performing FMMD on a software electronic hybrid system,
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we can reveal design deficiencies.
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we thus reveal design deficiencies.
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%in the hardware/software interface.
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In Safety Integrity Level (SIL)~\cite{en61508} terms by identifying undetectable faults and fixing them, we raise
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In Safety Integrity Level (SIL)~\cite{en61508} terms, by identifying undetectable faults and fixing them, we raise
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the safe failure fraction (SFF).
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