From 9fce93fdceb44bf0369a5c6e304a5283c99599c8 Mon Sep 17 00:00:00 2001
From: Robin <robin@NovaProspect.(none)>
Date: Sat, 27 Mar 2010 04:15:05 +0000
Subject: [PATCH] .

---
 pt100/pt100.tex | 10 ++++++----
 thesis.tex      | 15 +++++++++++----
 2 files changed, 17 insertions(+), 8 deletions(-)

diff --git a/pt100/pt100.tex b/pt100/pt100.tex
index c83ae7a..20feebb 100644
--- a/pt100/pt100.tex
+++ b/pt100/pt100.tex
@@ -362,9 +362,11 @@ The PT100 circuit can now be treated as a component in its own right, and has on
 Using the MIL1991\cite{mil1991} specifications for resistor and thermistor
 failure statistics we calculate the reliability of this circuit.
 MIL1991 gives MTTF for a wide range of common components.
-It does not specify how the components will fail (in this case OPEN or SHORT).
-RIAC does specify that resistors are expevcted to fail OPEN in 90\% of cases and SHORTED 
-in the other 10\%, so we can use this.
+It does not specify how the components will fail (in this case OPEN or SHORT). {Some standards, notably EN298 only consider resistors failing in OPEN mode}.
+FMD-97 Gives 27\% OPEN and 3\% SHORTED, for resistors under certain electrical and environmental stresses. This example 
+compromises and uses a 90:10 ratio, for resistor failure. 
+Thus for this example resistors are expevcted to fail OPEN in 90\% of cases and SHORTED 
+in the other 10\%.
 
 A standard fixed film resistor, for use in a benign environment, non military spec at
 temperatures up to 60\oc is given a probability of 13.8 failures per billion ($10^9$)
@@ -414,7 +416,7 @@ be the fault~mode we would scrutinise first.
 
 \begin{figure}[h+]
  \centering
- \includegraphics[width=400pt,bb=0 0 856 327,keepaspectratio=true]{./stat_single.jpg}
+ \includegraphics[width=400pt,bb=0 0 856 327,keepaspectratio=true]{./pt100/stat_single.jpg}
  % stat_single.jpg: 856x327 pixel, 72dpi, 30.20x11.54 cm, bb=0 0 856 327
  \caption{Probablistic Fault Tree : PT100 Single Faults}
  \label{fig:stat_single}
diff --git a/thesis.tex b/thesis.tex
index 75ac74c..7814fcc 100644
--- a/thesis.tex
+++ b/thesis.tex
@@ -56,15 +56,22 @@
 \chapter{Statistical Methods and Models}
 %\input{statistics/statistics}
 
-\chapter{Survey of Safety Critical Analysis Metyhodologies and Tools Available}
-%\input{survey/survey}
+\chapter{Survey of Safety Critical Analysis Methodologies and Tools Available}
+\input{survey/survey}
+
+
+
+\typeout{ ---------------- Component Failure Modes Definition }
+\chapter { Component Failure Modes Definition}
+\input{component_failure_modes_definition/component_failure_modes_definition} 
+
 
 \typeout{ ---------------- Propositional Logic Diagrams}
 \chapter {Propositional Logic Diagrams}
 \input{logic_diagram/logic_diagram}
 
 \typeout{ ---------------- Electronic Components as PLDs}
-\chapter {Electronic Components as PLDs}
+\chapter {Common Electronic Components as PLDs}
 \input {components_as_plds/components_as_plds}
 
 \typeout{ ----------------  Software as PLDs}
@@ -72,7 +79,7 @@
 \input{sw_as_plds/sw_as_plds}
 
 \typeout{ ----------------  Mechanical Sub-systems as PLDs}
-\chapter {Mechanical Sub-systems as PLDs}
+\chapter {Common Mechanical Sub-systems as PLDs}
 %\input{mech_as_plds/mech_as_plds}