Chapter 5 gone trhough a printout--edit on paper--update
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@ -6,7 +6,7 @@ PNG_DIA = blockdiagramcircuit2.png bubba_oscillator_block_diagram.png circuit1
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pt100_tc.png pt100_tc_sp.png shared_component.png stat_single.png three_tree.png \
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tree_abstraction_levels.png vrange.png sigma_delta_block.png ftcontext.png ct1.png hd.png \
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sigdel1.png sdadc.png bubba_euler_1.png bubba_euler_2.png eulersd.png eulersdfinal.png \
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eulerfivepole.png
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eulerfivepole.png eulerswhw.png
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@ -26,17 +26,17 @@ a variety of typical embedded system components including analogue/digital and e
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%Each example has been chosen to demonstrate
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%FMMD applied to
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%
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The first section
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~\ref{sec:determine_fms} looks at how we determine failure mode sets for {\bcs}
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(in the context of the safety standards
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we are using for our particular project).
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% % The first section
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% % ~\ref{sec:determine_fms} looks at how we determine failure mode sets for {\bcs}
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% % (in the context of the safety standards
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% % we are using for our particular project).
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%
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This is followed by several example FMMD analyses,
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the first analysing a common configuration of
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%This is followed by several example FMMD analyses,
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The first applies FMMD to a common configuration of
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the inverting amplifier (see section~\ref{sec:invamp}) using
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an op-amp and two resistors, which demonstrates how the re-use of the potential divider from section~\ref{subsec:potdiv}.
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The inverting amplifier is analysed again, but this time with different
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{\fgs}. The two approaches, i.e. choice of membership for {\fgs}, are then discussed.
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an op-amp and two resistors; this demonstrates how the re-use of the potential divider from section~\ref{subsec:potdiv}.
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The inverting amplifier is analysed again, but this time with a different
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composition of {\fgs}. The two approaches, i.e. choice of membership for {\fgs}, are then discussed.
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%~\ref{sec:chap4}
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%can be re-used. %, but with provisos.
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%
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@ -44,19 +44,21 @@ The inverting amplifier is analysed again, but this time with different
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%(see section~\ref{sec:diffamp})
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Section~\ref{sec:diffamp} analyses a circuit where two op-amps are used
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to create a differencing amplifier.
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Building on the two approaches section~\ref{sec:invamp}, re-use of the potential divider {\dc}
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Building on the two approaches from section~\ref{sec:invamp}, re-use of the non-inverting amplifier {\dc} from section~\ref{sec:invamp}
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is discussed in the context of this circuit,
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where its re-use is appropriate in the first stage and
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not in the second.
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%
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Section~\ref{sec:fivepolelp} analyses a Sallen-Key based five pole low pass filter.
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This demonstrates FMMD being able to re-use the first Sallen-Key analysis, %encountered as a {\dc}
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thus saving time and effort for the analyst.
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This demonstrates re-use the first Sallen-Key analysis, %encountered as a {\dc}
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increasing test effeciency. %saving time and effort for the analyst.
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%
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Section~\ref{sec:bubba} shows FMMD applied to a circular circuit topology---the `Bubba' oscillator---which uses
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four op-amp stages with supporting components.
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four op-amp stages with supporting components. Two analysis stategies are employed, one using
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initially identified {\fgs} and the second using a more complex hierarchy of {\fgs} and {\dcs}.
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%
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Section~\ref{sec:sigmadelta} shows FMMD analysing the sigma delta analogue to digital converter---again with a circular signal path---but which also operates on both
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Section~\ref{sec:sigmadelta} shows FMMD analysing the sigma delta
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analogue to digital converter---again with a circular signal path---which operates on both
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analogue and digital signals.
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%
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% Moving Pt100 to metrics
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@ -604,11 +606,15 @@ Both approaches are followed in the next two sub-sections.
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\subsection{First Approach: Inverting OPAMP using a Potential Divider {\dc}}
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We cannot simply re-use the $PD$ from section~\ref{subsec:potdiv}---that potential divider would only be valid if the input signal were negative.
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We want if possible to have detectable errors. HIGH and LOW failures are more observable than the more generic failure modes such as `OUTOFRANGE'.
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If we can refine the operational states of the functional group, we can obtain clearer
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symptoms.
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If we consider the input will only be positive, we can invert the potential divider (see table~\ref{tbl:pdneg}).
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We cannot simply re-use the $PD$ from section~\ref{subsec:potdiv}, not simply because
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the potential divider is inverted, but, in addition the
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output feedback forms a current balance with the input signal. %---that potential divider would only be valid if the input signal were negative.
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%We want if possible to have detectable errors.
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%HIGH and LOW failures are more observable than the more generic failure modes such as `OUTOFRANGE'.
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%If we can refine the operational states of the functional group, we can obtain clearer
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%symptoms.
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Were the input to be guaranteed % the input will only be
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positive, we could the potential divider (see table~\ref{tbl:pdneg}).
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\begin{table}[h+]
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\caption{Inverted Potential divider: Single failure analysis}
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@ -909,7 +915,7 @@ the input voltages $+V1$ and $+V2$.
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The circuit is configured so that both inputs use the non-inverting,
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and thus high impedance inputs, meaning that they will not
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electrically over-load and/or unduly influence
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the sensors supplying the voltage signals used for measurement.
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the sensors or circuitry supplying the voltage signals used for measurement.
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It would be desirable to represent this circuit as a {\dc} called say $DiffAMP$.
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We begin by identifying functional groups from the components in the circuit.
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@ -1135,7 +1141,7 @@ $$ fm(SEC\_AMP) = \{ AMPHigh, AMPLow, LowPass, AMPIncorrectOutput \} .$$
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%the derived component for $NI\_AMP$
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\pagebreak[4]
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\subsection{Modelling the circuit}
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\subsection{Finishing stage of the $DiffAmp$ Analysis}
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For the final stage of this we can create a functional group consisting of
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two derived components of the type $NI\_AMP$ and $SEC\_AMP$.
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@ -1155,9 +1161,9 @@ two derived components of the type $NI\_AMP$ and $SEC\_AMP$.
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% R & wire & res + & res - & description
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\hline
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\hline
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TC1: $NI\_AMP$ AMPHigh & opamp 2 driven high & DiffAMPLow \\
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TC2: $NI\_AMP$ AMPLow & opamp 2 driven low & DiffAMPHigh \\
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TC3: $NI\_AMP$ LowPass & opamp 2 driven with lag & DiffAMP\_LP \\ \hline
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TC1: $NI\_AMP$ AMPHigh & IC2 output driven high & DiffAMPLow \\
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TC2: $NI\_AMP$ AMPLow & IC2 output driven low & DiffAMPHigh \\
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TC3: $NI\_AMP$ LowPass & IC2 output with lag & DiffAMP\_LP \\ \hline
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TC4: $SEC\_AMP$ AMPHigh & Diff amplifier high & DiffAMPHigh\\
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TC5: $SEC\_AMP$ AMPLow & Diff amplifier low & DiffAMPLow \\
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TC6: $SEC\_AMP$ LowPass & Diff amplifier lag/lowpass & DiffAMP\_LP \\
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@ -1170,10 +1176,8 @@ two derived components of the type $NI\_AMP$ and $SEC\_AMP$.
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Collecting the symptoms, we can determine the failure modes for this circuit, $\{DiffAMPLow, DiffAMPHigh, DiffAMP\_LP, DiffAMPIncorrect \}$.
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We now create a derived component to represent the circuit in figure~\ref{fig:circuit1}.
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Collecting symptoms we determine the failure modes for this circuit, %$\{DiffAMPLow, DiffAMPHigh, DiffAMP\_LP, DiffAMPIncorrect \}$.
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and create a derived component to represent the circuit in figure~\ref{fig:circuit1}.
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$$ fm (DiffAMP) = \{DiffAMPLow, DiffAMPHigh, DiffAMP\_LP, DiffAMPIncorrect\} $$
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@ -1185,7 +1189,7 @@ Using this we can trace any top level fault back to
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a component failure mode that could have caused it\footnote{ In fact we can
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re-construct an FTA diagram from the information in this graph.
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We merely have to choose a top level event and work down using $XOR$ gates.}.
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%
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This circuit performs poorly from a safety point of view.
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Its failure modes could be indistinguishable from valid readings (especially
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when it becomes a V2 follower).
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@ -1199,13 +1203,13 @@ when it becomes a V2 follower).
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\end{figure}
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The {\fm} $DiffAMPIncorrect$ may seem like a vague {\fm}---however, this {\fm} is impossible to detect in this circuit---
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in fault finding terminology~\cite{garrett}~\cite{maikowski} this {\fm} is said to be unobservable, and in EN61508
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in fault finding terminology~\cite{garrett}~\cite{maikowski} this {\fm} is said to be unobservable, and in EN61508~\cite{en61508}
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terminology is called an undetectable fault.
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%
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Were this failure to have safety implications this FMMD analysis will have revealed
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Were this failure to have safety implications, this FMMD analysis will have revealed
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the un-observability and would likely prompt re-design of this
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circuit\footnote{A typical way to solve an un-observability such as this is
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to periodically switch in test signals in place of the input signal.}
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to periodically switch in test signals in place of the input signal.}.
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\clearpage
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@ -1248,15 +1252,17 @@ We begin with the first order low pass filter formed by $R10$ and $C10$.
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%
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This configuration (or {\fg}) is very commonly
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used in electronics to remove unwanted high frequencies/interference
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from a signal; Here it is being used as a first stage of
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from a signal; here it is being used as a first stage of
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a more sophisticated low pass filter.
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%
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R10 and C10 act as a potential divider, with the crucial difference between a purely resistive potential divider being
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that the impedance of the capacitor is lower for higher frequencies.
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%
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Thus higher frequencies are attenuated at the point that we
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read its output signal.
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%
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However, from a failure mode perspective we can analyse it in a very similar way
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to a potential divider (see section~\ref{potdivfmmd}).
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to a potential divider (see section~\ref{subsec:potdiv}).
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Capacitors generally fail OPEN but some types fail OPEN and SHORT.
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We will consider the worst case two failure mode model for this analysis.
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We analyse the first order low pass filter in table~\ref{tbl:firstorderlp}.\\
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@ -1285,7 +1291,7 @@ We analyse the first order low pass filter in table~\ref{tbl:firstorderlp}.\\
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\end{table}
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We can collect the symptoms $\{ LPnofilter,LPnosignal \}$ and create a derived component
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We collect the symptoms $\{ LPnofilter,LPnosignal \}$ and create a derived component
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called $FirstOrderLP$. Applying the $fm$ function yields $$ fm(FirstOrderLP) = \{ LPnofilter,LPnosignal \}.$$
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\paragraph{Addition of Buffer Amplifier: First stage.}
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@ -1346,7 +1352,7 @@ on the schematic as in figure~\ref{fig:circuit2002_LP1}.
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\paragraph{Second order Sallen Key Low Pass Filter.}
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The next two filters in the signal path are R1,R2,C2,C1,IC2 and R3,R4,C4,C3,IC3.
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From a failure mode perspective these are identical.
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We can analyse the first one and then re-use these results for the second.
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We can analyse the first one and then re-use these results for the second (see figure~\ref{fig:circuit2002_FIVEPOLE}).
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\begin{table}[ht]
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\caption{Sallen Key Low Pass Filter SKLP: Failure Mode Effects Analysis: Single Faults} % title of Table
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@ -1572,10 +1578,10 @@ Our functional group for the phase shifter consists of a resistor and a capacito
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\textbf{cause} & \textbf{Effect} & \textbf{Failure Mode} \\
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\hline
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FS1: R SHORT & 0 degree's of phase shift & $0\_phaseshift$ \\ \hline
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% 90 degree's of phase shift & & $90\_phaseshift$ \\ \hline
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FS1: R SHORT & 0 degree's of phase shift & $0\_phaseshift$ \\
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% 90 degree's of phase shift & & $90\_phaseshift$
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FS2: R OPEN & No Signal & $nosignal$ \\ \hline
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FS3: C SHORT & Grounded,No Signal & $nosignal$ \\ \hline
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FS3: C SHORT & Grounded,No Signal & $nosignal$ \\
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FS4: C OPEN & 0 degree's of phase shift & $0\_phaseshift$ \\ \hline
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\hline
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@ -1650,7 +1656,7 @@ or in Euler diagram format as in figure~\ref{fig:bubbaeuler1}.
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FS1: $PHS45_1$ $0\_phaseshift$ & & osc frequency high & & $HI_{fosc}$ \\
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FS2: $PHS45_1$ $no\_signal$ & & signal lost & & $NO_{osc}$ \\
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FS2: $PHS45_1$ $no\_signal$ & & signal lost & & $NO_{osc}$ \\ \hline
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% FS3: $PHS45_1$ $90\_phaseshift$ & & osc frequency low & & $LO_{fosc}$ \\ \hline
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FS3: $NIBUFF_1$ $L_{up}$ & & output high No Oscillation & & $NO_{osc}$ \\
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@ -1669,7 +1675,7 @@ or in Euler diagram format as in figure~\ref{fig:bubbaeuler1}.
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FS12: $NIBUFF_2$ $L_{slew}$ & & signal lost & & $NO_{osc}$ \\ \hline
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FS13: $PHS45_3$ $0\_phaseshift$ & & osc frequency high & & $HI_{fosc}$ \\
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FS14: $PHS45_3$ $no\_signal$ & & signal lost & & $NO_{osc}$ \\
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FS14: $PHS45_3$ $no\_signal$ & & signal lost & & $NO_{osc}$ \\ \hline
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% FS17: $PHS45_3$ $90\_phaseshift$ & & osc frequency low & & $LO_{fosc}$ \\ \hline
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FS15: $NIBUFF_3$ $L_{up}$ & & output high No Oscillation & & $NO_{osc}$ \\
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@ -1678,7 +1684,7 @@ or in Euler diagram format as in figure~\ref{fig:bubbaeuler1}.
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FS18: $NIBUFF_3$ $L_{slew}$ & & signal lost & & $NO_{osc}$ \\ \hline
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FS19: $PHS45_4$ $0\_phaseshift$ & & osc frequency high & & $HI_{fosc}$ \\
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FS20: $PHS45_4$ $no\_signal$ & & signal lost & & $NO_{osc}$ \\
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FS20: $PHS45_4$ $no\_signal$ & & signal lost & & $NO_{osc}$ \\ \hline
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% FS24: $PHS45_4$ $90\_phaseshift$ & & osc frequency low & & $LO_{fosc}$ \\ \hline
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FS21: $INVAMP$ $OUTOFRANGE$ & & signal lost & & $NO_{osc}$ \\
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@ -1746,20 +1752,36 @@ We should be able to determine smaller {\fgs} and refine the model further.
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\label{fig:bubbaeuler2}
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\end{figure}
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\paragraph{Outline of finer grained FMMD analysis of the Bubba oscillator}
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%
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We take the pre-analysed $NIBUFF$ and $PHS45$
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{\dcs} into a {\fg} giving the {\dc} $BUFF45$.
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$BUFF45$ is a {\dc} representing an actively buffered $45^{\circ}$ phase shifter.
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and with those three, form a $PHS135BUFFERED$
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functional group.
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$PHS135BUFFERED$ is a {\dc} representing an actively buffered $135^{\circ}$ phase shifter.
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We use the pre-analysed $NIBUFF$ and $PHS45$
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{\dcs} to form a {\fg}, analysed in table~\ref{tbl:buff45}, giving the
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{\dc} $BUFF45$.
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%
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A PHS45 {\dc} and an inverting amplifier\footnote{Inverting amplifiers always apply a $180^{\circ}$ phase shift.},
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Thus, $BUFF45$ is a {\dc} representing an actively buffered $45^{\circ}$ phase shifter.
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%
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From the block circuit diagram (figure~\ref{fig:circuit3}), we see that there are three
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$45^{\circ}$ phase shifter circuits in series. Together these apply a $135^{\circ}$ phase shift to the signal.
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%
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We use this property to model a higher level {\dc}, that of a 135 degree phase shifter.
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%
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The three $BUFF45$ {\dcs} form a
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functional group which is analysed in table~\ref{tbl:phs135buffered}.
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The result of this analysis is the {\dc}
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$PHS135BUFFERED$ which represents an actively buffered $135^{\circ}$ phase shifter.
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%
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\paragraph{Analysis details of the finer grained FMMD analysis of the Bubba oscillator}
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A PHS45 {\dc} and an inverting amplifier\footnote{Inverting amplifiers apply a $180^{\circ}$ phase shift to a signal regardless of its frequency.},
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form a {\fg}
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providing an amplified $225^{\circ}$ phase shift, which we can call $PHS225AMP$.
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providing an amplified $225^{\circ}$ phase shift, analysed in table~\ref{tbl:phs225amp}
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resulting in the {\dc} $PHS225AMP$.
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%
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%---with the remaining $PHS45$ and the $INVAMP$ (re-used from section~\ref{sec:invamp})in a second group $PHS225AMP$---
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Finally we can merge $PHS135BUFFERED$ and $PHS225AMP$ in a final stage (see figure~{fig:bubbaeuler2}) % \ref{fig:poss2finalbubba})
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Finally we form a final {\fg} with $PHS135BUFFERED$ and $PHS225AMP$,
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%in a final stage (see figure~{fig:bubbaeuler2}) % \ref{fig:poss2finalbubba})
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%
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%We can take a more modular approach by creating two intermediate functional groups, a buffered $45^{\circ}$ phase shifter (BUFF45)
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%we can combine three $BUFF45$'s to make
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@ -1784,7 +1806,7 @@ Finally we can merge $PHS135BUFFERED$ and $PHS225AMP$ in a final stage (see fig
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\hline
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FS1: $PHS45_1$ $0\_phaseshift$ & & phase shift low & & $0\_phaseshift$ \\
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FS2: $PHS45_1$ $no\_signal$ & & signal lost & & $NO_{signal}$ \\
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FS2: $PHS45_1$ $no\_signal$ & & signal lost & & $NO_{signal}$ \\ \hline
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%FS3: $PHS45_1$ $90\_phaseshift$ & & phase shift high & & $90\_phaseshift$ \\ \hline
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FS3: $NIBUFF_1$ $L_{up}$ & & output high & & $NO_{signal}$ \\
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@ -1820,15 +1842,15 @@ We can now combine three $BUFF45$ {\dcs} and create a $PHS135BUFFERED$ {\dc}.
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\hline
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FS1: $PHS45_1$ $0\_phaseshift$ & & phase shift low & & $90\_phaseshift$ \\
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FS2: $PHS45_1$ $no\_signal$ & & signal lost & & $NO_{signal}$ \\
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FS2: $PHS45_1$ $no\_signal$ & & signal lost & & $NO_{signal}$ \\ \hline
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%FS3: $PHS45_1$ $90\_phaseshift$ & & phase shift high & & $180\_phaseshift$ \\ \hline
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FS3: $PHS45_2$ $0\_phaseshift$ & & phase shift low & & $90\_phaseshift$ \\
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FS4: $PHS45_2$ $no\_signal$ & & signal lost & & $NO_{signal}$ \\
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FS4: $PHS45_2$ $no\_signal$ & & signal lost & & $NO_{signal}$ \\ \hline
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% FS6: $PHS45_2$ $90\_phaseshift$ & & phase shift high & & $180\_phaseshift$ \\ \hline
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FS5: $PHS45_3$ $0\_phaseshift$ & & phase shift low & & $90\_phaseshift$ \\
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FS6: $PHS45_3$ $no\_signal$ & & signal lost & & $NO_{signal}$ \\
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FS6: $PHS45_3$ $no\_signal$ & & signal lost & & $NO_{signal}$ \\ \hline
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% FS9: $PHS45_3$ $90\_phaseshift$ & & phase shift high & & $180\_phaseshift$ \\ \hline
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@ -1864,7 +1886,7 @@ $INVAMP$, providing $180^{\circ}$ giving a total of $225^{\circ}$.
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\hline
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FS1: $PHS45_1$ $0\_phaseshift$ & & phase shift low & & $180\_phaseshift$ \\
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FS2: $PHS45_1$ $no\_signal$ & & signal lost & & $NO_{signal}$ \\
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FS2: $PHS45_1$ $no\_signal$ & & signal lost & & $NO_{signal}$ \\ \hline
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% FS3: $PHS45_1$ $90\_phaseshift$ & & phase shift high & & $270\_phaseshift$ \\ \hline
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FS3: $INVAMP$ $L_{up}$ & & output high & & $NO_{signal}$ \\
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@ -1968,7 +1990,7 @@ there are more {\dcs} and this increases the potential for re-use of pre-analyse
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The following example is used to demonstrate FMMD analysis of a mixed analogue and digital circuit (see figure~\ref{fig:sigmadelta}).
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\begin{figure}[h]
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\centering
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\includegraphics[width=200pt]{./CH5_Examples/circuit4004.png}
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\includegraphics[width=300pt]{./CH5_Examples/circuit4004.png}
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% circuit4004.png: 562x389 pixel, 72dpi, 19.83x13.72 cm, bb=0 0 562 389
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\caption{Sigma Delta Analogue to Digital Converter}
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\label{fig:sigmadelta}
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@ -1980,7 +2002,7 @@ The following example is used to demonstrate FMMD analysis of a mixed analogue a
|
||||
%
|
||||
\begin{figure}[h]
|
||||
\centering
|
||||
\includegraphics[width=200pt,keepaspectratio=true]{./CH5_Examples/sigma_delta_block.png}
|
||||
\includegraphics[width=300pt,keepaspectratio=true]{./CH5_Examples/sigma_delta_block.png}
|
||||
% sigma_delta_block.png: 828x367 pixel, 72dpi, 29.21x12.95 cm, bb=0 0 828 367
|
||||
\caption{Electrical signal path Block diagram: \sd} % Analogue to Digital Converter }
|
||||
\label{fig:sigmadeltablock}
|
||||
@ -2003,15 +2025,17 @@ The output of the integrator is converted to a digital level (by IC2)
|
||||
%which acts as a comparator,
|
||||
and fed to the D type flip flop.
|
||||
%
|
||||
The output of the flip flop forms a bit pattern representing the value
|
||||
of the input voltage.
|
||||
%
|
||||
The output of the flip flop is also routed to the feedback.
|
||||
It is level converted to an analogue signal
|
||||
%
|
||||
The output of the flip flop is routed to the digital output and to the feedback loop.
|
||||
It must be level converted before being fed to the analogue feedback.
|
||||
It is level converted to an analogue signal by IC3.
|
||||
(i.e. a digital 0 becomes a -ve voltage and a digital 1 becomes a +ve voltage)
|
||||
and fed into the summing integrator completing the negative feedback loop.
|
||||
%
|
||||
In essence this implements an over-sampling analogue to digital converter~\cite{ehb}[pp.729-730].
|
||||
In essence this implements an over-sampling one bit analogue to digital converter~\cite{ehb}[pp.729-730].
|
||||
The output of the flip flop forms a bit pattern representing the value
|
||||
of the input voltage (i.e. the value of the sum of 1's and 0's is proportional to the voltage value at the input).
|
||||
|
||||
\subsection{FMMD analysis of \sd }
|
||||
|
||||
@ -2026,7 +2050,7 @@ IC1,2 and 3 are all OpAmps and we have failure modes from section~\ref{sec:opamp
|
||||
%
|
||||
$$ fm(OPAMP) = \{ HIGH, LOW, NOOP, LOW\_SLEW \} $$
|
||||
%
|
||||
We examine the literature for a failure model for the D-type flip flop~\cite{fmd91}[3-105], the CD4013B~\cite{cd4013Bds},
|
||||
We examine the literature for a failure model for the D-type flip flop~\cite{fmd91}[3-105], for example the CD4013B~\cite{cd4013Bds},
|
||||
and obtain its failure modes, which we can express using the $fm$ function:
|
||||
%%
|
||||
$$ fm ( CD4013B) = \{ HIGH, LOW, NOOP \} $$
|
||||
@ -2045,7 +2069,7 @@ $$ fm ( CLOCK ) = \{ STOPPED \} $$
|
||||
\subsection{Identifying initial {\fgs}}
|
||||
|
||||
\subsubsection{Summing Junction Integrator (SUMJINT)}
|
||||
We now need to choose {\fgs}. The most obvious way to find initial {\fgs} id
|
||||
We now need to choose {\fgs}. The most obvious way to find initial {\fgs} is
|
||||
to follow the signal path. The signal path is circular, but we can start
|
||||
with the input voltage, which is applied via $R2$, we term this voltage $V_{in}$.
|
||||
%
|
||||
@ -2279,8 +2303,8 @@ These are:
|
||||
\item SUMJINT --- A summing junction and integrator,
|
||||
\item HISB --- A High impedance buffer,
|
||||
\item DIGITALBUFF --- A one bit digital buffer,
|
||||
\item DL2AL --- A digital to analog level converter.
|
||||
\item DIGBUF --- A digital one bit buffer/memory
|
||||
\item DL2AL --- A digital to analog level converter,
|
||||
\item DIGBUF --- A digital one bit buffer/memory.
|
||||
\end{itemize}
|
||||
These {\dcs} follow the signal path shown in figure~\ref{fig:sigmadeltablock}.
|
||||
We now use these {\dcs} to create higher level {\fgs}.
|
||||
@ -2323,7 +2347,7 @@ $$ FG = \{ HISB, SUMJINT \} $$
|
||||
|
||||
\begin{table}[h+]
|
||||
\caption{ $HISB , SUMJINT$ buffered integrating summing junction($BISJ$): Failure Mode Effects Analysis} % title of Table
|
||||
\label{tbl:DS2AS}
|
||||
\label{tbl:BISJ}
|
||||
|
||||
\begin{tabular}{|| l | l | c | c | l ||} \hline
|
||||
% \textbf{Failure Scenario} & & \textbf{failure result } & & \textbf{Symptom} \\
|
||||
@ -2390,12 +2414,11 @@ We analyse the buffered flip flop circuitry in table~\ref{tbl:digbuf}.
|
||||
|
||||
\hline \hline
|
||||
FS1: $DIGBUF$ $STOPPED$ & & output stuck & & $OUTPUT STUCK$ \\
|
||||
FS2: $DIGBUF$ $LOW$ & & output stuck low & & $OUTPUT STUCK$ \\
|
||||
\\ \hline
|
||||
FS2: $DIGBUF$ $LOW$ & & output stuck low & & $OUTPUT STUCK$ \\ \hline
|
||||
%\hline
|
||||
FS3: $DL2AL$ $LOW$ & & output perm. high & & $OUTPUT STUCK$ \\
|
||||
FS4: $DL2AL$ $HIGH$ & & output perm. low & & $OUTPUT STUCK$ \\ \hline
|
||||
FS5: $DL2AL$ $LOW\_SLEW$ & & no current drive & & $LOW\_SLEW$ \\
|
||||
FS4: $DL2AL$ $HIGH$ & & output perm. low & & $OUTPUT STUCK$ \\
|
||||
FS5: $DL2AL$ $LOW\_SLEW$ & & no current drive & & $LOW\_SLEW$ \\ \hline
|
||||
|
||||
|
||||
\hline
|
||||
@ -2607,14 +2630,15 @@ and the subsequent hierarchy. With software already written, that hierarchy is f
|
||||
|
||||
Software written for safety critical systems is usually constrained to
|
||||
be modular~\cite{en61508}[3] and non recursive~\cite{misra}[15.2]. %{iec61511}.
|
||||
Because of this we can assume a direct call tree. Functions call functions
|
||||
Because of this we can assume direct call trees~\footnote{A typical embedded system
|
||||
will have a run time call tree, and interrupt driven call tress}. Functions call functions
|
||||
from the top down and eventually call the lowest level library or IO
|
||||
functions that interact with hardware/electronics.
|
||||
|
||||
What is potentially difficult with a software function, is deciding what
|
||||
its failure modes and symptoms are.
|
||||
With electronic components, we can use literature to point us to suitable sets of
|
||||
{\fms}~\cite{fmd91}~\cite{mil1991}~\cite{en298}.%~\cite{en61508}~\cite{en298}.
|
||||
{\fms}~\cite{fmd91}~\cite{mil1991}~\cite{en298}. %~\cite{en61508}~\cite{en298}.
|
||||
With software, only some library functions are well known and rigorously documented
|
||||
enough to have the equivalent of known failure modes.
|
||||
Most software is `bespoke'. We need a different strategy to
|
||||
@ -2674,7 +2698,8 @@ Should the driving electronics go wrong at the source end, it will usually
|
||||
supply far too little or far too much current, also making error conditions easy to detect.
|
||||
%
|
||||
At the receiving end, we only require one simple component to convert the
|
||||
current signal into a voltage that we can read with an ADC: a resistor. % the humble resistor!
|
||||
current signal into a voltage that we can read with an AD---a resistor---given
|
||||
its properties defined by Ohms law. % the humble resistor!
|
||||
|
||||
|
||||
%BLOCK DIAGRAM HERE WITH FT CIRCUIT LOOP
|
||||
@ -3120,14 +3145,22 @@ $$fm(R420I) = \{OUT\_OF\_RANGE, VAL\_ERR\} .$$
|
||||
|
||||
|
||||
We can now represent the software/hardware FMMD analysis
|
||||
as a hierarchical diagram, see figure~\ref{fig:hd}.
|
||||
as a hierarchical diagram, see figure~\ref{fig:eulerswhw}. % see figure~\ref{fig:hd}.
|
||||
|
||||
% HTR 27OCT2012 % \begin{figure}[h]
|
||||
% HTR 27OCT2012 % \centering
|
||||
% HTR 27OCT2012 % \includegraphics[width=200pt]{./CH5_Examples/hd.png}
|
||||
% HTR 27OCT2012 % % hd.png: 363x520 pixel, 72dpi, 12.81x18.34 cm, bb=0 0 363 520
|
||||
% HTR 27OCT2012 % \caption{FMMD hierarchy with hardware and software elements}
|
||||
% HTR 27OCT2012 % \label{fig:hd}
|
||||
% HTR 27OCT2012 % \end{figure}
|
||||
|
||||
\begin{figure}[h]
|
||||
\centering
|
||||
\includegraphics[width=200pt]{./CH5_Examples/hd.png}
|
||||
% hd.png: 363x520 pixel, 72dpi, 12.81x18.34 cm, bb=0 0 363 520
|
||||
\caption{FMMD hierarchy with hardware and software elements}
|
||||
\label{fig:hd}
|
||||
\includegraphics[width=300pt]{./CH5_Examples/eulerswhw.png}
|
||||
% eulerswhw.png: 510x344 pixel, 72dpi, 17.99x12.14 cm, bb=0 0 510 344
|
||||
\caption{Euler diagram showing relationship between {\dcs} determined from electronics and software.}
|
||||
\label{fig:eulerswhw}
|
||||
\end{figure}
|
||||
|
||||
|
||||
|
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submission_thesis/CH5_Examples/eulerswhw.dia
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submission_thesis/CH5_Examples/eulerswhw.dia
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Reference in New Issue
Block a user