more polishing
This commit is contained in:
parent
54f249ba90
commit
79b0655cf8
@ -193,7 +193,7 @@ typically of the form of examining scenarios such as
|
|||||||
%are examined.
|
%are examined.
|
||||||
%
|
%
|
||||||
%
|
%
|
||||||
FMD-91 is a reference document released into the public domain by the United States DOD
|
FMD-91~\cite{fmd91} is a reference document released into the public domain by the United States DOD
|
||||||
and describes `failures' of common electronic components, with percentage statistics for each failure.
|
and describes `failures' of common electronic components, with percentage statistics for each failure.
|
||||||
%
|
%
|
||||||
FMD-91 entries include general descriptions of internal failures alongside {\fms} of use to an FMEA investigation.
|
FMD-91 entries include general descriptions of internal failures alongside {\fms} of use to an FMEA investigation.
|
||||||
@ -418,7 +418,7 @@ For Op-Amp failures modes, FMD-91\cite{fmd91}{3-116] states,
|
|||||||
|
|
||||||
These are mostly internal causes of failure, more of interest to the component manufacturer
|
These are mostly internal causes of failure, more of interest to the component manufacturer
|
||||||
than a test engineer % designer
|
than a test engineer % designer
|
||||||
looking for the symptoms of failure.
|
looking for symptoms of failure.
|
||||||
%
|
%
|
||||||
These failure causes within the Op-Amp need to be translated to symptomatic {\fms}.
|
These failure causes within the Op-Amp need to be translated to symptomatic {\fms}.
|
||||||
%
|
%
|
||||||
@ -570,13 +570,13 @@ $$ fm(OPAMP) = \{ LOW, HIGH, NOOP, LOW\_SLEW \} . $$
|
|||||||
|
|
||||||
|
|
||||||
The EN298 pinouts failure mode technique cannot reveal failure modes due to internal failures,
|
The EN298 pinouts failure mode technique cannot reveal failure modes due to internal failures,
|
||||||
and that is why it misses the $LOW\_SLEW$.
|
and that is why it misses $LOW\_SLEW$.
|
||||||
%
|
%
|
||||||
The FMD-91 entries for op-amps are not directly usable as
|
The FMD-91 entries for op-amps are not directly usable as
|
||||||
component {\fms} in FMEA and require interpretation.
|
component {\fms} in FMEA and require interpretation.
|
||||||
%
|
%
|
||||||
However, once a failure mode analysis has been carried out, the model can
|
However, once a failure mode determination has been carried out, the model can
|
||||||
be used throughout the FMEA process.
|
be re-used throughout the FMEA process.
|
||||||
|
|
||||||
%%%% Talk about R differences ?? XXXXX
|
%%%% Talk about R differences ?? XXXXX
|
||||||
|
|
||||||
@ -734,7 +734,7 @@ the circuit behaviour is measured in finer granularity,
|
|||||||
%
|
%
|
||||||
With this style of fault finding, because it is based on experiment,
|
With this style of fault finding, because it is based on experiment,
|
||||||
hopping from module to module eliminating working ones, until
|
hopping from module to module eliminating working ones, until
|
||||||
failure is found~\cite{maikowski}, it is efficient in terms of
|
failure is found~\cite{maikowski}, is efficient in terms of
|
||||||
concentrating effort.
|
concentrating effort.
|
||||||
%
|
%
|
||||||
The rationale and work-culture of those tasked to
|
The rationale and work-culture of those tasked to
|
||||||
@ -985,7 +985,7 @@ deduced).
|
|||||||
\fmmdglossRD
|
\fmmdglossRD
|
||||||
Reasoning distance, is the number of stages of logic and reasoning used
|
Reasoning distance, is the number of stages of logic and reasoning used
|
||||||
in {\fm} analysis to map a failure cause to its potential outcomes; counted
|
in {\fm} analysis to map a failure cause to its potential outcomes; counted
|
||||||
by th number of {\fm} to component checks made.
|
by the number of {\fm} to component checks made.
|
||||||
%
|
%
|
||||||
The basic FMEA example in section~\ref{basicfmea}
|
The basic FMEA example in section~\ref{basicfmea}
|
||||||
considered one {\fm} against some of the components in the milli-volt reader.
|
considered one {\fm} against some of the components in the milli-volt reader.
|
||||||
@ -1153,7 +1153,7 @@ cost, problems to be addressed in product production.
|
|||||||
It generally focuses on known problems and using their
|
It generally focuses on known problems and using their
|
||||||
statistical frequency %they occur
|
statistical frequency %they occur
|
||||||
and their cost to fix multiplied gives a Risk Priority Number (RPN)
|
and their cost to fix multiplied gives a Risk Priority Number (RPN)
|
||||||
number for the germane component {\fm}.
|
for the germane component {\fm}.
|
||||||
%
|
%
|
||||||
Fixing problems with the highest RPN number
|
Fixing problems with the highest RPN number
|
||||||
will return most cost benefit~\cite{bfmea}.
|
will return most cost benefit~\cite{bfmea}.
|
||||||
@ -1274,7 +1274,7 @@ The highest $C_m$ values would represent the most dangerous or serious
|
|||||||
system level failures.
|
system level failures.
|
||||||
The highest $C_m$ values would be at the top of a `to~fix' list
|
The highest $C_m$ values would be at the top of a `to~fix' list
|
||||||
for a project manager, and some levels of risk may be considered unacceptable
|
for a project manager, and some levels of risk may be considered unacceptable
|
||||||
and require re-design of some systems.
|
and require re-design. % of some systems.
|
||||||
\fmmdglossFMECA
|
\fmmdglossFMECA
|
||||||
|
|
||||||
\section{FMEDA - Failure Modes Effects and Diagnostic Analysis}
|
\section{FMEDA - Failure Modes Effects and Diagnostic Analysis}
|
||||||
|
Loading…
Reference in New Issue
Block a user