From 6b5ce8503db9488c8cf4a3f3abf09a9424c301f1 Mon Sep 17 00:00:00 2001 From: Robin Clark Date: Sun, 8 Sep 2013 22:18:53 +0100 Subject: [PATCH] tidying CH2 --- submission_thesis/CH2_FMEA/copy.tex | 5 +++-- 1 file changed, 3 insertions(+), 2 deletions(-) diff --git a/submission_thesis/CH2_FMEA/copy.tex b/submission_thesis/CH2_FMEA/copy.tex index 0494ab7..721403c 100644 --- a/submission_thesis/CH2_FMEA/copy.tex +++ b/submission_thesis/CH2_FMEA/copy.tex @@ -212,7 +212,8 @@ from them can be on the conservative side. \frategloss \fmmdglossFIT % -A FIT value for a micro-processor +A FIT\footnote{Failure rates measured per $10^9$ hours of operation +are known as Failure in Time (FIT) values.} value for a micro-processor may be determined at around 100 using these documents for instance, but FIT claims for modern integrated micro-controllers are typically less than five~\cite{microchipreliability}. % @@ -920,7 +921,7 @@ FMEA is less useful for determining events for multiple simultaneous failures\footnote{Multiple simultaneous failures are taken to mean failures that occur within the same detection period. Detection periods are typically determined for the process under control. For instance, for a flame detector in an industrial burner this -could typically be one second.~\cite{en298}}. +is typically one second.~\cite{en298}}. % Work has been performed using component failure statistics to offer the more likely multiple failures~\cite{FMEAmultiple653556} for analysis.