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@ -102,7 +102,7 @@ In chapter~\ref{sec:chap4}, a new methodology is proposed which addresses the st
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and using contract programmed software, allows the modelling of integrated
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and using contract programmed software, allows the modelling of integrated
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software/electrical systems.
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software/electrical systems.
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This is followed by two chapters showing examples of the new modular FMEA analysis technique (Failure Mode Modular De-Composition FMMD)
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This is followed by two chapters showing examples of the new modular FMEA analysis technique (Failure Mode Modular De-Composition, FMMD)
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firstly looking at a variety of common electronic circuits and then at electronic/software hybrid systems.
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firstly looking at a variety of common electronic circuits and then at electronic/software hybrid systems.
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}
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}
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@ -136,7 +136,7 @@ industrial burners---the design team was faced with a new and daunting requireme
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Conformance to the latest European standard, EN298~\cite{en298}.
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Conformance to the latest European standard, EN298~\cite{en298}.
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It appeared to ask for the impossible:
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It appeared to ask for the impossible:
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not only did it require the usual safety measures (self-checking of ROM and RAM, watchdog processors with separate clock sources, EMC and the
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not only did it require the usual safety measures (self-checking of ROM and RAM, watchdog processors with separate clock sources, EMC testing and the
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triple fail safe control of valves), it had one new clause in it that had far reaching consequences.
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triple fail safe control of valves), it had one new clause in it that had far reaching consequences.
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It stated that in the event of a failure, where the controller had gone into a `lockout~state'--- a state where the controller
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It stated that in the event of a failure, where the controller had gone into a `lockout~state'--- a state where the controller
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@ -168,8 +168,8 @@ analysis of identical circuitry was performed many times.
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\subsection{Modularising/De-Composing FMEA: Initial concepts.} % and augmenting this with concepts from Euler/Spider Diagrams.}
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\subsection{Modularising/De-Composing FMEA: Initial concepts.} % and augmenting this with concepts from Euler/Spider Diagrams.}
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In the field of digital signal processing there is an algorithm that revolutionised
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In the field of digital signal processing there is an algorithm that revolutionised
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access to frequency analysis of digital samples called the Fast Fourier transform (FFT)~\cite{fftoriginal}.
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access to frequency analysis of digital samples called the Fast Fourier Transform (FFT)~\cite{fftoriginal}.
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This took the discrete Fourier transform (DFT), and applied de-composition to its
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This took the Discrete Fourier Transform (DFT), and applied de-composition to its
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mesh of (often repeated) complex number calculations~\cite{fpodsadsp}[Ch.8].
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mesh of (often repeated) complex number calculations~\cite{fpodsadsp}[Ch.8].
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By doing this it broke the computing order of complexity down from having a polynomial %n exponential
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By doing this it broke the computing order of complexity down from having a polynomial %n exponential
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@ -98,7 +98,7 @@ These are termed `{\bcs}'; they are considered ``atomic'' i.e. they are not brok
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The first requirement for a {\bc} is to define the ways in which it can fail,
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The first requirement for a {\bc} is to define the ways in which it can fail,
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this relationship %between a {\bc} and its failure modes,
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this relationship %between a {\bc} and its failure modes,
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is shown in figure~\ref{fig:component_fm_rel}.
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is shown, using UML, in figure~\ref{fig:component_fm_rel}.
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\fmmdglossBC
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\fmmdglossBC
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%DIAGRAM of Base components and failure modes
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%DIAGRAM of Base components and failure modes
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@ -106,7 +106,7 @@ is shown in figure~\ref{fig:component_fm_rel}.
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\centering
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\centering
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\includegraphics[width=300pt]{./CH2_FMEA/component_fm_rel.png}
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\includegraphics[width=300pt]{./CH2_FMEA/component_fm_rel.png}
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% component_fm_rel.png: 368x71 pixel, 72dpi, 12.98x2.50 cm, bb=0 0 368 71
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% component_fm_rel.png: 368x71 pixel, 72dpi, 12.98x2.50 cm, bb=0 0 368 71
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\caption{Base Component to Failure Modes relationship}
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\caption{Base Component to Failure Modes relationship UML diagram}
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\label{fig:component_fm_rel}
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\label{fig:component_fm_rel}
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\end{figure}
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\end{figure}
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@ -306,7 +306,7 @@ as listed below:
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Note, that the main cause of resistor value drift is overloading. % of components.
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Note, that the main cause of resistor value drift is overloading. % of components.
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This is borne out in the FMD-91~\cite{fmd91}[232] entry for a resistor network where the failure
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This is borne out in the FMD-91~\cite{fmd91} entry for a resistor network where the failure
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modes do not include drift.
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modes do not include drift.
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If it is ensured that resistors will not be exposed to overload conditions, the
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If it is ensured that resistors will not be exposed to overload conditions, the
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@ -392,7 +392,7 @@ has an entry specific to operational amplifiers (FMD-91).
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EN298 does not specifically define the
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EN298 does not specifically define the
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{\fms} of op-amps but
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{\fms} of op-amps but
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instead has a procedure for determining the {\fms} of
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instead has a procedure for determining the {\fms} of
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components types not specifically listed in it.
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components types not specifically listed. %in it.
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Operational amplifiers are typically packaged in dual or quad configurations---meaning
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Operational amplifiers are typically packaged in dual or quad configurations---meaning
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that a chip will typically contain two or four amplifiers.
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that a chip will typically contain two or four amplifiers.
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@ -479,7 +479,7 @@ are examined and from this its {\fms} are determined.
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% that we got from FMD-91, listed in equation~\ref{eqn:opampfms}, except for
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% that we got from FMD-91, listed in equation~\ref{eqn:opampfms}, except for
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% $LOW\_SLEW$.
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% $LOW\_SLEW$.
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Collating the op-amp failure modes from table ~\ref{tbl:lm358} the same {\fms}
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Collating the op-amp failure modes from table ~\ref{tbl:lm358}, the same {\fms}
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from FMD-91 are obtained---listed in equation~\ref{eqn:opampfms}---except for
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from FMD-91 are obtained---listed in equation~\ref{eqn:opampfms}---except for
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$LOW\_SLEW$.
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$LOW\_SLEW$.
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\fmmdglossOPAMP
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\fmmdglossOPAMP
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@ -621,10 +621,7 @@ it and choosing the resistor R1 in the OP-AMP gain circuitry:
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% \includegraphics[width=175pt]{./mvamp.png}
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% \includegraphics[width=175pt]{./mvamp.png}
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% % mvamp.png: 561x403 pixel, 72dpi, 19.79x14.22 cm, bb=0 0 561 403
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% % mvamp.png: 561x403 pixel, 72dpi, 19.79x14.22 cm, bb=0 0 561 403
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% \end{figure}
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% \end{figure}
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%\paragraph{FMEA Example: Milli-volt reader}
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\paragraph{FMEA Example: Milli-volt reader}
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% \begin{figure}
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% \begin{figure}
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% \centering
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% \centering
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% \includegraphics[width=80pt]{./mvamp.png}
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% \includegraphics[width=80pt]{./mvamp.png}
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@ -733,7 +730,7 @@ the circuit behaviour is measured in finer granularity,
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until a faulty component or module~\cite{garrett} is identified.
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until a faulty component or module~\cite{garrett} is identified.
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With this style of fault finding, because it is based on experiment,
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With this style of fault finding, because it is based on experiment,
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hopping from module to module eliminating working ones, until
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hopping from module to module eliminating working ones, until a
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failure is found~\cite{maikowski}, is efficient in terms of
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failure is found~\cite{maikowski}, is efficient in terms of
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concentrating effort.
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concentrating effort.
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@ -747,7 +744,7 @@ FMEA is a theoretical discipline. %AF does not like this!
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It would be very unusual to build a circuit and then simulate
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It would be very unusual to build a circuit and then simulate
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component failure modes.
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component failure modes.
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This would be time consuming as it would involve building a circuit for each component {\fm} in
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This would be time consuming as it would involve altering/building a circuit for each component {\fm} in
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the system\footnote{Building circuit simulations and simulating component failure modes
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the system\footnote{Building circuit simulations and simulating component failure modes
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would be a very time consuming process and might only be performed as a final-stage of accident investigation, where the cause is
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would be a very time consuming process and might only be performed as a final-stage of accident investigation, where the cause is
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required to be proven.}.
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required to be proven.}.
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@ -803,7 +800,7 @@ at mapping potential single component failures to system level faults/events.
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The concept of the unacceptability of a single component failure causing a system failure % catastrophe,
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The concept of the unacceptability of a single component failure causing a system failure % catastrophe,
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is an important and easily understood measurement of safety.
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is an important and easily understood measurement of safety.
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They are easy to calculate
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Statistics for single failures are easy to calculate
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because Mean Time to Failure (MTTF) statistics~\cite{fmd91,mil1991} for commonly used components can be found.
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because Mean Time to Failure (MTTF) statistics~\cite{fmd91,mil1991} for commonly used components can be found.
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Also, used in the design phase of a project, FMEA is a useful tool
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Also, used in the design phase of a project, FMEA is a useful tool
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@ -1389,7 +1386,7 @@ are actually met for given SIL levels is currently almost impossible~\cite{silsa
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\item \textbf{Safe or Dangerous.} Failure modes are classified SAFE or DANGEROUS.
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\item \textbf{Safe or Dangerous.} Failure modes are classified SAFE or DANGEROUS.
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\item \textbf{Detectable failure modes.} Failure modes are given the attribute DETECTABLE or UNDETECTABLE.
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\item \textbf{Detectable failure modes.} Failure modes are given the attribute DETECTABLE or UNDETECTABLE.
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\item \textbf{Four attributes for FMEDA Failure Modes.} All failure modes may thus be Safe Detected(SD), Safe Undetected(SU), Dangerous Detected(DD), Dangerous Undetected(DU)
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\item \textbf{Four attributes for FMEDA Failure Modes.} All failure modes may thus be Safe Detected(SD), Safe Undetected(SU), Dangerous Detected(DD), Dangerous Undetected(DU)
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\item \textbf{Four statistical properties of a system.} the statistics for the four classifications of system failures are summed: \\
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\item \textbf{Four statistical properties of a system.} The statistics for the four classifications of system failures are summed: \\
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$ \sum \lambda_{SD}$, $\sum \lambda_{SU}$, $\sum \lambda_{DD}$, $\sum \lambda_{DU}$. \\
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$ \sum \lambda_{SD}$, $\sum \lambda_{SU}$, $\sum \lambda_{DD}$, $\sum \lambda_{DU}$. \\
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\end{itemize}
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\end{itemize}
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@ -1461,7 +1458,7 @@ by statistically determining how frequently it can fail dangerously.
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\label{sec:asil}
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\label{sec:asil}
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The EN61508 variant for automotive use, as defined in standard ISO~26262, is known as the Automotive SIL (ASIL)~\cite{Kafka20122}.
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The EN61508 variant for automotive use, as defined in standard ISO~26262, is known as Automotive SIL (ASIL)~\cite{Kafka20122}.
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Safety instrumented functions (SIFs) for vehicles are assigned ASIL ratings.
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Safety instrumented functions (SIFs) for vehicles are assigned ASIL ratings.
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@ -1490,7 +1487,7 @@ have independent failure causes and implement redundancy. % for the SIF.
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This is in effect a top down de-composition of safety requirements.
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This is in effect a top down de-composition of safety requirements.
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This is rather like the demand for multiple engines on an aircraft
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This is rather like the demand for multiple engines on aircraft
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that must make a long journeys over the sea to statistically limit
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that must make a long journeys over the sea to statistically limit
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the likelihood of one failure cause --- i.e. one engine failure --- causing a serious incident.
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the likelihood of one failure cause --- i.e. one engine failure --- causing a serious incident.
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@ -1526,7 +1523,7 @@ This could be considered as a design check method, deliberately
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looking for weaknesses at a theoretical level.
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looking for weaknesses at a theoretical level.
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Because design FMEA meetings can have the format of a meeting and discussion
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Because design FMEA meetings can have the format of a meeting and discussion
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it can have the following drawbacks:
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they can have the following drawbacks:
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%\subsection{DESIGN FMEA: Safety Critical Approvals FMEA}
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%\subsection{DESIGN FMEA: Safety Critical Approvals FMEA}
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% \begin{figure}[h]
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% \begin{figure}[h]
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@ -1540,7 +1537,7 @@ it can have the following drawbacks:
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\begin{itemize}
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\begin{itemize}
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\item Impossible to look at all component failures let alone apply FMEA exhaustively/rigorously,
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\item Impossible to look at all component failures let alone apply FMEA exhaustively/rigorously,
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\item In practice, failure scenarios for critical sections are contested, and either justified or extra safety measures implemented,
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\item In practice, failure scenarios for critical sections are contested, and either justified or extra safety measures implemented,
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\item Often meeting notes or minutes only: unusual for detailed technical arguments to be documented.
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\item Often meeting notes or minutes only: it is unusual for detailed technical arguments to be documented.
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\end{itemize}
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\end{itemize}
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@ -1558,7 +1555,8 @@ it can have the following drawbacks:
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\end{figure}
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\end{figure}
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Returning to the FMEA model, the data relationships shown in
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Returning to the FMEA model, the data relationships shown in
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figure~\ref{fig:component_fm_rel_ana} hold for the five variants of FMEA discussed.
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figure~\ref{fig:component_fm_rel_ana} hold for the %five
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variants of FMEA discussed.
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This could be extended, if it is considered that the system level symptoms have subjective
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This could be extended, if it is considered that the system level symptoms have subjective
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interpretations.
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interpretations.
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@ -1573,8 +1571,10 @@ These raise questions and are discussed below.
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For instance a given {\fm} will have its effect measured in relation
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For instance a given {\fm} will have its effect measured in relation
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to some of the components in the system.
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to some of the components in the system.
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These components can be chosen by stipulating several criteria,
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% These components can be chosen by stipulating several criteria,
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relating this to the signal path or adjacency in the electronic circuit,
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% relating this to the signal path or adjacency in the electronic circuit,
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% potential strategies are listed below:
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These components could be chosen by stipulating criteria relating to the signal path or adjacency in the electronic circuit,
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potential strategies are listed below:
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potential strategies are listed below:
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\begin{itemize}
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\begin{itemize}
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@ -1611,7 +1611,7 @@ However, %, as with the components that we should check against a {\fm},
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%there are no guidelines for documenting
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%there are no guidelines for documenting
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the depth of description for reasoning stages in FMEA entries is in practise variable.
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the depth of description for reasoning stages in FMEA entries is in practise variable.
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%FMEA does not stipulat which
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%FMEA does not stipulat which
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Ideally each FMEA entry would contain a reasoning description
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Ideally each FMEA entry would contain a clear reasoning description
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for each {\fm},
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for each {\fm},
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so that the entry can be more easily reviewed or revisited/audited. % than a traditional FMEA report.
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so that the entry can be more easily reviewed or revisited/audited. % than a traditional FMEA report.
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%
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@ -83,7 +83,7 @@ This means that there is one analysis case per component failure mode for all th
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This analysis philosophy has not changed since FMEA was first used.
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This analysis philosophy has not changed since FMEA was first used.
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\subsection{FMEA does not support Traceable Reasoning}
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\subsection{FMEA does not encourage Traceable Reasoning}
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An FMEA report normally assigns one line of a spreadsheet to
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An FMEA report normally assigns one line of a spreadsheet to
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each {\bc} {\fm}.
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each {\bc} {\fm}.
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@ -109,7 +109,7 @@ structures that are repeated.
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The failure mode behaviour of these repeated structures will be the same.
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The failure mode behaviour of these repeated structures will be the same.
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However with the {\bc} {\fm} to system level failure mode mapping paradigm of FMEA
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However due to the {\bc} {\fm} to system level failure mode mapping paradigm of FMEA,
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work is likely to be repeated.
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work is likely to be repeated.
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\subsection{FMEA does not support modularity.}
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\subsection{FMEA does not support modularity.}
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@ -308,7 +308,7 @@ For instance, an AVO-8 multi-meter circa 1970, uses only analogue electronics an
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using FMEA how component failures within it could affect readings.
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using FMEA how component failures within it could affect readings.
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A modern multi-meter will have a small dedicated micro-processor and sensing electronics, all on the same chip,
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A modern multi-meter will have a small dedicated micro-processor and sensing electronics, all on the same chip,
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with firmware to read the user controls, and display results on an LCD.
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with firmware to read the user controls, and display results. % on an LCD.
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%
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For quality control, many safety critical processes require regular inspections
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For quality control, many safety critical processes require regular inspections
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and measurements of physical characteristics of materials and machinery.
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and measurements of physical characteristics of materials and machinery.
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@ -88,7 +88,9 @@ with its own set of failure modes.
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%This {\dc} has a set of failure modes: we can thus treat it as a `higher~level' component.
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%This {\dc} has a set of failure modes: we can thus treat it as a `higher~level' component.
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Because a {\dc} has a set of failure modes we can use it in higher level {\fgs}
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% Because a {\dc} has a set of failure modes we can use it in higher level {\fgs}
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% which in turn produce higher level {\dcs}.
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Because a {\dc} has a set of failure modes it can be used in higher level {\fgs}
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which in turn produce higher level {\dcs}.
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which in turn produce higher level {\dcs}.
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%
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These {\dcs} can be used to build further {\fgs} until a hierarchy of {\fgs}
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These {\dcs} can be used to build further {\fgs} until a hierarchy of {\fgs}
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@ -624,7 +626,7 @@ showing the choice of de-composition of the system into {\fgs} in figure~\ref{fi
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\includegraphics[width=300pt]{./CH4_FMMD/eulerfmmd.png}
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\includegraphics[width=300pt]{./CH4_FMMD/eulerfmmd.png}
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% eulerfmmd.png: 413x207 pixel, 72dpi, 14.57x7.30 cm, bb=0 0 413 207
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% eulerfmmd.png: 413x207 pixel, 72dpi, 14.57x7.30 cm, bb=0 0 413 207
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\caption{FMMD analysis of the INVAMP represented as an Euler diagram, showing how
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\caption{FMMD analysis of the INVAMP represented as an Euler diagram, showing how
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the components have been grouped into {\fgs} and then used as {\dcs} to build the analysis hierarchy.}
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the components have been collected into {\fgs} and then used as {\dcs} to build the analysis hierarchy.}
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\label{fig:eulerfmmd}
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\label{fig:eulerfmmd}
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\end{figure}
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\end{figure}
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@ -707,7 +709,7 @@ as lowest level building blocks.
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In fact any lowest level building block with published failure modes could be considered to be a {\bc},
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In fact any lowest level building block with published failure modes could be considered to be a {\bc},
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but this determination is the choice of the analyst, which may be influenced by the particular
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but this determination is the choice of the analyst, which may be influenced by the particular
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standard~\cite{en298}~\cite{en61508} %~\cite{en230}
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standard~\cite{en298}~\cite{en61508} %~\cite{en230}
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to which the system is being approved/analyed.
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to which the system is being approved/analysed.
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%a lowest level of assembly `part' or an atomic entity, which ever is the smaller
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%a lowest level of assembly `part' or an atomic entity, which ever is the smaller
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%and component to mean either a part or a sub-assembly.
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%and component to mean either a part or a sub-assembly.
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@ -797,7 +799,7 @@ the symptoms of failure of the {\fg} are the failure modes of this new `{\dc}'.
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An outline of the FMMD process is itemised below:
|
An outline of the FMMD process is itemised below:
|
||||||
\begin{itemize}
|
\begin{itemize}
|
||||||
\item Collect components to form a {\fg},
|
\item Collect components to form a {\fg},
|
||||||
\item Create failure cause `test~cases' for all failure modes of the components within the {\fg},
|
\item Create `test~cases' for all failure modes of the components within the {\fg},
|
||||||
\item Analyse the effect of all the test~cases on the operation of the {\fg},
|
\item Analyse the effect of all the test~cases on the operation of the {\fg},
|
||||||
\item Determine the common failure modes of the {\fg},
|
\item Determine the common failure modes of the {\fg},
|
||||||
\item Create and name a derived component for the {\fg},
|
\item Create and name a derived component for the {\fg},
|
||||||
@ -808,7 +810,7 @@ An outline of the FMMD process is itemised below:
|
|||||||
\fmmdgloss
|
\fmmdgloss
|
||||||
\fmmdglossBC
|
\fmmdglossBC
|
||||||
%
|
%
|
||||||
The FMMD process is described in using formal definitions and algorithms in section~\ref{sec:symptomabs}.
|
The FMMD process is described using formal definitions and algorithms in section~\ref{sec:symptomabs}.
|
||||||
}
|
}
|
||||||
|
|
||||||
%What components all have in common is that they can fail, and fail in a
|
%What components all have in common is that they can fail, and fail in a
|
||||||
@ -1113,7 +1115,7 @@ Thus, each possible cause for a system failure %{\fm}
|
|||||||
will have a collection of FMMD analysis reports associated with it.
|
will have a collection of FMMD analysis reports associated with it.
|
||||||
%
|
%
|
||||||
These collections of analysis reports will provide a cause and effect
|
These collections of analysis reports will provide a cause and effect
|
||||||
story for each possible scenario that could cause the system level failure.
|
story for each possible scenario that could lead to the system level failure.
|
||||||
%
|
%
|
||||||
Traceability of design processes are considered necessary for
|
Traceability of design processes are considered necessary for
|
||||||
safety critical product~\cite{en61508} and is an important concept
|
safety critical product~\cite{en61508} and is an important concept
|
||||||
|
Binary file not shown.
Before Width: | Height: | Size: 14 KiB After Width: | Height: | Size: 18 KiB |
@ -25,7 +25,8 @@ The two approaches, i.e. effects of choice of membership for {\fgs} are then dis
|
|||||||
\fmmdglossOPAMP
|
\fmmdglossOPAMP
|
||||||
\item Section~\ref{sec:diffamp} analyses a circuit where two op-amps are used
|
\item Section~\ref{sec:diffamp} analyses a circuit where two op-amps are used
|
||||||
to create a differencing amplifier.
|
to create a differencing amplifier.
|
||||||
Building on the two approaches from section~\ref{sec:invamp}, re-use of the non-inverting amplifier {\dc} from section~\ref{sec:invamp}
|
Building on the two approaches from section~\ref{sec:invamp}, re-use of the
|
||||||
|
non-inverting amplifier {\dc} from section~\ref{subsec:potdiv} % ~\ref{sec:invamp} %%%% 27SEP2013
|
||||||
is examined,
|
is examined,
|
||||||
where re-use is appropriate in the first stage and
|
where re-use is appropriate in the first stage and
|
||||||
not in the second.
|
not in the second.
|
||||||
@ -439,9 +440,8 @@ electrically load the previous stage.
|
|||||||
Because this differencing amplifier presents high impedance to both inputs, and only uses two amplifiers,
|
Because this differencing amplifier presents high impedance to both inputs, and only uses two amplifiers,
|
||||||
this is a useful circuit wherever a high impedance differencing amplifier is required.
|
this is a useful circuit wherever a high impedance differencing amplifier is required.
|
||||||
%
|
%
|
||||||
This is a configuration that is commonly used in electronic circuits.
|
This is a configuration that is commonly used in electronic circuits,
|
||||||
%
|
it would therefore, be desirable to represent this circuit as a {\dc} called say $DiffAMP$.
|
||||||
It would therefore, be desirable to represent this circuit as a {\dc} called say $DiffAMP$.
|
|
||||||
%
|
%
|
||||||
Identifying {\fgs} from the components in the circuit is the starting point for analysis.
|
Identifying {\fgs} from the components in the circuit is the starting point for analysis.
|
||||||
%
|
%
|
||||||
@ -525,8 +525,8 @@ two derived components of the type $NI\_AMP$ and $SEC\_AMP$ is created.
|
|||||||
FMMD analysis is applied to this {\fg} in table~\ref{tbl:diffampfinal}.
|
FMMD analysis is applied to this {\fg} in table~\ref{tbl:diffampfinal}.
|
||||||
%
|
%
|
||||||
\begin{table}[h+]
|
\begin{table}[h+]
|
||||||
\label{tbl:diffampfinal}
|
|
||||||
\caption{Difference Amplifier $DiffAMP$ : Failure Mode Effects Analysis: Single Faults} % title of Table
|
\caption{Difference Amplifier $DiffAMP$ : Failure Mode Effects Analysis: Single Faults} % title of Table
|
||||||
|
\label{tbl:diffampfinal} % always put laels after captions in tables
|
||||||
\centering % used for centering table
|
\centering % used for centering table
|
||||||
\begin{tabular}{||l|c|c|l|l||}
|
\begin{tabular}{||l|c|c|l|l||}
|
||||||
\hline \hline
|
\hline \hline
|
||||||
@ -688,10 +688,10 @@ The first order low pass filter is analysed in table~\ref{tbl:firstorderlpass}.\
|
|||||||
\textbf{cause} & \textbf{Low Pass Filter} & \\
|
\textbf{cause} & \textbf{Low Pass Filter} & \\
|
||||||
|
|
||||||
\hline
|
\hline
|
||||||
FS1: R10 SHORT & $No Filtering$ & $LPallpass$ \\ \hline
|
FS1: R10 SHORT & $No Filtering$ & $LPnofilter$ \\ \hline
|
||||||
FS2: R10 OPEN & $No Signal$ & $LPnosignal$ \\ \hline
|
FS2: R10 OPEN & $No Signal$ & $LPnosignal$ \\ \hline
|
||||||
FS3: C10 SHORT & $No Signal$ & $LPnosignal$ \\ \hline
|
FS3: C10 SHORT & $No Signal$ & $LPnosignal$ \\ \hline
|
||||||
FS4: C10 OPEN & $No Filtering$ & $LPallpass$ \\ \hline
|
FS4: C10 OPEN & $No Filtering$ & $LPnofilter$ \\ \hline
|
||||||
|
|
||||||
\hline
|
\hline
|
||||||
|
|
||||||
@ -742,7 +742,7 @@ from the $FirstOrderLP$ and the OpAmp component.
|
|||||||
TC2: $OPAMP$ LatchDown & Output Low & LP1Low \\
|
TC2: $OPAMP$ LatchDown & Output Low & LP1Low \\
|
||||||
TC3: $OPAMP$ No Operation & Output Low & LP1Low \\
|
TC3: $OPAMP$ No Operation & Output Low & LP1Low \\
|
||||||
TC4: $OPAMP$ Low Slew & Unwanted Low pass filtering & LP1filterincorrect \\ \hline
|
TC4: $OPAMP$ Low Slew & Unwanted Low pass filtering & LP1filterincorrect \\ \hline
|
||||||
TC5: $LPallpass $ & No low pass filtering & LP1filterincorrect \\
|
TC5: $LPnofilter $ & No low pass filtering & LP1filterincorrect \\
|
||||||
TC6: $LPnosignal $ & No input signal & LP1nosignal \\ \hline
|
TC6: $LPnosignal $ & No input signal & LP1nosignal \\ \hline
|
||||||
\hline
|
\hline
|
||||||
|
|
||||||
@ -803,7 +803,7 @@ results re-used for the next stage of analysis (see figure~\ref{fig:circuit2002_
|
|||||||
TC2: $OPAMP$ LatchDown & Output Low & SKLPLow \\
|
TC2: $OPAMP$ LatchDown & Output Low & SKLPLow \\
|
||||||
TC3: $OPAMP$ No Operation & Output Low & SKLPLow \\
|
TC3: $OPAMP$ No Operation & Output Low & SKLPLow \\
|
||||||
TC4: $OPAMP$ Low Slew & Unwanted Low pass filtering & SKLPfilterIncorrect \\ \hline
|
TC4: $OPAMP$ Low Slew & Unwanted Low pass filtering & SKLPfilterIncorrect \\ \hline
|
||||||
TC5: R1 OPEN & No input signal & SKLPfilterIncorrect \\
|
TC5: R1 OPEN & No input signal & SKLPnosignal \\
|
||||||
TC6: R1 SHORT & incorrect low pass filtering & SKLPfilterIncorrect \\ \hline
|
TC6: R1 SHORT & incorrect low pass filtering & SKLPfilterIncorrect \\ \hline
|
||||||
|
|
||||||
TC7: R2 OPEN & No input signal & SKLPnosignal \\
|
TC7: R2 OPEN & No input signal & SKLPnosignal \\
|
||||||
@ -1008,7 +1008,7 @@ These {\fgs} are used to describe the circuit in block diagram form with arrows
|
|||||||
\end{figure}
|
\end{figure}
|
||||||
|
|
||||||
Each of these {\fgs} are analysed to create failure mode models for them, and from these
|
Each of these {\fgs} are analysed to create failure mode models for them, and from these
|
||||||
determine {\dcs}.
|
{\dcs} determined.
|
||||||
|
|
||||||
\subsection{Inverting Amplifier: INVAMP}
|
\subsection{Inverting Amplifier: INVAMP}
|
||||||
%
|
%
|
||||||
@ -1038,7 +1038,7 @@ The {\fg} for the phase shifter consists of a resistor and a capacitor, $G_0 = \
|
|||||||
(FMMD analysis details in appendix~\ref{detail:PHS45}),
|
(FMMD analysis details in appendix~\ref{detail:PHS45}),
|
||||||
%
|
%
|
||||||
%
|
%
|
||||||
$$ fm (G_0) = \{ nosignal, 0\_phaseshift \} . $$
|
$$ fm (PHS45) = \{ nosignal, 0\_phaseshift \} . $$
|
||||||
%
|
%
|
||||||
\subsection{Non Inverting Buffer: NIBUFF.}
|
\subsection{Non Inverting Buffer: NIBUFF.}
|
||||||
%
|
%
|
||||||
@ -1212,7 +1212,7 @@ To complete the analysis we now bring the derived components $PHS135BUFFERED$ an
|
|||||||
and perform FMEA with these (see appendix~\ref{detail:BUBBAOSC}), to obtain a model for the Bubba Oscillator.
|
and perform FMEA with these (see appendix~\ref{detail:BUBBAOSC}), to obtain a model for the Bubba Oscillator.
|
||||||
%
|
%
|
||||||
$$
|
$$
|
||||||
fm (BUBBAOSC) = \{ HI_{osc}, NO\_signal .\} % LO_{fosc},
|
fm (BUBBAOSC) = \{ HI_{osc}, NO\_signal \} . % LO_{fosc},
|
||||||
$$
|
$$
|
||||||
%
|
%
|
||||||
%
|
%
|
||||||
@ -1251,7 +1251,7 @@ increases the potential for re-use. % of pre-analysed {\dcs}.
|
|||||||
%
|
%
|
||||||
A finer grained model---with potentially more hierarchy stages---also means that
|
A finer grained model---with potentially more hierarchy stages---also means that
|
||||||
%more work, or
|
%more work, or
|
||||||
more reasoning stages, i.e. FMMD analysis stages with their associated analysis reports, have been used in the analysis.
|
more reasoning stages, i.e. FMMD analysis stages with their associated analysis reports, have been created. % by the analysis.
|
||||||
% HTR The more we can modularise, the more we decimate the $O(N^2)$ effect
|
% HTR The more we can modularise, the more we decimate the $O(N^2)$ effect
|
||||||
% HTR of complexity comparison.
|
% HTR of complexity comparison.
|
||||||
%
|
%
|
||||||
@ -1273,7 +1273,8 @@ The lower reasoning distances, or complexity comparison figures are given in the
|
|||||||
in section~\ref{sec:bubbaCC}.
|
in section~\ref{sec:bubbaCC}.
|
||||||
%
|
%
|
||||||
This example demonstrates that the finer grained models
|
This example demonstrates that the finer grained models
|
||||||
benefit from lower reasoning distances for the failure mode model.
|
benefit from lower reasoning distances to determine
|
||||||
|
the failure mode model.
|
||||||
|
|
||||||
|
|
||||||
\clearpage
|
\clearpage
|
||||||
@ -1503,9 +1504,8 @@ These are:
|
|||||||
\begin{itemize}
|
\begin{itemize}
|
||||||
\item SUMJINT --- A summing junction and integrator,
|
\item SUMJINT --- A summing junction and integrator,
|
||||||
\item HISB --- A high impedance buffer,
|
\item HISB --- A high impedance buffer,
|
||||||
\item DIGITALBUFF --- A one bit digital buffer,
|
\item DIGBUF --- A digital one bit buffer/memory,
|
||||||
\item DL2AL --- A digital to analog level converter,
|
\item DL2AL --- A digital to analog level converter.
|
||||||
\item DIGBUF --- A digital one bit buffer/memory.
|
|
||||||
\end{itemize}
|
\end{itemize}
|
||||||
%
|
%
|
||||||
These {\dcs} follow the signal path shown in figure~\ref{fig:sigmadeltablock}.
|
These {\dcs} follow the signal path shown in figure~\ref{fig:sigmadeltablock}.
|
||||||
@ -2094,9 +2094,9 @@ resistor tolerance must be considered.
|
|||||||
Assuming the load resistors are fairly typical in terms of precision;
|
Assuming the load resistors are fairly typical in terms of precision;
|
||||||
taking a worst case of 1\% either way:
|
taking a worst case of 1\% either way:
|
||||||
%
|
%
|
||||||
$$ 5V.\frac{2k2*0.99}{2k2*1.01+2k2*0.99} = 2.475V $$
|
$$ 5V.\frac{2k2 \times 0.99}{2k2 \times 1.01+2k2 \times 0.99} = 2.475V $$
|
||||||
and
|
and
|
||||||
$$ 5V.\frac{2k2*1.01}{2k2*1.01+2k2*0.99} = 2.525V \; . $$
|
$$ 5V.\frac{2k2 \times 1.01}{2k2 \times 1.01+2k2 \times 0.99} = 2.525V \; . $$
|
||||||
%
|
%
|
||||||
These readings both lie outside the proscribed ranges.
|
These readings both lie outside the proscribed ranges.
|
||||||
Also the sense+ and sense- readings would have the same value.
|
Also the sense+ and sense- readings would have the same value.
|
||||||
@ -2187,7 +2187,7 @@ All the single failures have been analysed in the last section.
|
|||||||
%the failure modes, and then examine each one in detail with
|
%the failure modes, and then examine each one in detail with
|
||||||
%potential divider equation proofs.
|
%potential divider equation proofs.
|
||||||
%
|
%
|
||||||
Table \ref{tab:ptfmea2} lists all the combinations of double
|
Table \ref{tab:ptfmea2} lists all possible combinations of double
|
||||||
faults as FMMD test cases.
|
faults as FMMD test cases.
|
||||||
%and then hypothesises how the functional~group will react
|
%and then hypothesises how the functional~group will react
|
||||||
%under those conditions.
|
%under those conditions.
|
||||||
|
@ -277,7 +277,7 @@ for the system to be operating correctly the voltage should be within the above
|
|||||||
For the purpose of example the `C' programming language~\cite{DBLP:books/ph/KernighanR88} is used.
|
For the purpose of example the `C' programming language~\cite{DBLP:books/ph/KernighanR88} is used.
|
||||||
%
|
%
|
||||||
In 'C' a function is declared with parenthesis to
|
In 'C' a function is declared with parenthesis to
|
||||||
differentiate it from other type of variables (data types or pointers).
|
differentiate it from other types of variables (data types or pointers).
|
||||||
%
|
%
|
||||||
In this document this format is borrowed, hence the C~language
|
In this document this format is borrowed, hence the C~language
|
||||||
function called `main' would be presented as \cf{main}.
|
function called `main' would be presented as \cf{main}.
|
||||||
@ -339,7 +339,14 @@ int read_4_20_input ( int * value ) {
|
|||||||
\end{verbatim}
|
\end{verbatim}
|
||||||
%}
|
%}
|
||||||
%}\clearpage
|
%}\clearpage
|
||||||
|
%
|
||||||
|
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
|
||||||
|
% HP48G program to verify scaling
|
||||||
|
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
|
||||||
|
% << -> t
|
||||||
|
% << t .88 - 4.4 .88 - / 999 * >>
|
||||||
|
% >>
|
||||||
|
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
|
||||||
\caption{Software Function: \cf{read\_4\_20\_input}}
|
\caption{Software Function: \cf{read\_4\_20\_input}}
|
||||||
\label{fig:code_read_4_20_input}
|
\label{fig:code_read_4_20_input}
|
||||||
%\label{fig:420i}
|
%\label{fig:420i}
|
||||||
@ -888,7 +895,7 @@ the inputs and outputs of the associated software functions are also defined.
|
|||||||
%
|
%
|
||||||
The Yourdon methodology thus allows the refinement and modelling
|
The Yourdon methodology thus allows the refinement and modelling
|
||||||
of a process from a data~flow perspective
|
of a process from a data~flow perspective
|
||||||
defining software functions in its final stage.
|
defining software functions in its final stage (see figure~\ref{fig:contextsoftware}).
|
||||||
%, and
|
%, and
|
||||||
%this in terms of software functions.
|
%this in terms of software functions.
|
||||||
%
|
%
|
||||||
@ -1043,8 +1050,8 @@ $$fm (micro-controller) =\{ PROM\_FAULT, RAM\_FAULT, CPU\_FAULT, ALU\_FAULT, CLO
|
|||||||
\subsection{Temperature Controller Software Elements FMMD}
|
\subsection{Temperature Controller Software Elements FMMD}
|
||||||
Identified Software Components:
|
Identified Software Components:
|
||||||
\begin{itemize}
|
\begin{itemize}
|
||||||
\item --- \cf{Monitor} (which calls PID algorithm and sets status LEDS),
|
\item --- \cf{Monitor} (which calls \cf{PID},\cf{output\_control} and \cf{setLEDS}),
|
||||||
\item --- \cf{PID} (which calls \cf{determine\_set\_point\_error} and \cf{output\_control}),
|
\item --- \cf{PID} (which calls \cf{determine\_set\_point\_error} ),
|
||||||
\item --- \cf{determine\_set\_point\_error} (which calls \cf{convert\_ADC\_to\_T}),
|
\item --- \cf{determine\_set\_point\_error} (which calls \cf{convert\_ADC\_to\_T}),
|
||||||
\item --- \cf{convert\_ADC\_to\_T} (which calls \cf{read\_ADC}), % which has been analysed as the {\dc} read\_ADC which can be re-used.} % from the last example),
|
\item --- \cf{convert\_ADC\_to\_T} (which calls \cf{read\_ADC}), % which has been analysed as the {\dc} read\_ADC which can be re-used.} % from the last example),
|
||||||
\item --- \cf{read\_ADC} (analysed in the previous section~\ref{sec:readadc}),
|
\item --- \cf{read\_ADC} (analysed in the previous section~\ref{sec:readadc}),
|
||||||
@ -1228,6 +1235,8 @@ apply the demanded power.
|
|||||||
A {\fg} with the Heating element, a PWM module and the \cf{output\_control} function is formed to model this branch
|
A {\fg} with the Heating element, a PWM module and the \cf{output\_control} function is formed to model this branch
|
||||||
of the efferent flow.
|
of the efferent flow.
|
||||||
%
|
%
|
||||||
|
This {\fg} is a hardware/software hybrid.
|
||||||
|
%
|
||||||
FMMD analysis is applied to this {\fg} in table~\ref{tbl:heateroutput}.
|
FMMD analysis is applied to this {\fg} in table~\ref{tbl:heateroutput}.
|
||||||
%
|
%
|
||||||
For the \cf{output\_control} function, there is a pre-condition that the PWM module is
|
For the \cf{output\_control} function, there is a pre-condition that the PWM module is
|
||||||
@ -1253,7 +1262,7 @@ adding a safety relay to cut the power to the heater).
|
|||||||
\centering
|
\centering
|
||||||
\includegraphics[width=300pt]{./CH5_Examples/euler_heater_output.png}
|
\includegraphics[width=300pt]{./CH5_Examples/euler_heater_output.png}
|
||||||
% euler_heater_output.png: 392x141 pixel, 72dpi, 13.83x4.97 cm, bb=0 0 392 141
|
% euler_heater_output.png: 392x141 pixel, 72dpi, 13.83x4.97 cm, bb=0 0 392 141
|
||||||
\caption{Euler diagram showing HeaterOutput with its two hardware components, PWM and HEATER, and its software component output\_control.}
|
\caption{Euler diagram showing HeaterOutput with its two hardware components, PWM and HEATER, and its software component \cf{output\_control}.}
|
||||||
\label{fig:eulerheateroutput}
|
\label{fig:eulerheateroutput}
|
||||||
\end{figure}
|
\end{figure}
|
||||||
%
|
%
|
||||||
@ -1350,7 +1359,7 @@ as an Euler diagram in figure~\ref{fig:euler_temp_controller}.
|
|||||||
\centering
|
\centering
|
||||||
\includegraphics[width=400pt]{./CH5_Examples/euler_temp_controller.png}
|
\includegraphics[width=400pt]{./CH5_Examples/euler_temp_controller.png}
|
||||||
% euler_temp_controller.png: 714x251 pixel, 72dpi, 25.19x8.85 cm, bb=0 0 714 251
|
% euler_temp_controller.png: 714x251 pixel, 72dpi, 25.19x8.85 cm, bb=0 0 714 251
|
||||||
\caption{Euler diagram of the temperature controller final analysis stage, showing the hybrid software/hardware {\dcs} and the function at the head of the call tree `monitor'.}
|
\caption{Euler diagram of the temperature controller final analysis stage, showing the hybrid software/hardware {\dcs} and the function at the head of the call tree \cf{monitor}.}
|
||||||
\label{fig:euler_temp_controller}
|
\label{fig:euler_temp_controller}
|
||||||
\end{figure}
|
\end{figure}
|
||||||
%
|
%
|
||||||
|
@ -154,7 +154,7 @@ $ | G | $. %,
|
|||||||
%\paragraph{Defining Components}
|
%\paragraph{Defining Components}
|
||||||
$G$ is simply a sub-set of all possible components.
|
$G$ is simply a sub-set of all possible components.
|
||||||
%
|
%
|
||||||
The set of all components is $\mathcal{C}$; it can be can stated that is $G \subset \mathcal{C}$.
|
The set of all components is $\mathcal{C}$; it can be can stated that $G \subset \mathcal{C}$.
|
||||||
%
|
%
|
||||||
Individual components are denoted as $c$
|
Individual components are denoted as $c$
|
||||||
with additional indexing where appropriate.
|
with additional indexing where appropriate.
|
||||||
@ -228,7 +228,7 @@ An FMMD hierarchy consists of many {\fgs} which are subsets of $G$.
|
|||||||
FMMD analysis creates a hierarchy $\hh$ of {\fgs}. % where $\hh \subset \mathcal{FG}$.
|
FMMD analysis creates a hierarchy $\hh$ of {\fgs}. % where $\hh \subset \mathcal{FG}$.
|
||||||
\fmmdgloss
|
\fmmdgloss
|
||||||
%
|
%
|
||||||
Individual {\fgs} can be defined using with an index
|
Individual {\fgs} can be defined using an index
|
||||||
$i$ for identification and a superscript for the $\alpha$~level i.e. $FG^{\alpha}_{i}$ (see section~\ref{sec:alpha}).
|
$i$ for identification and a superscript for the $\alpha$~level i.e. $FG^{\alpha}_{i}$ (see section~\ref{sec:alpha}).
|
||||||
%
|
%
|
||||||
%---
|
%---
|
||||||
@ -257,7 +257,7 @@ An FMMD hierarchy will have reducing numbers of {\fgs} as the hierarchy is trave
|
|||||||
In order to calculate its comparison~complexity, equation~\ref{eqn:CC} must be applied to
|
In order to calculate its comparison~complexity, equation~\ref{eqn:CC} must be applied to
|
||||||
all {\fgs} on each level.
|
all {\fgs} on each level.
|
||||||
%
|
%
|
||||||
An FMMD hierarchy defined as a set of {\fgs}, $\hh$.
|
An FMMD hierarchy is defined as a set of {\fgs}, $\hh$.
|
||||||
% We define a helper function $g$ with a domain of the level $Level$ in an FMMD hierarchy $\hh$, and a
|
% We define a helper function $g$ with a domain of the level $Level$ in an FMMD hierarchy $\hh$, and a
|
||||||
% co-domain of a set of {\fgs} (specifically all the {\fgs} on the given level),
|
% co-domain of a set of {\fgs} (specifically all the {\fgs} on the given level),
|
||||||
% that returns
|
% that returns
|
||||||
@ -292,8 +292,8 @@ The comparison complexity function $CC$ is overloaded, to obtain the comparison
|
|||||||
\label{sec:theoreticalperfmodel}
|
\label{sec:theoreticalperfmodel}
|
||||||
\fmmdglossRD
|
\fmmdglossRD
|
||||||
%\pagebreak[4]
|
%\pagebreak[4]
|
||||||
The amplifier example from chapter~\ref{sec:chap4}, which has two
|
The $NONINVAMP$ example from chapter~\ref{sec:chap4}, which has two
|
||||||
stages, the potential divider and then the amplifier, is chosen as an example for comparison complexity.
|
analysis stages, the potential divider and then the amplifier, is chosen as an example for comparison complexity.
|
||||||
%
|
%
|
||||||
The complexities are added from
|
The complexities are added from
|
||||||
both these stages to determine how many reasoning paths there were to perform FMMD analysis on the
|
both these stages to determine how many reasoning paths there were to perform FMMD analysis on the
|
||||||
@ -313,7 +313,7 @@ number of reasoning paths to analyse the amplifier using FMMD.
|
|||||||
%
|
%
|
||||||
The potential divider has a {\cc} of four and the amplifier section a {\cc} of six.
|
The potential divider has a {\cc} of four and the amplifier section a {\cc} of six.
|
||||||
%
|
%
|
||||||
To analyse the inverting amplifier with FMMD it required 10 reasoning stages.
|
To analyse the inverting amplifier with FMMD a {\cc} of 10 was required.
|
||||||
%
|
%
|
||||||
Using traditional FMEA employing exhaustive checking ({\XFMEA})
|
Using traditional FMEA employing exhaustive checking ({\XFMEA})
|
||||||
$ 2 \times (3-1) + 2 \times (3-1) + 4 \times (3-1) = 16$ was obtained.
|
$ 2 \times (3-1) + 2 \times (3-1) + 4 \times (3-1) = 16$ was obtained.
|
||||||
@ -549,10 +549,10 @@ All the FMMD examples in chapters \ref{sec:chap5}
|
|||||||
and \ref{sec:chap6} showed a marked reduction in comparison
|
and \ref{sec:chap6} showed a marked reduction in comparison
|
||||||
complexity compared to {\XFMEA}. % worst case figures.
|
complexity compared to {\XFMEA}. % worst case figures.
|
||||||
%
|
%
|
||||||
To calculate {\XFMEA} comparison complexity equation~\ref{eqn:CC} is used.
|
To calculate {\XFMEA} the comparison complexity equation~\ref{eqn:CC} is used.
|
||||||
%
|
%
|
||||||
%
|
%
|
||||||
Complexity comparison vs. {\XFMEA} for the first three examples
|
Complexity comparison for FMMD vs. {\XFMEA} for the first three examples in chapter~\ref{sec:chap5}
|
||||||
are presented in the following table~\ref{tbl:firstcc}.
|
are presented in the following table~\ref{tbl:firstcc}.
|
||||||
%
|
%
|
||||||
%\usepackage{multirow}
|
%\usepackage{multirow}
|
||||||
@ -973,7 +973,7 @@ is no fault active in the functional~group under analysis.}
|
|||||||
and S itself.
|
and S itself.
|
||||||
%
|
%
|
||||||
The power-set concept is augmented here to deal with counting the number of
|
The power-set concept is augmented here to deal with counting the number of
|
||||||
combinations of failures to consider, under the conditions of simultaneous failures.
|
combinations of failures to consider under the conditions of simultaneous failures.
|
||||||
%
|
%
|
||||||
In order to consider combinations for the set S where the number of elements in
|
In order to consider combinations for the set S where the number of elements in
|
||||||
each subset of S is $N$ or less, a concept of the `cardinality constrained power-set'
|
each subset of S is $N$ or less, a concept of the `cardinality constrained power-set'
|
||||||
@ -1018,11 +1018,8 @@ C^n_k = {n \choose k} = \frac{n!}{k!(n-k)!} .
|
|||||||
\end{equation}
|
\end{equation}
|
||||||
%
|
%
|
||||||
To find the number of elements in a cardinality constrained subset S with up to $cc$ elements
|
To find the number of elements in a cardinality constrained subset S with up to $cc$ elements
|
||||||
in each combination sub-set,
|
in each combination sub-set, the sum of combinations must be added,
|
||||||
sum the combinations must be added,
|
from $1$ to $cc$ thus:
|
||||||
%subtracting $cc$ from the final result
|
|
||||||
%(repeated empty set counts)
|
|
||||||
from $1$ to $cc$ thus
|
|
||||||
%
|
%
|
||||||
%
|
%
|
||||||
% $$ {\sum}_{k = 1..cc} {\#S \choose k} = \frac{\#S!}{k!(\#S-k)!} $$
|
% $$ {\sum}_{k = 1..cc} {\#S \choose k} = \frac{\#S!}{k!(\#S-k)!} $$
|
||||||
@ -1531,7 +1528,7 @@ in the power-supply {\fg}.
|
|||||||
%this raises another issue for FMMD.
|
%this raises another issue for FMMD.
|
||||||
%
|
%
|
||||||
A de-coupling capacitor going $OPEN$ might not be considered relevant to
|
A de-coupling capacitor going $OPEN$ might not be considered relevant to
|
||||||
a power-supply module (but there might be additional noise on its output rails).
|
a power-supply module (even though there might be additional noise on its output rails).
|
||||||
%
|
%
|
||||||
But in {\fg} terms, the power supply now has a new symptom, that of $INTERFERENCE$.
|
But in {\fg} terms, the power supply now has a new symptom, that of $INTERFERENCE$.
|
||||||
%
|
%
|
||||||
|
@ -309,7 +309,7 @@ This section of the appendix contains FMEA tables for the {\sd}.
|
|||||||
FS5: $IC1$ $HIGH$ & & output perm. high & & HIGH \\
|
FS5: $IC1$ $HIGH$ & & output perm. high & & HIGH \\
|
||||||
FS6: $IC1$ $LOW$ & & output perm. low & & LOW \\ \hline
|
FS6: $IC1$ $LOW$ & & output perm. low & & LOW \\ \hline
|
||||||
FS7: $IC1$ $NOOP$ & & no current to drive C1 & & NO\_INTEGRATION \\
|
FS7: $IC1$ $NOOP$ & & no current to drive C1 & & NO\_INTEGRATION \\
|
||||||
FS8: $IC1$ $LOW\_SLEW$ & & signal delay to C1 & & NO\_INTEGRATION \\ \hline
|
FS8: $IC1$ $LOW\_SLEW$ & & signal delay to C1 & & NO\_INTEGRATION \\
|
||||||
|
|
||||||
FS9: $C1$ $OPEN$ & & no capacitance & & NO\_INTEGRATION \\
|
FS9: $C1$ $OPEN$ & & no capacitance & & NO\_INTEGRATION \\
|
||||||
FS10: $C1$ $SHORT$ & & no capacitance & & NO\_INTEGRATION \\ \hline
|
FS10: $C1$ $SHORT$ & & no capacitance & & NO\_INTEGRATION \\ \hline
|
||||||
@ -497,7 +497,7 @@ $$
|
|||||||
%\hline
|
%\hline
|
||||||
FS3: $DL2AL$ $LOW$ & & output perm. high & & $OUTPUT STUCK$ \\
|
FS3: $DL2AL$ $LOW$ & & output perm. high & & $OUTPUT STUCK$ \\
|
||||||
FS4: $DL2AL$ $HIGH$ & & output perm. low & & $OUTPUT STUCK$ \\
|
FS4: $DL2AL$ $HIGH$ & & output perm. low & & $OUTPUT STUCK$ \\
|
||||||
FS5: $DL2AL$ $LOW\_SLEW$ & & no current drive & & $LOW\_SLEW$ \\ \hline
|
FS5: $DL2AL$ $LOW\_SLEW$ & & slow reaction to input & & $LOW\_SLEW$ \\ \hline
|
||||||
|
|
||||||
|
|
||||||
\hline
|
\hline
|
||||||
@ -584,7 +584,7 @@ FMMD analysis tables from chapter~\ref{sec:chap6}.
|
|||||||
|
|
||||||
|
|
||||||
|
|
||||||
FC3: $RADC_{HIGH}$ & voltage value & $VAL\_ERR$ \\
|
FC3: $RADC_{HIGH}$ & voltage value & $VOLTAGE\_HIGH$ \\
|
||||||
& incorrect & \\ \hline
|
& incorrect & \\ \hline
|
||||||
|
|
||||||
|
|
||||||
@ -681,7 +681,7 @@ $$
|
|||||||
|
|
||||||
The error value being discussed here is an important concept in PID control.
|
The error value being discussed here is an important concept in PID control.
|
||||||
It represents how far from the control target
|
It represents how far from the control target
|
||||||
the measured reading of it is.
|
the measured reading is.
|
||||||
The lower the PID error value the closer to the controlled systems target/desired value.
|
The lower the PID error value the closer to the controlled systems target/desired value.
|
||||||
|
|
||||||
{
|
{
|
||||||
|
@ -57,7 +57,7 @@ Further I thank her for encouraging me to apply for the PhD. %% PITY SHE DID NOT
|
|||||||
%
|
%
|
||||||
I am deeply thankful to the directors of {\etc} not only for
|
I am deeply thankful to the directors of {\etc} not only for
|
||||||
funding this course, but providing training and work experience in the
|
funding this course, but providing training and work experience in the
|
||||||
field of safety critical engineering, and giving me Friday
|
field of safety critical engineering and giving me Friday
|
||||||
afternoons to pursue my studies.
|
afternoons to pursue my studies.
|
||||||
%
|
%
|
||||||
At Energy~Technology~Control, the following people gave encouragement, and
|
At Energy~Technology~Control, the following people gave encouragement, and
|
||||||
|
Loading…
Reference in New Issue
Block a user