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@ -57,6 +57,7 @@ the higher SIL rating we can demand for it.
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A band-saw with one operative may require a SIL rating of 1,
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A band-saw with one operative may require a SIL rating of 1,
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a nuclear power-station, with far greater consequences on dangerous failure
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a nuclear power-station, with far greater consequences on dangerous failure
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may require a SIL rating of 4.
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may require a SIL rating of 4.
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%
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What we are saying is that while we may tolerate a low incidence of failure on a band-saw,
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What we are saying is that while we may tolerate a low incidence of failure on a band-saw,
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we will only tolerate extremely low incidences of failure in nuclear plant.
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we will only tolerate extremely low incidences of failure in nuclear plant.
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SIL ratings give us another objective yardstick for the measurement of system safety.
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SIL ratings give us another objective yardstick for the measurement of system safety.
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@ -128,7 +129,7 @@ effectively meant that all single and double component failures
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now required to be analysed. This, from a state explosion problem alone,
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now required to be analysed. This, from a state explosion problem alone,
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meant that it was going to be virtually impossible to perform.
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meant that it was going to be virtually impossible to perform.
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%
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%
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To compound the problem %state explosion problem
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To compound the problem, %state explosion problem
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FMEA has a deficiency of repeated work, as each component failure is typically represented
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FMEA has a deficiency of repeated work, as each component failure is typically represented
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by one line or entry in a spreadsheet~\cite{bfmea}; analysis on repeated sections of
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by one line or entry in a spreadsheet~\cite{bfmea}; analysis on repeated sections of
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circuitry (for instance repeated 4-20mA outputs on a PCB) meant that
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circuitry (for instance repeated 4-20mA outputs on a PCB) meant that
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@ -57,7 +57,7 @@ loop topology---using a `Bubba' oscillator---demonstrating how FMMD differs from
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Two analysis strategies are employed, one using
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Two analysis strategies are employed, one using
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initially identified {\fgs} and the second using a more complex hierarchy of %{\fgs} and
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initially identified {\fgs} and the second using a more complex hierarchy of %{\fgs} and
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{\dcs} showing
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{\dcs} showing
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that a finer grained/more de-composed approach offers more re-use possibilities in future analysis tasks.
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that a finer grained/more decomposed approach offers more re-use possibilities in future analysis tasks.
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%
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%
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\item Section~\ref{sec:sigmadelta} demonstrates FMMD can be applied to mixed analogue and digital circuitry
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\item Section~\ref{sec:sigmadelta} demonstrates FMMD can be applied to mixed analogue and digital circuitry
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by applying FMMD to a sigma delta ADC.
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by applying FMMD to a sigma delta ADC.
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@ -570,7 +570,7 @@ inverting amplifier (i.e. the same failure modes for the {\dc} INVAMP).
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All FMEA is performed in the context of the environment and functionality of the enitity
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All FMEA is performed in the context of the environment and functionality of the enitity
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under analysis.
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under analysis.
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This example shows that for the condition where the input voltage
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This example shows that for the condition where the input voltage
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is constrained to being positive, we can apply two levels of de-composition.
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is constrained to being positive, we can apply two levels of decomposition.
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For the unconstrained case, we have to consider all three components as one larger {\fg}.
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For the unconstrained case, we have to consider all three components as one larger {\fg}.
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% METRICS The complexity comparison figures
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% METRICS The complexity comparison figures
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@ -594,7 +594,7 @@ For the unconstrained case, we have to consider all three components as one larg
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\label{sec:diffamp}
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\label{sec:diffamp}
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\begin{figure}[h]
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\begin{figure}[h]
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\centering
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\centering
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\includegraphics[width=370pt]{CH5_Examples/circuit1001.png}
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\includegraphics[width=400pt]{CH5_Examples/circuit1001.png}
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% circuit1001.png: 420x300 pixel, 72dpi, 14.82x10.58 cm, bb=0 0 420 300
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% circuit1001.png: 420x300 pixel, 72dpi, 14.82x10.58 cm, bb=0 0 420 300
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\caption{Circuit 1}
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\caption{Circuit 1}
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\label{fig:circuit1}
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\label{fig:circuit1}
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@ -815,7 +815,7 @@ Here it is more intuitive to model the resistors not as a potential divider, but
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& (impedance of IC1 vs +V2) & \\ \hline
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& (impedance of IC1 vs +V2) & \\ \hline
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TC5: $R4\_open$ & High or Low output & AMPIncorrectOutput \\
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TC5: $R4\_open$ & High or Low output & AMPIncorrectOutput \\
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& +V2$>$+V1 $\mapsto$ High & \\
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& +V2$>$+V1 $\mapsto$ High & \\
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& +V1$>$+V2 $\mapsto$ Low & \\
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& +V1$>$+V2 $\mapsto$ Low & \\ \hline
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TC6: $R4\_short$ & +V2 follower & AMPIncorrectOutput \\ \hline
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TC6: $R4\_short$ & +V2 follower & AMPIncorrectOutput \\ \hline
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%TC7: $R_2$ OPEN & LOW & & LowPD \\ \hline
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%TC7: $R_2$ OPEN & LOW & & LowPD \\ \hline
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\hline
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\hline
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@ -838,7 +838,7 @@ $$ fm(SEC\_AMP) = \{ AMPHigh, AMPLow, LowPass, AMPIncorrectOutput \} .$$
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\pagebreak[4]
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\pagebreak[4]
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\subsection{Final stage of the $DiffAmp$ Analysis}
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\subsection{Final stage of the $DiffAmp$ Analysis}
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For the final stage we create a functional group consisting of
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For the final stage we create a {\fg} consisting of
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two derived components of the type $NI\_AMP$ and $SEC\_AMP$.
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two derived components of the type $NI\_AMP$ and $SEC\_AMP$.
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We apply FMMD analysis to this {\fg} in table~\ref{tbl:diffampfinal}.
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We apply FMMD analysis to this {\fg} in table~\ref{tbl:diffampfinal}.
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%
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%
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@ -888,7 +888,7 @@ re-construct an FTA diagram from the information in this graph.
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We merely have to choose a top level event and work down using $XOR$ gates.}.
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We merely have to choose a top level event and work down using $XOR$ gates.}.
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%
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%
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This circuit performs poorly from a safety point of view.
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This circuit performs poorly from a safety point of view.
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Its failure modes could be indistinguishable from valid readings (especially
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Its failure modes could be undetectable, i.e. indistinguishable from valid readings (especially
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when it becomes a V2 follower).
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when it becomes a V2 follower).
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\begin{figure}[h]
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\begin{figure}[h]
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@ -916,6 +916,12 @@ This example shows a three stages hierarchy, and a graph tracing the base~compon
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top level event. It also re-visits the decisions about membership of {\fgs}, due to the context
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top level event. It also re-visits the decisions about membership of {\fgs}, due to the context
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of the circuit raised in section~\ref{subsec:invamp2}.
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of the circuit raised in section~\ref{subsec:invamp2}.
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%16MAR2013 COULD Put an euler diagram here
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\clearpage
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\clearpage
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\section{Five Pole Low Pass Filter, using two Sallen~Key stages.}
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\section{Five Pole Low Pass Filter, using two Sallen~Key stages.}
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\label{sec:fivepolelp}
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\label{sec:fivepolelp}
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@ -969,7 +975,7 @@ read its output signal.
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However, from a failure mode perspective we can analyse it in a very similar way
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However, from a failure mode perspective we can analyse it in a very similar way
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to a potential divider (see section~\ref{subsec:potdiv}).
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to a potential divider (see section~\ref{subsec:potdiv}).
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Capacitors generally fail OPEN but some types fail OPEN and SHORT.
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Capacitors generally fail OPEN but some types fail OPEN and SHORT.
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We will consider the worst case two failure mode model for this analysis.
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We will consider the worst case: a two failure mode model for this analysis.
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We analyse the first order low pass filter in table~\ref{tbl:firstorderlpass}.\\
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We analyse the first order low pass filter in table~\ref{tbl:firstorderlpass}.\\
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@ -1041,7 +1047,7 @@ We can create a derived component for it, lets call it $LP1$.
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$$ fm(LP1) = \{ LP1High, LP1Low, LP1filterincorrect, LP1nosignal \} $$
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$$ fm(LP1) = \{ LP1High, LP1Low, LP1filterincorrect, LP1nosignal \} $$
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In terms of the circuit, we have modelled the functional groups $FirstOrderLP$, and
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In terms of the circuit, we have modelled the {\fgs} $FirstOrderLP$, and
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$LP1$. We can represent these on the circuit diagram by drawing contours around the components
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$LP1$. We can represent these on the circuit diagram by drawing contours around the components
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on the schematic as in figure~\ref{fig:circuit2002_LP1}.
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on the schematic as in figure~\ref{fig:circuit2002_LP1}.
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@ -1049,7 +1055,7 @@ on the schematic as in figure~\ref{fig:circuit2002_LP1}.
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\centering
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\centering
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\includegraphics[width=200pt,keepaspectratio=true]{CH5_Examples/circuit2002_LP1.png}
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\includegraphics[width=200pt,keepaspectratio=true]{CH5_Examples/circuit2002_LP1.png}
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% circuit2002_LP1.png: 575x331 pixel, 72dpi, 20.28x11.68 cm, bb=0 0 575 331
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% circuit2002_LP1.png: 575x331 pixel, 72dpi, 20.28x11.68 cm, bb=0 0 575 331
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\caption{Circuit showing functional groups modelled so far.}
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\caption{Circuit showing {\fgs} modelled so far.}
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\label{fig:circuit2002_LP1}
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\label{fig:circuit2002_LP1}
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\end{figure}
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\end{figure}
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@ -1120,7 +1126,7 @@ We can index the Sallen Key stages, and these are marked on the circuit schemati
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\centering
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\centering
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\includegraphics[width=200pt]{CH5_Examples/circuit2002_FIVEPOLE.png}
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\includegraphics[width=200pt]{CH5_Examples/circuit2002_FIVEPOLE.png}
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% circuit2002_FIVEPOLE.png: 575x331 pixel, 72dpi, 20.28x11.68 cm, bb=0 0 575 331
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% circuit2002_FIVEPOLE.png: 575x331 pixel, 72dpi, 20.28x11.68 cm, bb=0 0 575 331
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\caption{Functional Groups in Five Pole Low Pass Filter: shown as an Euler diagram super-imposed onto the electrical schematic.}
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\caption{Functional Groupings in Five Pole Low Pass Filter: shown as an Euler diagram super-imposed onto the electrical schematic.}
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\label{fig:circuit2002_FIVEPOLE}
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\label{fig:circuit2002_FIVEPOLE}
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\end{figure}
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\end{figure}
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@ -1196,7 +1202,7 @@ We represent the desired FMMD hierarchy in figure~\ref{fig:circuit2h}.
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We now can create a {\dc} to represent the circuit in figure~\ref{fig:circuit2}, we call this
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We now can create a {\dc} to represent the circuit in figure~\ref{fig:circuit2}, we call this
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$FivePoleLP$: applying the $fm$ function (see table~\ref{tbl:fivepole})
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$FivePoleLP$: applying the $fm$ function (see table~\ref{tbl:fivepole})
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yields $fm(FivePoleLP) = \{ HIGH, LOW, FilterIncorrect, NO\_SIGNAL \}$.
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yields $$fm(FivePoleLP) = \{ HIGH, LOW, FilterIncorrect, NO\_SIGNAL \}.$$
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%\pagebreak[4]
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%\pagebreak[4]
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@ -1259,7 +1265,7 @@ However, this is not a problem for FMMD, as {\fgs} are readily identifiable.
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% METRICS We now create FMMD models and compare the complexity of FMMD and FMEA.
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% METRICS We now create FMMD models and compare the complexity of FMMD and FMEA.
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%
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%
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%We start the FMMD process by determining {\fgs}.
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%We start the FMMD process by determining {\fgs}.
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We initially identify three types of functional groups, an inverting amplifier (analysed in section~\ref{fig:invamp}),
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We initially identify three types of {\fgs}, an inverting amplifier (analysed in section~\ref{fig:invamp}),
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a 45 degree phase shifter (a {$10k\Omega$} resistor and a $10nF$ capacitor) and a non-inverting buffer
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a 45 degree phase shifter (a {$10k\Omega$} resistor and a $10nF$ capacitor) and a non-inverting buffer
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amplifier. We can name these $INVAMP$, $PHS45$ and $NIBUFF$ respectively.
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amplifier. We can name these $INVAMP$, $PHS45$ and $NIBUFF$ respectively.
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We can use these {\fgs} to describe the circuit in block diagram form with arrows indicating the signal path, in figure~\ref{fig:bubbablock}.
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We can use these {\fgs} to describe the circuit in block diagram form with arrows indicating the signal path, in figure~\ref{fig:bubbablock}.
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@ -1290,7 +1296,7 @@ This consists of a resistor and a capacitor. We already have failure mode models
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we now need to see how these failure modes would affect the phase shifter. Note that the circuit here
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we now need to see how these failure modes would affect the phase shifter. Note that the circuit here
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is identical to the low pass filter in circuit topology (see section~\ref{sec:lp}), but its intended use is different.
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is identical to the low pass filter in circuit topology (see section~\ref{sec:lp}), but its intended use is different.
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We have to analyse this circuit from the perspective of it being a {\em phase~shifter} not a {\em low~pass~filter}.
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We have to analyse this circuit from the perspective of it being a {\em phase~shifter} not a {\em low~pass~filter}.
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Our functional group for the phase shifter consists of a resistor and a capacitor, $G_0 = \{ R, C \}$
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Our {\fg} for the phase shifter consists of a resistor and a capacitor, $G_0 = \{ R, C \}$
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(FMMD analysis details at section~\ref{detail:PHS45})
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(FMMD analysis details at section~\ref{detail:PHS45})
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@ -1314,7 +1320,7 @@ $$ fm(NIBUFF) = fm(OPAMP) = \{L\_{up}, L\_{dn}, Noop, L\_slew \} . $$
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% describe what we are doing, a buffered 45 degree phase shift element
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% describe what we are doing, a buffered 45 degree phase shift element
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\subsection{Bringing the functional Groups Together: FMMD model of the `Bubba' Oscillator.}
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\subsection{Bringing the {\fgs} Together: FMMD model of the `Bubba' Oscillator.}
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We could at this point bring all the {\dcs} together into one large functional
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We could at this point bring all the {\dcs} together into one large functional
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group (see figure~\ref{fig:bubbaeuler1}) %{fig:poss1finalbubba})
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group (see figure~\ref{fig:bubbaeuler1}) %{fig:poss1finalbubba})
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@ -1323,7 +1329,7 @@ Initially we use the first identified {\fgs} to create our model without further
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\subsection{FMMD Analysis using initially identified functional groups}
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\subsection{FMMD Analysis using initially identified {\fgs}}
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\label{sec:bubba1}
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\label{sec:bubba1}
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Our {\fg} for this analysis can be expressed thus:
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Our {\fg} for this analysis can be expressed thus:
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%
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%
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@ -1367,7 +1373,7 @@ $$ fm(BubbaOscillator) = \{ NO_{osc}, HI_{fosc}\} . $$ %, LO_{fosc} \} . $$
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%of $468$ failure modes to check against components.
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%of $468$ failure modes to check against components.
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%However,
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%However,
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The analysis here appears top-heavy; we should be able to refine the model more
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The analysis here appears top-heavy; we should be able to refine the model more
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and break this down into smaller functional groups by allowing more stages of hierarchy.
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and break this down into smaller {\fgs} by allowing more stages of hierarchy.
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%and hopefully
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%and hopefully
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%this should lead a further reduction in the complexity comparison figure.
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%this should lead a further reduction in the complexity comparison figure.
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By decreasing the size of the modules with further refinement,
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By decreasing the size of the modules with further refinement,
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@ -1379,7 +1385,7 @@ we may also discover new derived components that may be of use for other analyse
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\subsection{FMMD Analysis of Bubba Oscillator using a finer grained modular approach (i.e. more hierarchical stages)}
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\subsection{FMMD Analysis of Bubba Oscillator using a finer grained modular approach (i.e. more hierarchical stages)}
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\label{sec:bubba2}
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\label{sec:bubba2}
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The example above---from the initial {\fgs}---used one very large functional group to model the circuit.
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The example above---from the initial {\fgs}---used one very large {\fg} to model the circuit.
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%This mean a quite large comparison complexity for this final stage.
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%This mean a quite large comparison complexity for this final stage.
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We should be able to determine smaller {\fgs} and refine the model further.
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We should be able to determine smaller {\fgs} and refine the model further.
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@ -1395,7 +1401,7 @@ We should be able to determine smaller {\fgs} and refine the model further.
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\centering
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\centering
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\includegraphics[width=400pt]{./CH5_Examples/bubba_euler_2.png}
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\includegraphics[width=400pt]{./CH5_Examples/bubba_euler_2.png}
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% bubba_euler_2.png: 1241x617 pixel, 72dpi, 43.78x21.77 cm, bb=0 0 1241 617
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% bubba_euler_2.png: 1241x617 pixel, 72dpi, 43.78x21.77 cm, bb=0 0 1241 617
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\caption{Euler diagram showing functional groupings for the Bubba oscillator using a more de-composed approach.}
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\caption{Euler diagram showing {\fgs} for the Bubba oscillator using a more decomposed approach.}
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\label{fig:bubbaeuler2}
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\label{fig:bubbaeuler2}
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\end{figure}
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\end{figure}
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@ -1413,7 +1419,7 @@ $45^{\circ}$ phase shifter circuits in series. Together these apply a $135^{\cir
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We use this property to model a higher level {\dc}, that of a $135^{\circ}$ phase shifter.
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We use this property to model a higher level {\dc}, that of a $135^{\circ}$ phase shifter.
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%
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%
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The three $BUFF45$ {\dcs} form a
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The three $BUFF45$ {\dcs} form a
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functional group which is analysed in table~\ref{tbl:phs135buffered}.
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{\fg} which is analysed in table~\ref{tbl:phs135buffered}.
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The result of this analysis is the {\dc}
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The result of this analysis is the {\dc}
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$PHS135BUFFERED$ which represents an actively buffered $135^{\circ}$ phase shifter.
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$PHS135BUFFERED$ which represents an actively buffered $135^{\circ}$ phase shifter.
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%
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%
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@ -1427,7 +1433,7 @@ providing an amplified $225^{\circ}$ phase shift, analysed in table~\ref{tbl:phs
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resulting in the {\dc} $PHS225AMP$.
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resulting in the {\dc} $PHS225AMP$.
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Applying FMMD we create a derived component $PHS225AMP$ which has the following failure modes:
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Applying FMMD we create a derived component $PHS225AMP$ which has the following failure modes:
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$$
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$$
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fm (PHS225AMP) = \{ 180\_phaseshift, NO\_signal .\} % 270\_phaseshift,
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fm (PHS225AMP) = \{ 180\_phaseshift, NO\_signal \}. % 270\_phaseshift,
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$$
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$$
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%
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%
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%---with the remaining $PHS45$ and the $INVAMP$ (re-used from section~\ref{sec:invamp})in a second group $PHS225AMP$---
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%---with the remaining $PHS45$ and the $INVAMP$ (re-used from section~\ref{sec:invamp})in a second group $PHS225AMP$---
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@ -1467,7 +1473,7 @@ The $PHS225AMP$ consists of a $PHS45$, providing $45^{\circ}$ of phase shift, an
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$INVAMP$, providing $180^{\circ}$ giving a total of $225^{\circ}$.
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$INVAMP$, providing $180^{\circ}$ giving a total of $225^{\circ}$.
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Detailed FMMD analysis may be found in section~\ref{detail:PHS225AMP}.
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Detailed FMMD analysis may be found in section~\ref{detail:PHS225AMP}.
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%
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%
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%
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%
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%
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%$$ CC(PHS225AMP) = 7 \times 1 $$
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%$$ CC(PHS225AMP) = 7 \times 1 $$
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%
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%
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@ -1481,10 +1487,7 @@ and perform FMEA with these (see section~\ref{detail:BUBBAOSC}), to obtain a mod
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$$
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$$
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fm (BUBBAOSC) = \{ HI_{osc}, NO\_signal .\} % LO_{fosc},
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fm (BUBBAOSC) = \{ HI_{osc}, NO\_signal .\} % LO_{fosc},
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$$
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$$
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%
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%
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%
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%We could trace the DAGs here and ensure that both analysis strategies worked ok.....
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%We could trace the DAGs here and ensure that both analysis strategies worked ok.....
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%
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%
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@ -1500,7 +1503,7 @@ $$
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% and $250$ for our first stage functional groups analysis.
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% and $250$ for our first stage functional groups analysis.
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% This has meant a drastic reduction in the number of failure-modes to check against components.
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% This has meant a drastic reduction in the number of failure-modes to check against components.
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%It has %also
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%It has %also
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This more de-composed approach has
|
This more decomposed approach has
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given us five {\dcs}, building blocks, which could %
|
given us five {\dcs}, building blocks, which could %
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||||||
be re-used in other projects.
|
be re-used in other projects.
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%potentially be re-used for similar circuitry
|
%potentially be re-used for similar circuitry
|
||||||
@ -1511,7 +1514,7 @@ be re-used in other projects.
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|||||||
%
|
%
|
||||||
%In general with large functional groups the comparison complexity
|
%In general with large functional groups the comparison complexity
|
||||||
%is higher, by an order of $O(N^2)$.
|
%is higher, by an order of $O(N^2)$.
|
||||||
Smaller functional groups signify less by-hand checks and
|
Smaller {\fgs} signify less by-hand checks and
|
||||||
a more finely grained model.
|
a more finely grained model.
|
||||||
This means that
|
This means that
|
||||||
there would be more {\dcs} and therefore increases the potential for re-use of pre-analysed {\dcs}.
|
there would be more {\dcs} and therefore increases the potential for re-use of pre-analysed {\dcs}.
|
||||||
@ -1607,14 +1610,14 @@ The parts for the \sd are a mixture of analogue (resistors, capacitors, OpAmps)
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|||||||
(D type flip flop, and a digital clock). We examine the failure modes of all components in this circuit below.
|
(D type flip flop, and a digital clock). We examine the failure modes of all components in this circuit below.
|
||||||
%
|
%
|
||||||
IC1,IC2 and IC3 are all OpAmps and we have failure modes for this component type
|
IC1,IC2 and IC3 are all OpAmps and we have failure modes for this component type
|
||||||
from section~\ref{sec:opamp_fms}.
|
from section~\ref{sec:opamp_fms}:
|
||||||
%
|
%
|
||||||
$$ fm(OPAMP) = \{ HIGH, LOW, NOOP, LOW\_SLEW \} $$
|
$$ fm(OPAMP) = \{ HIGH, LOW, NOOP, LOW\_SLEW \}. $$
|
||||||
%
|
%
|
||||||
We examine the literature for a failure model for the D-type flip flop~\cite{fmd91}[3-105], for example the CD4013B~\cite{cd4013},
|
We examine the literature for a failure model for the D-type flip flop~\cite{fmd91}[3-105], for example the CD4013B~\cite{cd4013},
|
||||||
and obtain its failure modes, which we can express using the $fm$ function:
|
and obtain its failure modes, which we can express using the $fm$ function:
|
||||||
%%
|
%%
|
||||||
$$ fm ( CD4013B) = \{ HIGH, LOW, NOOP \} $$
|
$$ fm ( CD4013B) = \{ HIGH, LOW, NOOP \}. $$
|
||||||
%
|
%
|
||||||
The resistors and capacitor failure modes we take from EN298~\cite{en298}[An.A].
|
The resistors and capacitor failure modes we take from EN298~\cite{en298}[An.A].
|
||||||
We express the failure modes for the resistors (R) and capacitors (C) thus:
|
We express the failure modes for the resistors (R) and capacitors (C) thus:
|
||||||
@ -1802,7 +1805,7 @@ $$ fm(BISJ) = \{ OUTPUT STUCK , REDUCED\_INTEGRATION \} . $$
|
|||||||
%$$ fm (DL2AL^2) = \{ LOW, HIGH, LOW\_SLEW \} $$
|
%$$ fm (DL2AL^2) = \{ LOW, HIGH, LOW\_SLEW \} $$
|
||||||
%$$ fm ( CD4013B) = \{ HIGH, LOW, NOOP \} $$
|
%$$ fm ( CD4013B) = \{ HIGH, LOW, NOOP \} $$
|
||||||
|
|
||||||
The functional group formed by $DIGBUF$ and $DL2AL$ takes the flip flop clocked and buffered
|
The {\fg} formed by $DIGBUF$ and $DL2AL$ takes the flip flop clocked and buffered
|
||||||
value, and outputs it at analogue voltage levels for the summing junction.
|
value, and outputs it at analogue voltage levels for the summing junction.
|
||||||
|
|
||||||
$ FG = \{ DIGBUF, DL2AL \} $
|
$ FG = \{ DIGBUF, DL2AL \} $
|
||||||
@ -1816,7 +1819,7 @@ where $$fm (FFB) = \{OUTPUT STUCK, LOW\_SLEW\}$$.
|
|||||||
|
|
||||||
We now have two {\dcs}, $FFB$ and $BISJ$.
|
We now have two {\dcs}, $FFB$ and $BISJ$.
|
||||||
These together represent all base components within this circuit.
|
These together represent all base components within this circuit.
|
||||||
We form a final functional group with these:
|
We form a final {\fg} with these:
|
||||||
$$ FG = \{ FFB , BISJ \} .$$
|
$$ FG = \{ FFB , BISJ \} .$$
|
||||||
We analyse the buffered {\sd} circuit using FMMD (see section~\ref{detail:SDADC}).
|
We analyse the buffered {\sd} circuit using FMMD (see section~\ref{detail:SDADC}).
|
||||||
%in table~\ref{tbl:sdadc}.
|
%in table~\ref{tbl:sdadc}.
|
||||||
@ -1843,7 +1846,7 @@ We now show the final {\dc} hierarchy in figure~\ref{fig:eulersdfinal}.
|
|||||||
% \label{fig:sdadc}
|
% \label{fig:sdadc}
|
||||||
% \end{figure}
|
% \end{figure}
|
||||||
|
|
||||||
\clearpage
|
%\clearpage
|
||||||
% ]
|
% ]
|
||||||
% into
|
% into
|
||||||
%
|
%
|
||||||
|
Loading…
Reference in New Issue
Block a user