FMECA added
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@ -864,7 +864,7 @@ to expand: Cuts sets and minimal cut sets. show example of detection of mimimal
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\clearpage
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\section{Assisting FMEA reports from the DAG}
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\section{Extracting/Assisting in FMEA reports from the DAG}
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A design FMEA, or potential failure mode and effects analysis
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will typically require the designer to look at the possible effects
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@ -908,10 +908,16 @@ reasoning process behind it, which leads to the symptom.
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We have from the DAG model, a direct path from each component failure
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mode to top-level symptoms. This allows us to partially fill in
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the FMEA report. The detectability and severity of the symptom
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are subjective. Given component failure rates, the probability
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are subjective.
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The $det$ value could influenced by factors such as features only used by a small percentage
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of users of a product. In this case the detcability of the problem would be smaller
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as many users would not activate/use the feature~\cite{bfmea}.
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%strange is'nt it.
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Given component failure rates, the probability
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of the the potential cause occurring can be calculated, given suitable
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component failure mode statistical references (e.g. FMD-91~\cite{fmd91} and MIL1991~\cite{mil1991}).
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As these can be determined, they are represented by $Stat()$ in the table~\ref{ampfmea}.
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\begin{table}[ht]
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\caption{Non Inverting Amplifier: Failure Mode Effects Analysis: Single Faults} % title of Table
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\centering % used for centering table
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@ -920,15 +926,15 @@ component failure mode statistical references (e.g. FMD-91~\cite{fmd91} and MIL1
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\textbf{Item} & \textbf{Potential Failure} & \textbf{ Sev } & \textbf{Potential} & \textbf{prob} & \textbf{det} & \textbf{RPN} \\
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\textbf{Function} & \textbf{mode} & \textbf{ /cost }& \textbf{Cause} & \textbf{/occ } & \textbf{} & \\\hline
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\hline
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Non Inverting & $AMP_{high}$ & & $R1_{short} $ & & & \\
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Amplifier & $AMP_{low}$ & & $R1_{open} $ & & & \\
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Circuit & $AMP_{low}$ & & $R2_{short} $ & & & \\
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& $AMP_{high}$ & & $R2_{open}$ & & & \\
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Non Inverting & $AMP_{high}$ & & $R1_{short} $ & $Stat(R1_{short}) $ & & \\
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Amplifier & $AMP_{low}$ & & $R1_{open} $ & $Stat(R1_{open}) $ & & \\
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Circuit & $AMP_{low}$ & & $R2_{short} $ & $Stat(R2_{short}) $ & & \\
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& $AMP_{high}$ & & $R2_{open}$ & $Stat(R2_{open})$ & & \\
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& $AMP_{lowpass}$ & & $OPAMP_{lowslew}$ & & & \\
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& $AMP_{low}$ & & $OPAMP_{latchdown}$ & & & \\
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& $AMP_{high}$ & & $OPAMP_{latchup}$ & & & \\
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& $AMP_{low}$ & & $OPAMP_{noop} $ & & & \\
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& $AMP_{lowpass}$ & & $OPAMP_{lowslew}$ & $Stat(OPAMP_{lowslew})$ & & \\
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& $AMP_{low}$ & & $OPAMP_{latchdown}$ & $Stat(OPAMP_{latchdown})$ & & \\
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& $AMP_{high}$ & & $OPAMP_{latchup}$ & $Stat(OPAMP_{latchup})$ & & \\
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& $AMP_{low}$ & & $OPAMP_{noop} $ & $Stat(OPAMP_{noop}) $ & & \\
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\hline
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@ -949,11 +955,61 @@ to expand: Each FMEA looses the reasoning in the FMMD Hierarchy/DAG for linking
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the symptoms to the potential causes.
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FMEA can miss symptoms especially where a component failure mode may cause more than one top-level symptom.
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\section{Extracting/Assisting in FMECA from the DAG}
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Work out the alpha and beta values !!!
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FMECA is a refinement of FMEA and introduces two statistical variables, $\alpha$ and $\beta$.
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The $\alpha$ value is the probability of
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of a particular component failure
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mode occuring.We can trace the DAG from a system level error/top level event, and assign
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$\alpha$ values according to published statistics~\cite{fmd91}~\cite{mil1992}.
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As for the FMEA example we can denote this using a $Stat()$ function.
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The $\beta$ value is the probability that the component failure mode will
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cause a given system level error.
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This may be determined hueistically or by field data.
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A factor of FMECA is criticallity. Each top level event/failure
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is assigned a criticallity value. This defines how seriously the problem is
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pervcieved. This must be determined by the safety engineers responsible for the equipment and
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its environment.
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\begin{table}[ht]
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\caption{Non Inverting Amplifier: Failure Mode Effects Critcallity Analysis: Single Faults} % title of Table
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\centering % used for centering table
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\begin{tabular}{||l|c|l|c|c|c|c||}
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\hline \hline
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\textbf{Item} & \textbf{Potential Failure} & \textbf{Potential} & \textbf{$\alpha$} & \textbf{$\beta$} & \textbf{severity} & \textbf{$C_r$} \\
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\textbf{Function} & \textbf{mode} & \textbf{Cause} & \textbf{} & \textbf{} & \textbf{rating} & \\\hline
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\hline
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Non Inverting & $AMP_{high}$ & $R1_{short} $ & $Stat(R1_{short}) $ & & & \\
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Amplifier & $AMP_{low}$ & $R1_{open} $ & $Stat(R1_{open}) $ & & & \\
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Circuit & $AMP_{low}$ & $R2_{short} $ & $Stat(R2_{short}) $ & & & \\
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& $AMP_{high}$ & $R2_{open}$ & $Stat(R2_{open})$ & & & \\
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& $AMP_{lowpass}$ & $OPAMP_{lowslew}$ & $Stat(OPAMP_{lowslew})$ & & & \\
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& $AMP_{low}$ & $OPAMP_{latchdown}$ & $Stat(OPAMP_{latchdown})$ & & & \\
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& $AMP_{high}$ & $OPAMP_{latchup}$ & $Stat(OPAMP_{latchup})$ & & & \\
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& $AMP_{low}$ & $OPAMP_{noop} $ & $Stat(OPAMP_{noop}) $ & & & \\
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\hline
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\hline
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\hline
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\end{tabular}
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\label{ampfmeca}
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\end{table}
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%As the $\alpha$ modes are probabilities, the sum of all $\alpha$ modes for a component must equal one.
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% Work out the alpha and beta values !!! well alpha is possible, beta and criticallity are not
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\section{Extracting FMEDA from the DAG}
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safe failure fractions
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hmmmm
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SD SU DD DU
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\section{Conclusion}
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We now have a derived component that represents the failure modes of a non-inverting
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