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pellls pool last chance saloon

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Robin P. Clark 2013-09-13 15:53:05 +01:00
parent 7a78aa2646
commit 4c0590e3cc
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9
submission_thesis/CH2_FMEA/copy.tex
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@ -287,7 +287,8 @@ for instance for {\textbf{Resistor,~Fixed,~Film}} the following failure causes a
% against {\fms} that the resistor could exhibit.
% We can determine these {\fms} by converting the internal failure descriptions
% to {\fms} thus:
To make this useful for FMEA each failure cause must be mapped to a symptomatic failure mode descriptor
To make this useful for FMEA each failure cause must be mapped to a
symptomatic failure mode descriptor~\footnote{The symptomatic descriptors chosen are based on experience and are not unique.}
as listed below:
%
%and map these failure causes to three symptoms,
@ -302,7 +303,7 @@ as listed below:
\item Lead damage 1.9\% $\mapsto$ OPEN.
\end{itemize}
%
The symptomatic descriptor chosen is based on experience and are not unique.
%
Note, that the main cause of resistor value drift is overloading. % of components.
This is borne out in the FMD-91~\cite{fmd91}[232] entry for a resistor network where the failure
@ -447,7 +448,7 @@ This failure cause maps to $HIGH$ or $LOW$.
\paragraph{Open input: $V_+$.}
This failure cause will mean that the minus input will have the very high gain
of the Op-Amp applied to it, and the output will be forced HIGH or LOW.
This failure cause maps to $HIGH$ or $LOW$.\footnote{No failure mode for open input $V_-$ was listed in this FMD-91 entry~\cite{fmd91}{3-116].}
This failure cause maps to $HIGH$ or $LOW$~\footnote{No failure mode for open input ${V}_{-}$ was listed in this FMD-91 entry~\cite{fmd91}[3-116].}.
\paragraph{Collecting Op-Amp failure modes from FMD-91.}
An Op-Amp's failure mode behaviour, under FMD-91 definitions will have the following {\fms}:
@ -1561,4 +1562,4 @@ This means that re-use, review and checking of traditional analysis must often b
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