robin/Robin_PHD
1
0
Fork 0
Code Issues Pull Requests Actions Packages Projects Releases Wiki Activity

pellls pool last chance saloon

Browse Source
This commit is contained in:
Robin P. Clark 2013-09-13 15:53:05 +01:00
parent 7a78aa2646
commit 4c0590e3cc
1 changed files with 5 additions and 4 deletions
Show Stats Download Patch File Download Diff File Expand all files Collapse all files

9
submission_thesis/CH2_FMEA/copy.tex
View File

@ -287,7 +287,8 @@ for instance for {\textbf{Resistor,~Fixed,~Film}} the following failure causes a
% against {\fms} that the resistor could exhibit. % against {\fms} that the resistor could exhibit.
% We can determine these {\fms} by converting the internal failure descriptions % We can determine these {\fms} by converting the internal failure descriptions
% to {\fms} thus: % to {\fms} thus:
To make this useful for FMEA each failure cause must be mapped to a symptomatic failure mode descriptor To make this useful for FMEA each failure cause must be mapped to a
symptomatic failure mode descriptor~\footnote{The symptomatic descriptors chosen are based on experience and are not unique.}
as listed below: as listed below:
% %
%and map these failure causes to three symptoms, %and map these failure causes to three symptoms,
@ -302,7 +303,7 @@ as listed below:
\item Lead damage 1.9\% $\mapsto$ OPEN. \item Lead damage 1.9\% $\mapsto$ OPEN.
\end{itemize} \end{itemize}
% %
The symptomatic descriptor chosen is based on experience and are not unique.
% %
Note, that the main cause of resistor value drift is overloading. % of components. Note, that the main cause of resistor value drift is overloading. % of components.
This is borne out in the FMD-91~\cite{fmd91}[232] entry for a resistor network where the failure This is borne out in the FMD-91~\cite{fmd91}[232] entry for a resistor network where the failure
@ -447,7 +448,7 @@ This failure cause maps to $HIGH$ or $LOW$.
\paragraph{Open input: $V_+$.} \paragraph{Open input: $V_+$.}
This failure cause will mean that the minus input will have the very high gain This failure cause will mean that the minus input will have the very high gain
of the Op-Amp applied to it, and the output will be forced HIGH or LOW. of the Op-Amp applied to it, and the output will be forced HIGH or LOW.
This failure cause maps to $HIGH$ or $LOW$.\footnote{No failure mode for open input $V_-$ was listed in this FMD-91 entry~\cite{fmd91}{3-116].} This failure cause maps to $HIGH$ or $LOW$~\footnote{No failure mode for open input ${V}_{-}$ was listed in this FMD-91 entry~\cite{fmd91}[3-116].}.
\paragraph{Collecting Op-Amp failure modes from FMD-91.} \paragraph{Collecting Op-Amp failure modes from FMD-91.}
An Op-Amp's failure mode behaviour, under FMD-91 definitions will have the following {\fms}: An Op-Amp's failure mode behaviour, under FMD-91 definitions will have the following {\fms}:
@ -1561,4 +1562,4 @@ This means that re-use, review and checking of traditional analysis must often b
% %
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%% %%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%% %%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%% %%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%