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Robin Clark 2011-03-30 11:35:48 +01:00
parent 0e887bb0fc
commit 2fecdb0771
2 changed files with 40 additions and 13 deletions
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44
fmmd_design_aide/fmmd_design_aide.tex
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@ -329,14 +329,31 @@ any new problems.
First let us look at the new transistor and resistor and
treat these as a functional group.
In our analysis of the failure modes we have to consider
both states of the transistor, ON and OFF.
\begin{figure}[h]
\centering
\includegraphics[width=200pt,keepaspectratio=true]{./fmmd_design_aide/test_circuit.png}
% test_circuit.png: 239x144 pixel, 72dpi, 8.43x5.08 cm, bb=0 0 239 144
\caption{Test circuit functional group}
\label{fig:test_circuit}
\end{figure}
In our analysis of the failure modes we have to consider the operational
states of this circuit, which are
the transistor being switched ON and OFF.
\begin{figure}[h]
\centering
\includegraphics[width=200pt,keepaspectratio=true]{./fmmd_design_aide/mv_opamp_circuit2.png}
% mv_opamp_circuit2.png: 577x479 pixel, 72dpi, 20.35x16.90 cm, bb=0 0 577 479
\caption{Amplifier with check circuit}
\caption{Amplifier with check circuit addition}
\label{fig:mvamp2}
\end{figure}
@ -392,6 +409,13 @@ $\overline{TEST\_LINE}$ OFF & TC:4 $TR1$ ALWAYS OFF & resistance always adde
\label{tab:testaddition}
\end{table}
\subsection{Test Cases Analysis in detail}
The purpose of this circuit is to switch a resistance in when we want to test the circuit
@ -452,19 +476,21 @@ As a symptom for this circuit, it means that there would be no test effect.
\subsection{conclusion of FMMD analysis on safety addition}
This test circuit has from its four component failure modes,
3 failure symptoms $\{ NO TEST EFFECT, NO SYMPTOM, OPEN CIRCUIT \}$
For the FMMD analysis in table \ref{tab:testaddition} we have two failure modes for its derived component
`no~test~effect' or `open~circuit'.
%~out~of~range'.
`no~test~effect' or `open~circuit'. There
$NO SYMPTOM$ failure mode is dormant, but will be revealed when the test~line changes state.
The next stage is to combine the two derived components we have made into
a functional group.
a higher level functional group, see figure \ref{fig:testable_mvamp}.
\section{FMMD Hierarchy, with milli-volt amp and safety addition}
The next stage is to take the two derived components
and place them into a functional group.
We have created two derived components, the amplifier, and the test~circuit, we
now place them into a new functional group.
We can now analyse this functional
group w.r.t the failure modes in the two derived compoennts.
group w.r.t the failure modes of the two derived components.
\begin{figure}[h]
\centering

9
logic_diagram/logic_diagram.tex
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@ -874,10 +874,11 @@ to all base component failure modes.
%
PLD's can be used to model Mechanical, Electrical and Software
failure modes. More importantly the interfaces between these disciplines can be modelled
seamlessly. The bottom-up nature of its associated methodology, Failure Mode Modular De-Composition (FMMD)
ensures that complete coverage of all base~component failures modes
can be ensured.
seamlessly.
%
The bottom-up nature of its associated methodology, Failure Mode Modular De-Composition (FMMD)
ensures complete coverage of all base~component failures modes is possible.
% Elevator Pitch
%\pagebreak[4]
\clearpage
\clearpage