conclusion

fmmd_design_aide/fmmd_design_aide.tex

@@ -329,14 +329,31 @@ any new problems.
 
 First let us look at the new transistor and resistor and 
 treat these as a functional group.
-In our analysis of the failure modes we have to consider
+
-both states of the transistor, ON and OFF.
+\begin{figure}[h]
+ \centering
+ \includegraphics[width=200pt,keepaspectratio=true]{./fmmd_design_aide/test_circuit.png}
+ % test_circuit.png: 239x144 pixel, 72dpi, 8.43x5.08 cm, bb=0 0 239 144
+ \caption{Test circuit functional group}
+ \label{fig:test_circuit}
+\end{figure}
+
+
+In our analysis of the failure modes we have to consider the operational
+states of this circuit, which are
+the transistor being switched ON and OFF.
+
+
+
+
+
+
 
 \begin{figure}[h]
  \centering
  \includegraphics[width=200pt,keepaspectratio=true]{./fmmd_design_aide/mv_opamp_circuit2.png}
  % mv_opamp_circuit2.png: 577x479 pixel, 72dpi, 20.35x16.90 cm, bb=0 0 577 479
- \caption{Amplifier with check circuit}
+ \caption{Amplifier with check circuit addition}
  \label{fig:mvamp2}
 \end{figure}
 
@@ -392,6 +409,13 @@ $\overline{TEST\_LINE}$ OFF & TC:4 $TR1$  ALWAYS OFF    & resistance always adde
 \label{tab:testaddition}
 \end{table}
 
+
+
+
+
+
+
+
 \subsection{Test Cases Analysis in detail}
 
 The purpose of this circuit is to switch a resistance in when we want to test the circuit
@@ -452,19 +476,21 @@ As a symptom for this circuit, it means that there would be no test effect.
 
 \subsection{conclusion of FMMD analysis on safety addition}
 
+This test circuit has from its four component failure modes, 
+3 failure symptoms $\{ NO TEST EFFECT,  NO SYMPTOM, OPEN CIRCUIT \}$
 For the FMMD analysis in table \ref{tab:testaddition} we have two failure modes for its derived component
-`no~test~effect' or `open~circuit'.
+`no~test~effect' or `open~circuit'. There 
-%~out~of~range'.
+$NO SYMPTOM$ failure mode is dormant, but will be revealed when the test~line changes state.
 
 The next stage is to combine the two derived components we have made into
-a functional group. 
+a higher level functional group, see figure \ref{fig:testable_mvamp}. 
 
 \section{FMMD Hierarchy, with milli-volt amp and safety addition}
 
-The next stage is to take the two derived components 
+We have created two derived components, the amplifier, and the test~circuit, we
-and place them into a functional group.
+now place them into a new functional group.
 We can now analyse this functional
-group w.r.t the failure modes in the two derived compoennts.
+group w.r.t the failure modes of the two derived components.
 
 \begin{figure}[h]
  \centering

logic_diagram/logic_diagram.tex

@@ -874,9 +874,10 @@ to all base component failure modes.
 %
 PLD's can be used to model Mechanical, Electrical and Software
 failure modes.  More importantly the interfaces between these disciplines can be modelled
-seamlessly. The bottom-up nature of its associated methodology, Failure Mode Modular De-Composition (FMMD)
+seamlessly. 
-ensures that complete coverage of all base~component failures modes
+%
-can be ensured.  
+The bottom-up nature of its associated methodology, Failure Mode Modular De-Composition (FMMD)
+ensures complete coverage of all base~component failures modes is possible.
 % Elevator Pitch
 
 %\pagebreak[4]