diff --git a/TO_DO_LIST.txt b/TO_DO_LIST.txt
index c6ba400..7a3d6c8 100644
--- a/TO_DO_LIST.txt
+++ b/TO_DO_LIST.txt
@@ -2,6 +2,6 @@ Write up detailed failure modes essay for R and OPAMP with ref to EN298, FMD-91,
 
 Get thesis template, have emailed Aidian on this.
 
-Start writing up approvals backgrouns to static FMEA.
+Start writing up approvals backgrounds to static FMEA.
 
 
diff --git a/old_thesis/component_failure_modes_definition/component_failure_modes_definition.tex b/old_thesis/component_failure_modes_definition/component_failure_modes_definition.tex
index 201eefe..e804218 100644
--- a/old_thesis/component_failure_modes_definition/component_failure_modes_definition.tex
+++ b/old_thesis/component_failure_modes_definition/component_failure_modes_definition.tex
@@ -74,7 +74,7 @@ Let us first define a component.
 %This is anything with which we use to build a product or system. 
 This is anything we use to build a product or system. 
 It could be something quite complicated 
-like an integrated microcontroller, or quite simple like the humble resistor.
+like an integrated micro controller, or quite simple like the humble resistor.
 
 We can define a 
 component by its name, a manufacturers' part number and perhaps
@@ -160,7 +160,7 @@ Parameter change not considered for EN298 because the resistors are down-rated f
 maximum possible voltage exposure -- find refs.
 
 
-FMD-91 gives the following percentatges for failure rates in
+FMD-91 gives the following percentages for failure rates in
 \label{downrate}
 The parameter change, is usually a failure mode associated with over stressing the component.
 In a system designed to typical safety critical constraints (as in EN298)
@@ -171,7 +171,7 @@ these environmentally induced failure modes need not be considered.
 Literature suggests, latch up, latch down and oscillation.
 FMD-91 states, V+ disconnected, V- V+ shorted, NOOP and Low slew.
 
-EN298 does not specifgically include OP_AMPS and these would fall under
+EN298 does not specifically define  OP\_AMPS failure modes; these would fall under the procedure outlined in
 table \cite{en298}[A.1 note e].
 This demands that all open connections, and shorts between adjacent pins be considered.
 We can examine these failure modes by taking our 358 op-amp and examining
@@ -935,13 +935,14 @@ are added to  UML diagram in figure \ref{fig:cfg} and represented in figure \ref
 
 \begin{figure}[h]
  \centering
- \includegraphics[width=400pt,keepaspectratio=true]{../master_uml.jpg}
+ \includegraphics[width=400pt,keepaspectratio=true]{master_uml.jpg}
  % cfg2.jpg: 702x464 pixel, 72dpi, 24.76x16.37 cm, bb=0 0 702 464
  \caption{Complete UML diagram}
  \label{fig:cfg2}
 \end{figure}
 
 
+ 
 
 \subsection{Ontological work on FMEA}