Re-writing the resistor and op-amp failure mode definitions
This commit is contained in:
parent
fcb641bd58
commit
01d4807af0
@ -144,41 +144,119 @@ When building from the bottom up, it is more meaningful to call them `derived~co
|
|||||||
|
|
||||||
|
|
||||||
|
|
||||||
\section{Failure Modes in depth: A detailed look at the op-amp and the resistor}
|
\section{Failure Modes in depth}
|
||||||
|
|
||||||
|
For FMEA appraisals of systems we begin with components.
|
||||||
|
%These will have a set of failure modes assigned to them.
|
||||||
|
In order to perform FMEA we require a set of failure modes for each component in the system under investigation.
|
||||||
|
These are failure modes from the perspective of the user
|
||||||
|
of the component. We are not usually concerned with how the component has failed
|
||||||
|
internally. What we need to know are the symptoms of failure.
|
||||||
|
With these symptoms, we can trace their effects through the system under investigation
|
||||||
|
and determine outcomes.
|
||||||
|
|
||||||
|
Different approval agenices may list different failure mode sets for the same generic components.
|
||||||
|
|
||||||
|
|
||||||
|
\subsection{A detailed look at the op-amp and the resistor}
|
||||||
|
|
||||||
We look in detail at two common electrical components in this section and examine how
|
We look in detail at two common electrical components in this section and examine how
|
||||||
two sources of information on failure modes view their failure mode behaviour.
|
two sources of information on failure modes view their failure mode behaviour.
|
||||||
We look at the reasons why some known failure modes are omitted, or presented in
|
We look at the reasons why some known failure modes are omitted, or presented in
|
||||||
specific but unintuitive ways.
|
specific but unintuitive ways.
|
||||||
|
%We compare the US. military published failure mode specifications wi
|
||||||
|
|
||||||
|
|
||||||
- Failure modes. Prescribed failure modes EN298 - FMD91
|
- Failure modes. Prescribed failure modes EN298 - FMD91
|
||||||
|
|
||||||
\subsection{resistor}
|
\subsection{resistor}
|
||||||
|
|
||||||
EN298 says......
|
The resistor is a ubiquitous component in electronics, and is there fore a good
|
||||||
Parameter change not considered for EN298 because the resistors are down-rated from
|
example for examining it failure modes.
|
||||||
maximum possible voltage exposure -- find refs.
|
FMD-91\cite{fmd91}[3-178] lists many types of resistor
|
||||||
|
and lists many possible failure causes.
|
||||||
|
For instance for {\textbf Resistor,~Fixed,~Film} we are given the following failure causes:
|
||||||
|
\begin{itemize}
|
||||||
|
\item Opened 52\%
|
||||||
|
\item Drift 31.8\%
|
||||||
|
\item Film Imperfections 5.1\%
|
||||||
|
\item Substrate defects 5.1\%
|
||||||
|
\item Shorted 3.9\%
|
||||||
|
\item Lead damage 1.9\%
|
||||||
|
\end{itemize}
|
||||||
|
This information may be of insterest to the manufacturer of resistors, but it does not directly
|
||||||
|
help a circuit designer.
|
||||||
|
The circuit designer is not interested in the causes of resistor failure, but to build in contingecy
|
||||||
|
the symptoms of failure that the resistor may exhibit.
|
||||||
|
We can determine these symptoms and map these failure causes to three symptoms,
|
||||||
|
drift (resistance value changing), open and short.
|
||||||
|
|
||||||
|
\begin{itemize}
|
||||||
|
\item Opened 52\% $\mapsto$ OPENED
|
||||||
|
\item Drift 31.8\% $\mapsto$ DRIFT
|
||||||
|
\item Film Imperfections 5.1\% $\mapsto$ OPEN
|
||||||
|
\item Substrate defects 5.1\% $\mapsto$ OPEN
|
||||||
|
\item Shorted 3.9\% $\mapsto$ SHORT
|
||||||
|
\item Lead damage 1.9\% $\mapsto$ OPEN
|
||||||
|
\end{itemize}
|
||||||
|
The main causes of drift are overloading of components.
|
||||||
|
This is bourne out in entry for a resistor network where the failure
|
||||||
|
modes do not include drift.
|
||||||
|
If we can ensure that our resistors will not be exposed to overload conditions, drift or parameter change
|
||||||
|
can be reasonably excluded.
|
||||||
|
|
||||||
|
EN298~\cite{en298}[Annex A], the gas burner safety standard, for most types of resistor
|
||||||
|
only requires that the failure mode OPEN be considered in FMEA analysis.
|
||||||
|
for resitor types not specifically listed in EN298, the failure modes
|
||||||
|
are considered to be either OPEN or SHORT.
|
||||||
|
The reason that parameter change is not considered for resistors chosen for an EN298 compliant system; is that they must be must be {\em downrated},
|
||||||
|
that is to say the power and voltage ratings of components must be calculated
|
||||||
|
for maximum possible exposure, with a 40\% margin of error. This ensures the resistors will not be overloaded.
|
||||||
|
|
||||||
|
% XXXXXX get ref from colin T
|
||||||
|
|
||||||
|
%If a resistor was rated for instance for
|
||||||
|
|
||||||
|
%These are useful for resistor manufacturersthey have three failure modes
|
||||||
|
%EN298
|
||||||
|
%Parameter change not considered for EN298 because the resistors are down-rated from
|
||||||
|
%maximum possible voltage exposure -- find refs.
|
||||||
|
|
||||||
|
|
||||||
FMD-91 gives the following percentages for failure rates in
|
% FMD-91 gives the following percentages for failure rates in
|
||||||
\label{downrate}
|
% \label{downrate}
|
||||||
The parameter change, is usually a failure mode associated with over stressing the component.
|
% The parameter change, is usually a failure mode associated with over stressing the component.
|
||||||
In a system designed to typical safety critical constraints (as in EN298)
|
In a system designed to typical safety critical constraints (as in EN298)
|
||||||
these environmentally induced failure modes need not be considered.
|
these environmentally induced failure modes need not be considered.
|
||||||
|
|
||||||
|
|
||||||
|
For this study we will take the conservative view from EN298, and consider the failure
|
||||||
|
modes for a resistor to be OPEN and SHORT.
|
||||||
|
i.e.
|
||||||
|
|
||||||
|
$$ fm(R) = \{ OPEN, SHORT \} . $$
|
||||||
|
|
||||||
\subsection{op-amp}
|
\subsection{op-amp}
|
||||||
|
|
||||||
Literature suggests, latch up, latch down and oscillation.
|
|
||||||
FMD-91 states, V+ disconnected, V- V+ shorted, NOOP and Low slew.
|
|
||||||
|
%Literature suggests, latch up, latch down and oscillation.
|
||||||
|
FMD-91\cite{fmd91}{3-116] states,
|
||||||
|
\begin{itemize}
|
||||||
|
\item Degraded Output 50\% Low Slew rate - poor die attach
|
||||||
|
\item No Operation - overstress 31.3\%
|
||||||
|
\item Shorted $V_+$ to $V_-$, overstress, resistive short in amplifier\%
|
||||||
|
\item Opened $V_+$ open\%
|
||||||
|
\end{itemize}
|
||||||
|
|
||||||
|
|
||||||
|
|
||||||
|
|
||||||
EN298 does not specifically define OP\_AMPS failure modes; these would fall under the procedure outlined in
|
EN298 does not specifically define OP\_AMPS failure modes; these would fall under the procedure outlined in
|
||||||
table \cite{en298}[A.1 note e].
|
table \cite{en298}[A.1 note e].
|
||||||
This demands that all open connections, and shorts between adjacent pins be considered.
|
This demands that all open connections, and shorts between adjacent pins be considered.
|
||||||
We can examine these failure modes by taking our 358 op-amp and examining
|
We can examine these failure modes by taking a typical single op-amp, say the $\mu741$ and examining
|
||||||
|
these conditions.
|
||||||
|
|
||||||
looking at
|
|
||||||
Discuss why. Determine more user friendly terms from FMD91 definition.
|
|
||||||
|
|
||||||
|
|
||||||
|
|
||||||
@ -186,6 +264,19 @@ Discuss why. Determine more user friendly terms from FMD91 definition.
|
|||||||
%% Paragraph using failure modes to build from bottom up
|
%% Paragraph using failure modes to build from bottom up
|
||||||
%%
|
%%
|
||||||
|
|
||||||
|
|
||||||
|
|
||||||
|
|
||||||
|
|
||||||
|
|
||||||
|
|
||||||
|
|
||||||
|
|
||||||
|
|
||||||
|
|
||||||
|
|
||||||
|
|
||||||
|
|
||||||
\section{Fault Mode Analysis, top down or bottom up?}
|
\section{Fault Mode Analysis, top down or bottom up?}
|
||||||
|
|
||||||
Traditional static fault analysis methods work from the top down.
|
Traditional static fault analysis methods work from the top down.
|
||||||
|
@ -1,42 +0,0 @@
|
|||||||
|
|
||||||
\documentclass[a4paper,10pt]{article}
|
|
||||||
\usepackage{graphicx}
|
|
||||||
\usepackage{fancyhdr}
|
|
||||||
\usepackage{tikz}
|
|
||||||
\usetikzlibrary{shapes,snakes}
|
|
||||||
\usepackage{amsfonts,amsmath,amsthm}
|
|
||||||
\input{../style}
|
|
||||||
\usepackage{ifthen}
|
|
||||||
\usepackage{lastpage}
|
|
||||||
|
|
||||||
\newboolean{paper}
|
|
||||||
\setboolean{paper}{true} % boolvar=true or false
|
|
||||||
|
|
||||||
%\newtheorem{definition}{Definition:}
|
|
||||||
|
|
||||||
\begin{document}
|
|
||||||
\pagestyle{fancy}
|
|
||||||
\fancyhf{}
|
|
||||||
%\renewcommand{\chaptermark}[1]{\markboth{ \emph{#1}}{}}
|
|
||||||
\fancyhead[LO]{}
|
|
||||||
\fancyhead[RE]{\leftmark}
|
|
||||||
%\fancyfoot[LE,RO]{\thepage}
|
|
||||||
\cfoot{Page \thepage\ of \pageref{LastPage}}
|
|
||||||
\rfoot{\today}
|
|
||||||
\lhead{Propositional Logic Diagram FMMD}
|
|
||||||
|
|
||||||
% numbers at outer edges
|
|
||||||
\pagenumbering{arabic} % Arabic page numbers hereafter
|
|
||||||
\author{R.P.Clark}
|
|
||||||
\title{Propositional Logic Diagrams}
|
|
||||||
\maketitle
|
|
||||||
\input{logic_diagram_paper}
|
|
||||||
|
|
||||||
\bibliographystyle{plain}
|
|
||||||
\bibliography{../mybib,../vmgbibliography}
|
|
||||||
|
|
||||||
%\begin{verbatim}
|
|
||||||
%$Id: paper.tex,v 1.4 2009/11/28 20:05:52 robin Exp $
|
|
||||||
%\end{verbatim}
|
|
||||||
|
|
||||||
\end{document}
|
|
Binary file not shown.
0
openwetware_thesis_template/PhDtemplateLATEX/Latex/Classes/urlbst
Executable file → Normal file
0
openwetware_thesis_template/PhDtemplateLATEX/Latex/Classes/urlbst
Executable file → Normal file
0
related_papers_books/EN230.pdf
Executable file → Normal file
0
related_papers_books/EN230.pdf
Executable file → Normal file
0
related_papers_books/EN298.pdf
Executable file → Normal file
0
related_papers_books/EN298.pdf
Executable file → Normal file
0
related_papers_books/FMD-91_RACTRDoc.pdf
Executable file → Normal file
0
related_papers_books/FMD-91_RACTRDoc.pdf
Executable file → Normal file
0
related_papers_books/Mil-Hdbk-217F.pdf
Executable file → Normal file
0
related_papers_books/Mil-Hdbk-217F.pdf
Executable file → Normal file
0
related_papers_books/YOKOGAWA_paper_14.pdf
Executable file → Normal file
0
related_papers_books/YOKOGAWA_paper_14.pdf
Executable file → Normal file
0
related_papers_books/nasa_fault_tree_handbook_fthb.pdf
Executable file → Normal file
0
related_papers_books/nasa_fault_tree_handbook_fthb.pdf
Executable file → Normal file
0
related_papers_books/nuclear_fault_tree_handbook_sr0492.pdf
Executable file → Normal file
0
related_papers_books/nuclear_fault_tree_handbook_sr0492.pdf
Executable file → Normal file
0
related_papers_books/style_sheets/IEEE/bare_adv.tex
Executable file → Normal file
0
related_papers_books/style_sheets/IEEE/bare_adv.tex
Executable file → Normal file
0
related_papers_books/style_sheets/IEEE/bare_conf.tex
Executable file → Normal file
0
related_papers_books/style_sheets/IEEE/bare_conf.tex
Executable file → Normal file
0
related_papers_books/style_sheets/IEEE/bare_jrnl.tex
Executable file → Normal file
0
related_papers_books/style_sheets/IEEE/bare_jrnl.tex
Executable file → Normal file
Loading…
Reference in New Issue
Block a user